A New Methodology to Precisely Induce Wake-Up for Reliability Assessment of Ferroelectric Devices

Tiang Teck Tan*, Yu Yun Wang, Joel Tan, Tian Li Wu, Nagarajan Raghavan, Kin Leong Pey

*此作品的通信作者

研究成果: Conference contribution同行評審

摘要

Studies on ferroelectric (FE) device degradation are performed on 'woken up' devices. The process of waking up a device is typically done by applying a logarithmically increasing number of pulsed, alternating bipolar switching voltage cycles. However, this method has low resolution in precisely achieving the wake-up state, resulting in ambiguity in the current stage of the life cycle of the device. Furthermore, ferroelectric device performance depends heavily on the spatio-temporal distribution of defects in the device stack, which are very different in the wake-up and fatigue phases of the life cycle. The standard bipolar pulsed stressing scheme as well as asymmetric device structure further complicate the analysis of the effects of voltage stressing on defect drift and subsequent device degradation. Here, we propose a new stressing methodology leveraging on an alternating stress-sense scheme using CVS/RVS and positive-up-negative-down (PUND) waveforms to better control the extent of wake-up in the device. Wake-up and the associated changes to the spatio-temporal mapping of the charged defect concentrations can be more confidently ascertained using the proposed methodology, thereby enabling better understanding of the reliability physics governing wake-up and fatigue for FE devices in the future for lifetime prediction from accelerated life tests.

原文English
主出版物標題2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781665456722
DOIs
出版狀態Published - 2023
事件61st IEEE International Reliability Physics Symposium, IRPS 2023 - Monterey, United States
持續時間: 26 3月 202330 3月 2023

出版系列

名字IEEE International Reliability Physics Symposium Proceedings
2023-March
ISSN(列印)1541-7026

Conference

Conference61st IEEE International Reliability Physics Symposium, IRPS 2023
國家/地區United States
城市Monterey
期間26/03/2330/03/23

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