A metal-only-ECO solver for input-slew and output-loading violations

Chien Pang Lu*, Chia-Tso Chao, Chen Hsing Lo, Chin Wei Chang

*此作品的通信作者

    研究成果: Conference contribution同行評審

    20 引文 斯高帕斯(Scopus)

    摘要

    To shorten the time-to-market and reduce the expensive cost of photomasks in advance process technologies, metal-only ECO has become a practical and attractive solution to handle incremental design changes. Due to limited spare cells in metal-only ECO, the new added netlist may often violate the input-slew and output-loading constraints and, in turn, delay or even fail the timing closure. This paper proposes a framework, named MO ESS, to solve the input-slew and output-loading violations by connecting spare cells onto the violated nets as buffers. MOESS provides two buffer insertion schemes performed sequentially to minimize the number of inserted buffers and then to solve timing violations if there is any. This framework has been silicon-validated through industrial designs with more than 1-million instances. The experimental results demonstrate that MOESS can solve more violations with less inserted buffers and less CPU runtime compared to an EDA vendor's solution. The whole framework is built based on a commercial APR tool and can be ported to any other APR tool offering open access to its design database.

    原文English
    主出版物標題Proceedings of the 2009 International Symposium on Physical Design, ISPD'09
    頁面191-198
    頁數8
    DOIs
    出版狀態Published - 21 9月 2009
    事件2009 International Symposium on Physical Design, ISPD'09 - San Diego, CA, United States
    持續時間: 29 3月 20091 4月 2009

    出版系列

    名字Proceedings of the International Symposium on Physical Design

    Conference

    Conference2009 International Symposium on Physical Design, ISPD'09
    國家/地區United States
    城市San Diego, CA
    期間29/03/091/04/09

    指紋

    深入研究「A metal-only-ECO solver for input-slew and output-loading violations」主題。共同形成了獨特的指紋。

    引用此