Tuo-Hung Hou

2006

Three-dimensional analytical modeling of nanocrystal memory electrostatics

Ganguly, U., Narayanan, V., Lee, C., Hou, T.-H. & Kan, E. C., 1 6月 2006, 於: Journal of Applied Physics. 99, 11, 114516.

研究成果: Article › 同行評審

2 引文斯高帕斯（Scopus）

2005

Asymmetric electric field enhancement in nanocrystal memories

Lee, C., Ganguly, U., Narayanan, V., Hou, T.-H., Kim, J. & Kan, E. C., 12月 2005, 於: Ieee Electron Device Letters. 26, 12, p. 879-881 3 p.

研究成果: Article › 同行評審

38 引文斯高帕斯（Scopus）

Nonvolatile memory with a metal nanocrystal/nitride heterogeneous floating-gate

Lee, C., Hou, T.-H. & Kan, E. C. C., 12月 2005, 於: IEEE Transactions on Electron Devices. 52, 12, p. 2697-2702 6 p.

研究成果: Article › 同行評審

54 引文斯高帕斯（Scopus）

Reliability studies of Hf-doped and NH ₃ -nitrided gate dielectric for advanced CMOS application

Yang, C. W., Fang, Y. K., Chen, S. F., Lin, C. S., Lin, C. Y., Wang, W. D., Chou, T. H., Lin, P. J., Wang, M. F., Hou, T.-H., Yao, L. G., Chen, S. C. & Liang, M. S., 10月 2005, 於: IEE Proceedings: Circuits, Devices and Systems. 152, 5, p. 407-410 4 p.

研究成果: Article › 同行評審

1 引文斯高帕斯（Scopus）

2004

Subnanometer scaling of HfO₂/metal electrode gate stacks

Peterson, J. J., Young, C. D., Barnett, J., Gopalan, S., Gutt, J., Lee, C. H., Li, H. J., Hou, T.-H., Kim, Y., Lim, C., Chaudhary, N., Moumen, N., Lee, B. H., Bersuker, G., Brown, G. A., Zeitzoff, P. M., Gardner, M. I., Murto, R. W. & Huff, H. R., 2004, 於: Electrochemical and Solid-State Letters. 7, 8, p. G164-G167

研究成果: Article › 同行評審

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34 引文斯高帕斯（Scopus）

2003

Effective improvement of high-k Hf-silicate/silicon interface with thermal nitridation

Yang, C. W., Fang, Y. K., Chen, S. F., Lin, C. Y., Wang, M. F., Lin, Y. M., Hou, T.-H., Yao, L. G., Chen, S. C. & Liang, M. S., 6 3月 2003, 於: Electronics Letters. 39, 5, p. 421-422 2 p.

研究成果: Article › 同行評審

5 引文斯高帕斯（Scopus）

Effect of polycrystalline-silicon gate types on the opposite flatband voltage shift in n-type and p-type metal-oxide-semiconductor field-effect transistors for high-k-HfO₂ dielectric

Yang, C. W., Fang, Y. K., Chen, C. H., Chen, S. F., Lin, C. Y., Lin, C. S., Wang, M. F., Lin, Y. M., Hou, T.-H., Chen, C. H., Yao, L. G., Chen, S. C. & Liang, M. S., 14 7月 2003, 於: Applied Physics Letters. 83, 2, p. 308-310 3 p.

研究成果: Article › 同行評審

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37 引文斯高帕斯（Scopus）

HfO ₂ /HfSi _x O _y high-K gate stack with very low leakage current for low-power poly-Si gated CMOS application

Yang, C. W., Fang, Y. K., Chen, S. F., Wang, M. F., Hou, T.-H., Lin, Y. M., Yao, L. G., Chen, S. C. & Liang, M. S., 17 4月 2003, 於: Electronics Letters. 39, 8, p. 692-694 3 p.

研究成果: Article › 同行評審

1 引文斯高帕斯（Scopus）

High-k gate stacks for planar, scaled CMOS integrated circuits

Huff, H. R., Hou, T.-H., Lim, C., Kim, Y., Barnett, J., Bersuker, G., Brown, G. A., Young, C. D., Zeitzoff, P. M., Gutt, J., Lysaght, P., Gardner, M. I. & Murto, R. W., 9月 2003, 於: Microelectronic Engineering. 69, 2-4, p. 152-167 16 p.

研究成果: Article › 同行評審

77 引文斯高帕斯（Scopus）

Origin of the threshold voltage instability in SiO₂/HfO₂ dual layer gate dielectrics

Kerber, A., Cartier, E., Pantisano, L., Degraeve, R., Kauerauf, T., Kim, Y., Hou, T.-H., Groeseneken, G., Maes, H. E. & Schwalke, U., 2月 2003, 於: Ieee Electron Device Letters. 24, 2, p. 87-89 3 p.

研究成果: Article › 同行評審

372 引文斯高帕斯（Scopus）

SIMS depth profiling of advanced gate dielectric materials

Bennett, J., Gondran, C., Sparks, C., Hung, P. Y. & Hou, T.-H., 15 1月 2003, 於: Applied Surface Science. 203-204, p. 409-413 5 p.

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22 引文斯高帕斯（Scopus）

2002

Dramatic reduction of gate leakage current in 1.61 nm HfO₂ high-k dielectric poly-silicon gate with Al₂O₃ capping layer

Yang, C. W., Fang, Y. K., Chen, C. H., Wang, W. D., Lin, T. Y., Wang, M. F., Hou, T.-H., Cheng, J. Y., Yao, L. G., Chen, S. C., Yu, C. H. & Liang, M. S., 26 9月 2002, 於: Electronics Letters. 38, 20, p. 1223-1225 3 p.

研究成果: Article › 同行評審

6 引文斯高帕斯（Scopus）

Improved current drivability and poly-gate depletion of submicron PMOSFET with poly-SiGe gate and ultra-thin nitride gate dielectric

Chen, C. H., Fang, Y. K., Yang, C. W., Ting, S. F., Tsair, Y. S., Chang, C. N., Hou, T.-H., Wang, M. F., Yu, M. C., Lin, C. L., Chen, S. C., Yu, C. H. & Liang, M. S., 1 4月 2002, 於: Solid-State Electronics. 46, 4, p. 597-599 3 p.

研究成果: Article › 同行評審

4 引文斯高帕斯（Scopus）

2001

Base oxide scaling limit of thermally-enhanced remote plasma nitridation (TE-RPN) process for ultra-thin gate dielectric formation

Yu, M. C., Huang, H. T., Chen, C. H., Wang, M. F., Hou, T.-H., Lin, Y. M., Jang, S. M., Diaz, C. H., Sun, J., Fang, Y. K., Chen, S. C., Yu, C. H. & Liang, M. S., 10月 2001, 於: IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings. p. 179-182 4 p.

研究成果: Article › 同行評審

1 引文斯高帕斯（Scopus）

Thermally-enhanced remote plasma nitrided ultrathin (1.65 nm) gate oxide with excellent performances in reduction of leakage current and boron diffusion

Chen, C. H., Fang, Y. K., Yang, C. W., Ting, S. F., Tsair, Y. S., Yu, M. C., Hou, T.-H., Wang, M. F., Chen, S. C., Yu, C. H. & Liang, M. S., 1 8月 2001, 於: IEEE Electron Device Letters. 22, 8, p. 378-380 3 p.

研究成果: Article › 同行評審

27 引文斯高帕斯（Scopus）

To optimize electrical properties of the ultrathin (1.6 nm) nitride/oxide gate stacks with bottom oxide materials and post-deposition treatment

Chen, C. H., Fang, Y. K., Yang, C. W., Ting, S. F., Tsair, Y. S., Wang, M. F., Hou, T.-H., Yu, M. C., Chen, S. C., Jang, S. M., Yu, D. C. H. & Liang, M. S., 12月 2001, 於: IEEE Transactions on Electron Devices. 48, 12, p. 2769-2776 8 p.

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1 引文斯高帕斯（Scopus）

Ultrathin Ox/Nitride gate stack for sub-quarter-micron CMOS devices prepared by RTCVD

Wang, M. F., Chen, C. H., Yu, M. C., Hou, T.-H., Lin, Y. M., Chen, S. C., Fang, Y. K., Yu, C. H. & Liang, M. S., 4月 2001, 於: International Symposium on VLSI Technology, Systems, and Applications, Proceedings. p. 208-211 4 p.

研究成果: Article › 同行評審

1999

Improvement of junction leakage of nickel silicided junction by a Ti-capping layer

Hou, T.-H., Lei, T. F. & Chao, T.-S., 11月 1999, 於: Ieee Electron Device Letters. 20, 11, p. 572-573 2 p.

研究成果: Article › 同行評審

55 引文斯高帕斯（Scopus）

侯 拓宏

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侯拓宏