每年專案
個人檔案
研究專長
晶圓接合
圖案化藍寶石晶片
III-V 族磊晶技術
光電半導體元件
教育/學術資格
PhD, 材料科學工程, Stanford University
外部位置
指紋
查看啟用 Yew-Chung Sermon Wu 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
- 1 類似的個人檔案
網路
國家/地區層面的近期外部共同作業。按一下圓點深入探索詳細資料，或
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藉著氮化鋁緩衝層與修飾乾蝕刻圖案化藍寶石基板來提升氮化鎵發光二極體與氮化鋁UV發光二極體的亮度
1/08/19 → 28/02/21
研究計畫: Other Government Ministry Institute
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Au@Cu2O core@shell nanocrystals as sustainable catalysts for efficient hydrogen production from ammonia borane
Fang, M. J., Lin, Y. C., Jan, J. Y., Lai, T. H., Hsieh, P. Y., Kuo, M. Y., Chiu, Y. H., Tsao, C. W., Chen, Y. A., Wang, Y. T., Hong, Y. J., Wu, J. Y., Wu, Y. C. S., Lin, Y. G., Chang, T. F. M., Chen, C. Y., Sone, M., Chang, S. M., Chang, C. L. & Hsu, Y. J., 5 5月 2023, 於: Applied Catalysis B: Environmental. 324, 122198.研究成果: Article › 同行評審
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Investigation of ZnO/V2O5 hybrid nanocomposite-based ultraviolet photodetector and hydrogen gas sensor
Huang, W. C., Lin, Y. H., Zhang, Y. H., Chang, C. W., Wang, D. Y., Chuang, C. C., Huang, Y. H., Lin, T. C., Wu, Y. C. S. & Chen, H., 2月 2023, 於: Journal of Materials Science: Materials in Electronics. 34, 5, 398.研究成果: Article › 同行評審
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An Evaluation for Quality Inspection of Epitaxial Layer and Heavily-doped 4H-SiC Substrate by Simple Schottky Barrier Diode and MOS Capacitor
Chu, K. W., Tseng, C. W., Tsui, B. Y., Wu, Y. C. S., Yang, C. J. & Hsu, C., 2022, 2022 IEEE 34th International Conference on Microelectronic Test Structures, ICMTS 2022 - Proceedings. Institute of Electrical and Electronics Engineers Inc., (IEEE International Conference on Microelectronic Test Structures; 卷 2022-March).研究成果: Conference contribution › 同行評審
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Annealing effects on electrical property depth profiles of BF2 and P implanted polycrystalline Si determined by differential hall effect metrology
Lee, F. Y., Wu, Y. C. S., Joshi, A., Basol, B. M., Chang, C. H. & Lin, K. L., 2022, (Accepted/In press) 於: Journal of Materials Science: Materials in Electronics.研究成果: Article › 同行評審
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Fabrication and Characterizations of PbZrxTi1-xO3 (PZT) Ultrasonic Sensing Chips
Lee, M. L., Chen, S. M., Jhang, J. J., Lu, L. S., Yang, S. T., Chiu, P. E., Tsai, Y. S., Wu, Y. C. S., Cheng, C. C., Chen, H. & Han, J., 2022, (Accepted/In press) 於: IEEE Access.研究成果: Article › 同行評審
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