A New Compact Model for Accurate Simulation of RF Noise in Sub-40nm Multi-Finger nMOSFETs

Jyh-Chyurn Guo, Kuo Liang Yeh

研究成果: Conference contribution同行評審

摘要

A new compact model has been developed in this paper for accurate simulation of RF noise and extraction of actual intrinsic noise in sub-40 nm multi-finger nMOSFETs. This model can predict and verify the excess noise sources before and after deembedding, the mechanism responsible for the complicated layout dependence in various noise parameters, and facilitate optimization design for low noise devices and circuits in nanoscale CMOS technology.

原文English
主出版物標題EuMIC 2018 - 2018 13th European Microwave Integrated Circuits Conference
發行者Institute of Electrical and Electronics Engineers Inc.
頁面146-149
頁數4
ISBN(電子)9782874870521
DOIs
出版狀態Published - 16 11月 2018
事件13th European Microwave Integrated Circuits Conference, EuMIC 2018 - Madrid, Spain
持續時間: 24 9月 201825 9月 2018

出版系列

名字EuMIC 2018 - 2018 13th European Microwave Integrated Circuits Conference

Conference

Conference13th European Microwave Integrated Circuits Conference, EuMIC 2018
國家/地區Spain
城市Madrid
期間24/09/1825/09/18

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