A Combination of Implant Shadow and Skin Effects Leading to HV Devices Failure during the ESD Event

Jian Hsing Lee*, Ching Ho Li, Chih Cherng Liao, Yeh Jen Huang, Karuna Nidhi, Li Yang Hong, Ting You Lin, Yeh Ning Jou, Shao Chang Huang, Ke Horng Chen

*此作品的通信作者

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

指紋

深入研究「A Combination of Implant Shadow and Skin Effects Leading to HV Devices Failure during the ESD Event」主題。共同形成了獨特的指紋。

Engineering & Materials Science