32-nm multigate Si-nTFET with microwave-annealed abrupt junction

Fu Ju Hou, Po Jung Sung, Fu Kuo Hsueh, Chien Ting Wu, Yao Jen Lee, Mao Nang Chang, Yi-Ming Li, Tuo-Hung Hou

研究成果: Article同行評審

8 引文 斯高帕斯(Scopus)

指紋

深入研究「32-nm multigate Si-nTFET with microwave-annealed abrupt junction」主題。共同形成了獨特的指紋。

Engineering & Materials Science

Chemical Compounds