@inproceedings{542fcec72f9246739dd55f434be5051c,
title = "A 70nW, 0.3V temperature compensation voltage reference consisting of subthreshold MOSFETs in 65nm CMOS technology",
abstract = "Being operated with 0.3V supply voltage in a standard 65nm CMOS process, a new CMOS temperature compensated voltage reference circuit is proposed with subthreshold transistors and native nMOS. The reference drain current provided by the gate voltage of a subthreshold nMOS output transistor is nearly independent of temperature due to the existence of mutual compensation of mobility and threshold voltage variation. The new proposed temperature compensated voltage reference circuit functions well with the output voltage Vref of 168 mV at room temperature as no extra laser trimming is needed after fabrication. The total power consumption is about 70nW. With the VDD power supply of 0.3V, the temperature coefficient (TC) of voltage reference circuit is 105 ppm/°C as temperature varies from -20°C to 100°C. The chip size of the fabricated bandgap reference circuit is 0.0053mm2.",
keywords = "Bandgap Reference Circuit (BGR), Native nMOS, Subthreshold Region",
author = "Lu, {Ting Chou} and Ming-Dou Ker and Hsiao-Wen Zan",
year = "2016",
month = may,
day = "31",
doi = "10.1109/VLSI-DAT.2016.7482571",
language = "English",
series = "2016 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2016",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2016 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2016",
address = "美國",
note = "2016 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2016 ; Conference date: 25-04-2016 Through 27-04-2016",
}