A Combination of Implant Shadow and Skin Effects Leading to HV Devices Failure during the ESD Event

Jian Hsing Lee*, Ching Ho Li, Chih Cherng Liao, Yeh Jen Huang, Karuna Nidhi, Li Yang Hong, Ting You Lin, Yeh Ning Jou, Shao Chang Huang, Ke Horng Chen

*此作品的通信作者

研究成果: Conference contribution › 同行評審

3 引文 斯高帕斯（Scopus）

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Keyphrases

Engineering