搜尋結果
2007
Lin, C. C. ,
Yu, J. S. ,
Lin, C. Y. ,
Lin, C. H. &
Tseng, T-Y. ,
3 12月 2007 ,
於: Thin Solid Films. 516 ,
2-4 ,
p. 402-406 5 p. 研究成果: Article › 同行評審
Thin films
100%
Voltage
76%
Surface Conductivity
73%
thin films
54%
Liquid Film
51%
Optical properties
100%
Nanowires
99%
Structural properties
87%
Nanowire
69%
nanowires
64%
Lin, C. C. ,
Lin, C. Y. ,
Lin, M. H. ,
Lin, C. H. &
Tseng, T-Y. ,
1 12月 2007 ,
於: IEEE Transactions on Electron Devices. 54 ,
12 ,
p. 3146-3151 6 p. 研究成果: Article › 同行評審
Thin films
100%
Resistance
66%
Electric potential
54%
Retention Time
24%
Voltage
19%
Lin, Y. F. ,
Hsu, Y-J. ,
Lu, S. Y. ,
Chen, K. T. &
Tseng, T-Y. ,
13 9月 2007 ,
於: Journal of Physical Chemistry C. 111 ,
36 ,
p. 13418-13426 9 p. 研究成果: Article › 同行評審
Field emission
100%
Nanowires
96%
Field Emission
78%
field emission
70%
Nanowire
67%
2006
Tu, C. H. ,
Chang, T. C. ,
Liu, P-T. ,
Liu, H. C. ,
Weng, C. F. ,
Shy, J. H. ,
Tseng, B. H. ,
Tseng, T-Y. ,
Sze, S. M. &
Chang, C. Y. ,
12 10月 2006 ,
於: Electrochemical and Solid-State Letters. 9 ,
12 ,
p. G358-G360 3 p. 研究成果: Article › 同行評審
Nanocrystals
100%
Germanium
89%
Nitrides
80%
nitrides
61%
nanocrystals
59%
Optical properties
100%
Doping (additives)
89%
Structural properties
87%
Electric properties
85%
Alumina
79%
Lee, C. Y. ,
Tseng, T-Y. ,
Li, S. Y. &
Lin, P. ,
15 1月 2006 ,
於: Journal of Applied Physics. 99 ,
2 , 024303.
研究成果: Article › 同行評審
phosphorus
100%
field emission
93%
nanowires
82%
photoluminescence
72%
thresholds
20%
Lee, C. Y. ,
Tseng, T-Y. ,
Li, S. Y. &
Lin, P. ,
14 1月 2006 ,
於: Nanotechnology. 17 ,
1 ,
p. 83-88 6 p. 研究成果: Article › 同行評審
Triodes
100%
Field emission
87%
triodes
86%
Nanowires
84%
Field Emission
68%
Liu, C. Y. ,
Wang, A. ,
Jang, W. Y. &
Tseng, T-Y. ,
21 3月 2006 ,
於: Journal of Physics D: Applied Physics. 39 ,
6 ,
p. 1156-1160 5 p. , 022.
研究成果: Article › 同行評審
Electric properties
100%
Electrical Property
78%
Electrodes
72%
electrical properties
68%
Resistance
59%
Lee, C. Y. ,
Li, S. Y. ,
Lin, P. &
Tseng, T-Y. ,
15 5月 2006 ,
於: IEEE Transactions on Nanotechnology. 5 ,
3 ,
p. 216-219 4 p. 研究成果: Article › 同行評審
Triodes
100%
Field emission
87%
Nanowires
84%
Zinc oxide
38%
Temperature
27%
Tu, C. H. ,
Chang, T. C. ,
Liu, P-T. ,
Liu, H. C. ,
Tsai, C. C. ,
Chang, L. T. ,
Tseng, T-Y. ,
Sze, S. M. &
Chang, C. Y. ,
31 7月 2006 ,
於: Applied Physics Letters. 89 ,
5 ,
3 p. , 052112.
研究成果: Article › 同行評審
nitrides
100%
nanocrystals
96%
germanium
95%
oxygen
65%
silicon
58%
Li, S. Y. ,
Lee, C. Y. ,
Lin, P. &
Tseng, T-Y. ,
1 1月 2006 ,
於: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 24 ,
1 ,
p. 147-151 5 p. 研究成果: Article › 同行評審
Field emission
100%
Nanowires
96%
field emission
70%
nanowires
62%
Field emission displays
45%
Liu, C. Y. ,
Chuang, C. C. ,
Chen, J. S. ,
Wang, A. ,
Jang, W. Y. ,
Young, J. C. ,
Chiu, K. Y. &
Tseng, T-Y. ,
3 1月 2006 ,
於: Thin Solid Films. 494 ,
1-2 ,
p. 287-290 4 p. 研究成果: Article › 同行評審
Sol-gels
100%
Memory Effect
98%
MIM devices
74%
Thin films
72%
Retention Time
70%
Lin, C. C. ,
Tu, B. C. ,
Lin, C. C. ,
Lin, C. H. &
Tseng, T-Y. ,
1 9月 2006 ,
於: IEEE Electron Device Letters. 27 ,
9 ,
p. 725-727 3 p. 研究成果: Article › 同行評審
Data storage equipment
100%
Liquid Film
79%
Electron traps
76%
Electron Trap
58%
Oxides
35%
2005
Liu, C. Y. ,
Wu, P. H. ,
Wang, A. ,
Jang, W. Y. ,
Young, J. C. ,
Chiu, K. Y. &
Tseng, T-Y. ,
1 6月 2005 ,
於: IEEE Electron Device Letters. 26 ,
6 ,
p. 351-353 3 p. , 1432896.
研究成果: Article › 同行評審
Bias voltage
100%
Voltage
57%
Metals
51%
Data storage equipment
48%
Liquid Film
38%
Lee, C. Y. ,
Tsai, H. M. ,
Chuang, H. J. ,
Li, S. Y. ,
Lin, P. &
Tseng, T-Y. ,
20 5月 2005 ,
於: Journal of the Electrochemical Society. 152 ,
4 ,
p. A716-A720 6 p. 研究成果: Article › 同行評審
Manganese oxide
100%
Carbon Oxide
79%
Supercapacitor
73%
Nanocomposites
67%
Carbon nanotubes
66%
Dielectric properties
100%
Electric properties
87%
Dielectric Property
82%
Thin films
77%
Leakage Current
72%
Chen, C. W. ,
Chang, T. C. ,
Liu, P-T. ,
Tsai, T. M. &
Tseng, T-Y. ,
31 1月 2005 ,
於: Electrochemical and Solid-State Letters. 8 ,
1 ,
p. G11-G13 研究成果: Article › 同行評審
Dielectric films
100%
Ashing
86%
oxygen plasma
79%
Plasmas
62%
Dielectric Material
59%
Chen, C. W. ,
Chang, T. C. ,
Liu, P-T. ,
Lu, H. Y. ,
Tsai, T. M. ,
Weng, C. F. ,
Hu, C. W. &
Tseng, T-Y. ,
29 9月 2005 ,
於: Electrochemical and Solid-State Letters. 8 ,
9 ,
p. H69-H71 3 p. 研究成果: Article › 同行評審
Thin film transistors
100%
alternating current
69%
transistors
62%
Silicon
61%
Trap Density Measurement
59%
Chen, C. W. ,
Chang, T. C. ,
Liu, P-T. ,
Lu, H. Y. ,
Wang, K. C. ,
Huang, C. S. ,
Ling, C. C. &
Tseng, T-Y. ,
1 10月 2005 ,
於: IEEE Electron Device Letters. 26 ,
10 ,
p. 731-733 3 p. 研究成果: Article › 同行評審
Thin film transistors
100%
Parasitic
48%
Carrier mobility
29%
Amorphous silicon
26%
Amorphous Silicon
26%
Li, S. Y. ,
Lee, C. Y. ,
Lin, P. &
Tseng, T-Y. ,
1 4月 2005 ,
於: Nanotechnology. 16 ,
4 ,
p. 451-457 7 p. 研究成果: Article › 同行評審
Indium
100%
Nanowires
95%
Nanowire
66%
Oxides
66%
Field emission
49%
Nanostructures
100%
Solar cells
86%
Nanorods
72%
Semiconductor materials
72%
Solar Cell
70%
Lee, C. Y. ,
Tseng, T-Y. ,
Li, S. Y. &
Lin, P. ,
1 8月 2005 ,
於: Nanotechnology. 16 ,
8 ,
p. 1105-1111 7 p. 研究成果: Article › 同行評審
Nanowires
100%
Crystalline materials
84%
Glass Substrate
79%
Nanowire
69%
Nitrates
67%
Leakage Current
100%
Leakage currents
81%
Current density
73%
Thin films
71%
Binding energy
60%
Lee, C. Y. ,
Li, S. Y. ,
Lin, P. &
Tseng, T-Y. ,
1 12月 2005 ,
於: Journal of Nanoscience and Nanotechnology. 5 ,
7 ,
p. 1088-1094 7 p. 研究成果: Article › 同行評審
Zinc oxide
100%
Nanowires
93%
Zinc Oxide
73%
zinc oxides
72%
Nanowire
65%
2004
Chang, T. C. ,
Tsai, T. M. ,
Liu, P-T. ,
Chen, C. W. ,
Yan, S. T. ,
Aoki, H. ,
Chang, Y. C. &
Tseng, T-Y. ,
16 6月 2004 ,
於: Electrochemical and Solid-State Letters. 7 ,
6 研究成果: Article › 同行評審
Chemical mechanical polishing
100%
oxygen plasma
89%
polishing
80%
Plasmas
70%
Oxygen
61%
Chen, C. W. ,
Liu, P-T. ,
Chang, T. C. ,
Yang, J. H. ,
Tsai, T. M. ,
Wu, H. H. &
Tseng, T-Y. ,
22 12月 2004 ,
於: Thin Solid Films. 469-470 ,
SPEC. ISS. ,
p. 388-392 5 p. 研究成果: Article › 同行評審
Amorphous films
100%
Ions
75%
penetration
67%
breakdown
63%
Amorphous Material
56%
MIS (semiconductors)
100%
depletion
78%
capacitors
77%
leakage
73%
electric fields
52%
composite materials
100%
capacitance
87%
thin films
84%
dielectric loss
52%
charge carriers
47%
Li, S. Y. ,
Lin, P. ,
Lee, C. Y. &
Tseng, T-Y. ,
1 8月 2004 ,
於: Journal of Materials Science: Materials in Electronics. 15 ,
8 ,
p. 505-510 6 p. 研究成果: Article › 同行評審
Zinc oxide
100%
Nanowires
93%
Single crystals
86%
Zinc Oxide
73%
zinc oxides
72%
Li, S. Y. ,
Lin, P. ,
Lee, C. Y. ,
Tseng, T-Y. &
Huang, C. J. ,
21 8月 2004 ,
於: Journal of Physics D: Applied Physics. 37 ,
16 ,
p. 2274-2282 9 p. 研究成果: Article › 同行評審
Nanowires
100%
Doping (additives)
89%
Doping Material
70%
Nanowire
69%
nanowires
64%
Huang, C. H. ,
Chou, H. Y. ,
Lian, C. W. &
Tseng, T-Y. ,
15 2月 2004 ,
於: Materials Chemistry and Physics. 83 ,
2-3 ,
p. 345-349 5 p. 研究成果: Article › 同行評審
Fluorspar
100%
fluorite
73%
Thin films
57%
Dielectric Material
53%
Annealing
45%
Gate dielectrics
100%
Electric properties
74%
Dielectric Material
61%
Leakage Current
61%
Electrical Property
59%
Li, S. Y. ,
Lin, P. ,
Lee, C. Y. ,
Ho, M. S. &
Tseng, T-Y. ,
1 11月 2004 ,
於: Journal of Nanoscience and Nanotechnology. 4 ,
8 ,
p. 968-971 4 p. , 004.
研究成果: Article › 同行評審
Buffer layers
100%
Nanowires
87%
Nanowire
60%
buffers
59%
nanowires
56%
Li, S. Y. ,
Lin, P. ,
Lee, C. Y. &
Tseng, T-Y. ,
1 4月 2004 ,
於: Journal of Applied Physics. 95 ,
7 ,
p. 3711-3716 6 p. 研究成果: Article › 同行評審
metal vapors
100%
zinc oxides
76%
field emission
71%
nanowires
63%
liquids
41%
Huang, C. H. ,
Wang, Y. K. ,
Lue, H. T. ,
Huang, J. Y. ,
Lee, M. Z. &
Tseng, T-Y. ,
7月 2004 ,
於: Journal of the European Ceramic Society. 24 ,
8 ,
p. 2471-2476 6 p. 研究成果: Article › 同行評審
Ferroelectric materials
100%
Nonconductor
85%
Thin films
71%
Semiconductor materials
67%
Semiconductor
57%
Chang, T. C. ,
Tsai, T. M. ,
Liu, P-T. ,
Yan, S. T. ,
Chang, Y. C. ,
Aoki, H. ,
Sze, S. M. &
Tseng, T-Y. ,
1 5月 2004 ,
於: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 22 ,
3 ,
p. 1196-1201 6 p. 研究成果: Article › 同行評審
Chemical mechanical polishing
100%
Polishing
84%
polishing
80%
Plasmas
28%
Surface treatment
16%
Liu, P-T. ,
Chen, C. W. ,
Chang, T. C. &
Tseng, T-Y. ,
8 4月 2004 ,
於: Electrochemical and Solid-State Letters. 7 ,
2 ,
p. F5-F7 3 p. 研究成果: Article › 同行評審
Photoresists
100%
stripping
87%
photoresists
83%
Nanoporosity
73%
Gelation
54%
Ferroelectric materials
100%
Lead zirconate titanate
91%
Thin films
71%
Substrates
53%
Annealing
45%
Wang, Y. K. ,
Huang, C. H. ,
Tseng, T-Y. &
Lin, P. ,
10 5月 2004 ,
於: Journal of the Electrochemical Society. 151 ,
4 ,
p. F87-F91 5 p. 研究成果: Article › 同行評審
Ferroelectric materials
100%
Sol-gels
99%
Lead zirconate titanate
91%
Electrodes
58%
Leakage Current
49%
Chen, C. W. ,
Chang, T. C. ,
Liu, P-T. ,
Tsai, T. M. ,
Wu, H. H. &
Tseng, T-Y. ,
22 12月 2004 ,
於: Thin Solid Films. 469-470 ,
SPEC. ISS. ,
p. 377-382 6 p. 研究成果: Article › 同行評審
Etching
100%
Silica
95%
Nanoporosity
87%
Plasmas
85%
silicon dioxide
70%
Chang, T. C. ,
Tsai, T. M. ,
Liu, P-T. ,
Chen, C. W. &
Tseng, T-Y. ,
22 12月 2004 ,
於: Thin Solid Films. 469-470 ,
SPEC. ISS. ,
p. 383-387 5 p. 研究成果: Article › 同行評審
Electron beams
100%
Electron Beam
91%
curing
89%
Curing
79%
Glass
67%
2003
Nanowires
100%
Vapors
72%
Nanowire
69%
Copper
65%
nanowires
64%
Lue, H. T. ,
Wu, C. J. &
Tseng, T-Y. ,
1 1月 2003 ,
於: IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control. 50 ,
1 ,
p. 5-14 10 p. , 1176521.
研究成果: Article › 同行評審
Ferroelectric materials
100%
random access memory
87%
Field effect transistors
81%
field effect transistors
59%
Data storage equipment
46%
Chang, T. C. ,
Tsai, T. M. ,
Liu, P-T. ,
Mor, Y. S. ,
Chen, C. W. ,
Sheu, J-T. &
Tseng, T-Y. ,
1 5月 2003 ,
於: Electrochemical and Solid-State Letters. 6 ,
5 研究成果: Article › 同行評審
Silsesquioxane
100%
X rays
73%
Hydrogen
64%
Dielectric Material
53%
Photoresists
51%
Sol-gel process
100%
alkoxides
99%
Dielectric properties
89%
hydroxides
84%
Electric properties
78%
Dielectric properties
100%
Electric properties
87%
Dielectric Property
82%
Thin films
77%
Electrical Property
69%
Lee, C. Y. ,
Tseng, T-Y. ,
Li, S. Y. &
Lin, P. ,
1 6月 2003 ,
於: Tamkang Journal of Science and Engineering. 6 ,
2 ,
p. 127-132 6 p. 研究成果: Article › 同行評審
Zinc oxide
100%
Nanowires
93%
Silicon
59%
Energy dispersive X ray analysis
36%
Photoluminescence spectroscopy
26%
MIS (semiconductors)
100%
insulators
65%
polarization
47%
metals
45%
decomposition
33%
Chang, T. C. ,
Chen, C. W. ,
Liu, P-T. ,
Mor, Y. S. ,
Tsai, H. M. ,
Tsai, T. M. ,
Yan, S. T. ,
Tu, C. H. ,
Tseng, T-Y. &
Sze, S. M. ,
1 4月 2003 ,
於: Electrochemical and Solid-State Letters. 6 ,
4 研究成果: Article › 同行評審
moisture
100%
Leakage Current
81%
Moisture
80%
Glass
74%
Leakage currents
66%