摘要
Summary form only given. A high-performance double-poly p-n-p technology, with features allowing it to be easily integrated into a more general complementary bipolar process, is described. These advanced p-n-p transistors have 80-nm-wide ion-implanted bases and optimized emitter and collector dopant profiles and are fabricated on a thin p-type epilayer in order to achieve high collector current driving capability. The devices have a measured cutoff frequency of 27 GHz, making them the fastest silicon p-n-p bipolar transistors reported to date. Experimental results on the device characteristics are presented.
原文 | English |
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頁(從 - 到) | 903-905 |
頁數 | 3 |
期刊 | Technical Digest - International Electron Devices Meeting |
DOIs | |
出版狀態 | Published - 1989 |
事件 | 1989 International Electron Devices Meeting - Technical Digest - Washington, DC, USA 持續時間: 3 12月 1989 → 6 12月 1989 |