A multi-contact six-Terminal cross-bridge Kelvin resistor (CBKR) structure for evaluation of interface uniformity of the Ti-Al alloy/p-Type 4H-SiC contact

Yen Ling Chen*, Shih Hao Lai, Jian Hao Lin, Bing Yue Tsui

*此作品的通信作者

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

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Engineering & Materials Science