A flexible TFT circuit yield optimizer considering process variation, aging, and bending effects

Wen En Wei*, Hung Yi Li, Cheng Yu Han, James Chien Mo Li, Jian Jang Huang, I. Chun Cheng, Chien-Nan Liu, Yung Hui Yeh

*此作品的通信作者

研究成果: Article同行評審

8 引文 斯高帕斯(Scopus)

摘要

This paper presents a yield optimization tool, FlexiOptimizer , for flexible thin-film transistor (TFT) circuits. FlexiOptimizer considers three important effects: (1) process variation; (2) aging effect; and (3) bending effect. This SPICE-based optimizer applies response surface methodology (RSM) and orthogonal array (OA) techniques to size transistors so the yield is improved in aged and bent condition. This tool is demonstrated on two different designs: organic light emitting diode (OLED) pixel drivers and differential operational amplifiers (OPAMPs), in both amorphous silicon (a-Si) and Indium-Gallium-Zinc-Oxide (IGZO) TFT technologies.

原文English
文章編號6860224
頁(從 - 到)1055-1063
頁數9
期刊IEEE/OSA Journal of Display Technology
10
發行號12
DOIs
出版狀態Published - 1 12月 2014

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