Vaz, D. C., Lin, C. C., Plombon, J., Choi, W. Y., Groen, I., Arango, I., Pham, V. T., Nikonov, D. E., Li, H., Debashis, P., Clendenning, S. B., Gosavi, T. A., Garcia, V., Fusil, S., Bibes, M.,
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p. 32.4.1-32.4.4 (Technical Digest - International Electron Devices Meeting, IEDM; 卷 2021-December).
研究成果: Conference contribution › 同行評審