5nm-gate nanowire FinFET

Fu Liang Yang*, Di Hong Lee, Hou Yu Chen, Chang Yun Chang, Sheng Da Liu, Cheng Chuan Huang, Tang Xuan Chung, Hung Wei Chen, Chien Chao Huang, Yi Hsuan Liu, Chung Cheng Wu, Chi Chun Chen, Shih Chang Chen, Ying Tsung Chen, Ying Ho Chen, Chih Jian Chen, Bor Wen Chan, Peng Fu Hsu, Jyu Horng Shieh, Han Jan TaoYee Chia Yeo, Yiming Li, Jam Wem Lee, Pu Chen, Mong Song Liang, Chen-Ming Hu

*此作品的通信作者

研究成果: Conference article同行評審

276 引文 斯高帕斯(Scopus)

指紋

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Keyphrases

Engineering

Material Science