TY - JOUR
T1 - A low temperature wafer-level hermetic MEMS package using UV curable adhesive
AU - Liang, Zhi Hao
AU - Cheng, Yu-Ting
AU - Hsu, Wen-Syang
AU - Lee, Yuh Wen
PY - 2004
Y1 - 2004
N2 - In order to lower the packaging cost and resolve the process complexity of MEMS fabrications, a new wafer-level post-process hermetic package using UV curable adhesive bonding is introduced for MEMS applications. The UV curable adhesive is cured through UV light exposure without any additional heating, suitable for packaging the devices with temperature sensitive materials or processes. A Pyrex 7740 glass is micromachined and used as a protection cap substrate with microcavities which is spin-coated with the adhesive, aligned, and bonded with a device substrate to form the package after the UV curing. Finally, electrical contact pads expose and die separation are done simultaneously by dicing. Two different monitoring devices, dew point sensor and capacitive accelerometer are built to evaluate the package strength and hermeticity. After dicing operation, no structure damage or stiction phenomenon is found in the packaged capacitive accelerometer. Furthermore, no moisture condensation is observed in the package with 190μm bonding width after 150 minutes boil water immersion. The acceleration test results indicate the package can survive more than 3 weeks at 25°C, 100% R.H. (Relative Humidity) working environment.
AB - In order to lower the packaging cost and resolve the process complexity of MEMS fabrications, a new wafer-level post-process hermetic package using UV curable adhesive bonding is introduced for MEMS applications. The UV curable adhesive is cured through UV light exposure without any additional heating, suitable for packaging the devices with temperature sensitive materials or processes. A Pyrex 7740 glass is micromachined and used as a protection cap substrate with microcavities which is spin-coated with the adhesive, aligned, and bonded with a device substrate to form the package after the UV curing. Finally, electrical contact pads expose and die separation are done simultaneously by dicing. Two different monitoring devices, dew point sensor and capacitive accelerometer are built to evaluate the package strength and hermeticity. After dicing operation, no structure damage or stiction phenomenon is found in the packaged capacitive accelerometer. Furthermore, no moisture condensation is observed in the package with 190μm bonding width after 150 minutes boil water immersion. The acceleration test results indicate the package can survive more than 3 weeks at 25°C, 100% R.H. (Relative Humidity) working environment.
UR - http://www.scopus.com/inward/record.url?scp=10444245849&partnerID=8YFLogxK
U2 - 10.1109/ECTC.2004.1320311
DO - 10.1109/ECTC.2004.1320311
M3 - Conference article
AN - SCOPUS:10444245849
SN - 0569-5503
VL - 2
SP - 1486
EP - 1491
JO - Proceedings - Electronic Components and Technology Conference
JF - Proceedings - Electronic Components and Technology Conference
T2 - 2004 Proceedings - 54th Electronic Components and Technology Conference
Y2 - 1 June 2004 through 4 June 2004
ER -