摘要
This letter proposes a memory cell, denoted by 1F-1 T, consisting of a ferroelectric field-effect transistor (FeFET) cascaded with another current-limiting transistor (T). The transistor reduces the impact of drain current (Id) variations by limiting the on-state current in FeFET. The experimental data from our 28 nm high-k-metal-gate (HKMG) based FeFET calibrates and simulates the memory arrays. The simulation indicates a significant improvement in bit-line (BL) current (IBL) variation and the accuracy of vector-matrix multiplication of the 1F-1 T memory array. The system-level in-memory computing simulation with 1F-1T synapses shows an inference accuracy of 97.6% for the MNIST hand-written digits with multi-layer perceptron (MLP) neural networks.
原文 | English |
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頁(從 - 到) | 424-429 |
頁數 | 6 |
期刊 | IEEE Transactions on Nanotechnology |
卷 | 22 |
DOIs | |
出版狀態 | Published - 2023 |