@inproceedings{7aa4ccf7512d47a1b8c8673b9310b2a1,
title = "2xVDD-tolerant crystal oscillator circuit realized with 1xVDD CMOS devices without gate-oxide reliability issue",
abstract = "A new 2xVDD-tolerant crystal oscillator circuit realized with 1xVDD CMOS devices without suffering gate-oxide reliability issue is proposed, which is one of the key mixed-voltage I/O cells in a cell library. The proposed circuit is realized with only thin gate-oxide devices with floating n-well technique. The proposed 2xVDD-tolerant crystal oscillator circuit has been designed and verified in a 90-nm 1-V CMOS process to serve 1/2-V mixed-voltage interface applications.",
author = "Ming-Dou Ker and Wang, {Tzu Ming} and Liao, {Hung Tai}",
year = "2008",
month = sep,
day = "19",
doi = "10.1109/ISCAS.2008.4541544",
language = "English",
isbn = "9781424416844",
series = "Proceedings - IEEE International Symposium on Circuits and Systems",
pages = "820--823",
booktitle = "2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008",
note = "2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008 ; Conference date: 18-05-2008 Through 21-05-2008",
}