@inproceedings{b611a4563f81414697cb04d9cd694e90,
title = "A Multi-Bit Near-RRAM based Computing Macro with Highly Computing Parallelism for CNN Application",
abstract = "Resistive random-access memory (RRAM) based compute-in-memory (CIM) is an emerging approach to address the demand for practical implementation of artificial intelligence (AI) on resource constrained edge devices by reducing the power-hungry data transfer between memory and processing unit. However, the state-of-the-art RRAM CIM designs fail to strike a balance between precision, energy efficiency, throughput, and latency. This work merges the techniques of CIM and compute-near-memory (CNM) to deliver high precision, high energy efficiency, high throughput, and low latency. In this paper, a 256Kb RRAM based CNM macro fabricated in TSMC 40 nm process is presented featuring: 1) opposite weight mapping with variation-robust SA to mitigate the impact of RRAM device variations on MAC (Multiply-Accumulate) results; 2) switched-capacitor-based analog multiplication circuit to achieve highly parallel computing of 128 4-bit by 4-bit MAC result with low power consumption and high operation speed; and 3) joint optimization of hardware and software to compensate for the accuracy loss after considering the non-idealities of circuits. The macro achieves a low latency of 17ns and high energy efficiency of 71 TOPS/W for MAC operations with 4-bit input, 4-bit weight and 4-bit output precision. It is used to accelerate the convolution process in the Light-CSPDenseN et AI model, resulting in a high accuracy of 86.33% on Visual Wake Words dataset.",
keywords = "Artificial intelligence, autonomous driving, computing-in-memory, nonvolatile memory, resistive random access memory",
author = "Lin, {Kuan Chih} and Hao Zuo and Wang, {Hsiang Yu} and Huang, {Yuan Ping} and Wu, {Ci Hao} and Guo, {Yan Cheng} and Jou, {Shyh Jye} and Hou, {Tuo Hung} and Chang, {Tian Sheuan}",
note = "Publisher Copyright: {\textcopyright} 2024 EDAA.; 2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024 ; Conference date: 25-03-2024 Through 27-03-2024",
year = "2024",
language = "English",
series = "Proceedings -Design, Automation and Test in Europe, DATE",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024 - Proceedings",
address = "United States",
}