A comprehensive study of Ge1-xSix on Ge for the Ge nMOSFETs with tensile stress, shallow junctions and reduced leakage
Guang Li Luo*, Shih Chiang Huang, Cheng Ting Chung, Dawei Heh, Chao-Hsin Chien, Chao Ching Cheng, Yao Jen Lee, Wen Fa Wu, Chiung Chih Hsu, Mei Ling Kuo, Jay Yi Yao, Mao Nan Chang, Chee Wee Liu, Chen-Ming Hu, Chun Yen Chang, Fu Liang Yang
*此作品的通信作者
研究成果: Conference contribution › 同行評審
3
引文
斯高帕斯（Scopus）