相位雜訊量測電路

@misc{aa0212605fd1463b8521688640190b83,

title = "相位雜訊量測電路",

author = "Wei-Zen Chen",

year = "2017",

month = feb,

day = "21",

language = "???core.languages.zh_TW???",

type = "Patent",

note = "I571641",

}

Chen, W-Z 2月. 21 2017, 相位雜訊量測電路, 專利號 I571641.

相位雜訊量測電路. / Chen, Wei-Zen (Inventor).
專利號: I571641. 2月 21, 2017.

研究成果: Patent

TY - PAT

T1 - 相位雜訊量測電路

AU - Chen, Wei-Zen

PY - 2017/2/21

Y1 - 2017/2/21

M3 - Patent

M1 - I571641

ER -

Chen WZ, 發明者. 相位雜訊量測電路. I571641. 2017 2月 21.

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