65-nm 160-GHz fT RF n-MOSFET intrinsic noise extraction and modeling using lossy substrate de-embedding method

Jyh-Chyurn Guo*, Y. M. Lin

*此作品的通信作者

    研究成果: Conference contribution同行評審

    摘要

    A lossy substrate model for accurate simulation of extrinsic noise and a lossy substrate de-embedding method for precise extraction of intrinsic noise have been proven by 80 nm, super-100 GHz fT RF nMOS. The method is further applied to 65 nm 160-GHz fT nMOS to investigate aggressive gate length scaling effect on RF noise. The extrinsic noise reveals abnormally weak dependence on gate length scaling even with 50-60% improvement on f T but strong dependence on finger number. The intrinsic noise extracted through lossy substrate de-embedding can consistently reflect the gain in fT and weak dependence on finger number. The NFmin at 10 GHz can be suppressed to 0.5dB for 65 nm nMOS corresponding to an optimized drain current, which is around 0.2 dB improvement over 80 nm devices. Noise suppression due to gate length scaling becomes even more significant in higher current region. The noise reduction is attributed to lower noise resistance (Rn) and real part of optimum source admittance (Re(Y opt)). The accurate extraction of intrinsic noise provides useful guideline for RF CMOS device design and optimization in terms of speed, power, and noise.

    原文English
    主出版物標題2006 IEEE Radio Frequency Integrated Circuits(RFIC) Symposium - Digest of Papers
    頁面309-312
    頁數4
    DOIs
    出版狀態Published - 1 12月 2006
    事件2006 IEEE Radio Frequency Integrated Circuits Symposium - San Francisco, CA, United States
    持續時間: 11 6月 200613 6月 2006

    出版系列

    名字Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
    2006
    ISSN(列印)1529-2517

    Conference

    Conference2006 IEEE Radio Frequency Integrated Circuits Symposium
    國家/地區United States
    城市San Francisco, CA
    期間11/06/0613/06/06

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