A Σ-Δ modulation based analog BIST system with a wide bandwidth fifth-order analog response extractor for diagnosis purpose

Hao-Chiao Hong*, Cheng Wen Wu, Kwang Ting Cheng

*此作品的通信作者

研究成果: Paper同行評審

2 引文 斯高帕斯(Scopus)

摘要

A wide bandwidth Σ-Δ modulation based analog built-in self-test (BIST) system that can diagnose the prototype is presented. It consists of a low-cost design-for-testability (DfT) switched-capacitor filter as the circuit under test (CUT) and a wide bandwidth analog response extractor (ARE) to digitize the analog responses for final DSP analysis. The first stage of the DfT CUT is reconfigured to accept a repetitive Σ-Δ modulated bit-steam as its stimulus. This DfT technique reuses every original component and thus provides the advantages of lowering the testing cost, increasing the fault coverage as well as the accuracy, and being able to perform the at-speed tests. The ARE is a cascaded 2-1-1-1 fifth-order Σ-Δ modulator equipped with single-bit quantizers to extend the testing bandwidth while retaining moderate tolerance of circuit imperfections. Our measurement results show that this ARE is able to provide a -95 dB spurious free dynamic range over 1 MHz bandwidth when operates at 30 MHz. A multi-tone test is performed to manifest the wide bandwidth and high accuracy of our BIST system. Based on the BIST results, a novel method of diagnosing the prototype to speed up the time-to-market is also proposed and demonstrated by our BIST system.

原文American English
頁面62-67
頁數6
DOIs
出版狀態Published - 1 12月 2004
事件Proceedings of the Asian Test Symposium, ATS'04 - Kenting, Taiwan
持續時間: 15 11月 200417 11月 2004

Conference

ConferenceProceedings of the Asian Test Symposium, ATS'04
國家/地區Taiwan
城市Kenting
期間15/11/0417/11/04

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