A full code-patterns coverage high-speed embedded ROM using dynamic virtual guardian technique

Meng Fan Chang*, Lih Yih Chiou, Kuei-Ann Wen

*此作品的通信作者

    研究成果: Article同行評審

    14 引文 斯高帕斯(Scopus)

    摘要

    Crosstalk between bitlines induces read failure and limits the coverage of applicable code-patterns for high-speed contact/via-programming read-only memories (ROMs) in SoC. Owing to the variation in bitline loading across code-patterns, the amount of coupled noise on an accessed bitline is code-pattern-dependent. This crosstalk effect worsens, with larger coupling capacitance and smaller intrinsic loading, as the technology node shrinks. This study proposes dynamic virtual guardian (DVG) techniques for contact/via-programming ROM macros and compilers to eliminate the crosstalk-induced read failure and increase the code-patterns coverage. Compared with conventional ROMs, DVG techniques achieve higher speed, lower power consumption and better design for manufacturing (DFM) capability with full code-patterns coverage. Experiments on fabricated designs, a conventional ROM and two 256 Kb DVG ROMs, using 0.18 μm 1P5M CMOS technology have demonstrated that DVG techniques achieve 100% code-pattern coverage under a small sensing margin.

    原文English
    頁(從 - 到)496-506
    頁數11
    期刊IEEE Journal of Solid-State Circuits
    41
    發行號2
    DOIs
    出版狀態Published - 1 2月 2006

    指紋

    深入研究「A full code-patterns coverage high-speed embedded ROM using dynamic virtual guardian technique」主題。共同形成了獨特的指紋。

    引用此