A Density Metric for Semiconductor Technology

H. S.Philip Wong*, Kerem Akarvardar, Dimitri Antoniadis, Jeffrey Bokor, Chenming Hu, Tsu Jae King-Liu, Subhasish Mitra, James D. Plummer, Sayeef Salahuddin

*此作品的通信作者

研究成果: Editorial

3 引文 斯高帕斯(Scopus)

摘要

Since its inception, the semiconductor industry has used a physical dimension (the minimum gate length of a transistor) as a means to gauge continuous technology advancement. This metric is all but obsolete today. As a replacement, we propose a density metric, which aims to capture how advances in semiconductor device technologies enable system-level benefits. The proposed metric can be used to gauge advances in future generations of semi-conductor technologies in a holistic way, by accounting for the progress in logic, memory, and packaging/integration technologies simultaneously.

原文English
文章編號9063714
頁(從 - 到)478-482
頁數5
期刊Proceedings of the IEEE
108
發行號4
DOIs
出版狀態Published - 四月 2020

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