搜尋結果
2015
Lu, Y. H. ,
Chang, T. C. ,
Ho, S. H. ,
Chen, C. E. ,
Tsai, J. Y. ,
Liu, K. J. ,
Liu, X. W. ,
Tseng, T. Y. ,
Cheng, O. ,
Huang, C. T. &
Lu, C. S. ,
1 6月 2015 ,
於: ECS Solid State Letters. 4 ,
8 ,
p. Q37-Q39 研究成果: Article › 同行評審
Negative bias temperature instability
100%
MOSFET devices
81%
Field Effect
69%
Annealing
69%
Crystal Displacement
60%
Annealing
100%
Ions
61%
Data storage equipment
61%
oxygen ions
55%
Oxygen
54%
2014
Zhang, G. Y. ,
Zhang, H. ,
Tan, S. L. ,
Zhang, P. X. ,
Tseng, T-Y. ,
Habermeier, H. U. ,
Lin, C. T. &
Singjai, P. ,
1 1月 2014 ,
於: Applied Physics A: Materials Science and Processing. 116 ,
3 ,
p. 1033-1039 7 p. 研究成果: Article › 同行評審
Seebeck Effect
100%
Seebeck effect
92%
Thin films
53%
Lasers
42%
Thermoelectricity
41%
Huang, C. Y. ,
Ho, Y. T. ,
Hung, C. J. &
Tseng, T-Y. ,
1 10月 2014 ,
於: IEEE Transactions on Electron Devices. 61 ,
10 ,
p. 3435-3441 7 p. , 6875903.
研究成果: Article › 同行評審
Nanorods
100%
Thin films
63%
Nanorod
57%
Resistance
42%
Data storage equipment
40%
Tsai, J. Y. ,
Chang, T. C. ,
Chen, C. E. ,
Ho, S. H. ,
Liu, K. J. ,
Lu, Y. H. ,
Liu, X. W. ,
Tseng, T-Y. ,
Cheng, O. ,
Huang, C. T. &
Lu, C. S. ,
6 10月 2014 ,
於: Applied Physics Letters. 105 ,
14 ,
5 p. , 143505.
研究成果: Article › 同行評審
hot electrons
100%
metal oxide semiconductors
98%
electron scattering
84%
field effect transistors
75%
injection
70%
Ismail, M. ,
Huang, C. Y. ,
Panda, D. ,
Hung, C. J. ,
Tsai, T. L. ,
Jieng, J. H. ,
Lin, C. A. ,
Chand, U. ,
Rana, A. M. ,
Ahmed, E. ,
Talib, I. ,
Nadeem, M. Y. &
Tseng, T-Y. ,
1月 2014 ,
於: Nanoscale Research Letters. 9 ,
1 ,
p. 1-8 8 p. 研究成果: Article › 同行評審
Cerium oxide
100%
Nonstoichiometric Compound
87%
Oxygen vacancies
80%
High resolution transmission electron microscopy
42%
Energy-Dispersive Spectroscopy
41%
Graphene
100%
Supercapacitor
99%
Nanocomposites
90%
Carbon nanotubes
89%
nanocomposites
73%
Hung, C. J. ,
Huang, Y. H. ,
Chen, C. H. ,
Lin, P. &
Tseng, T-Y. ,
5月 2014 ,
於: IEEE Transactions on Components, Packaging and Manufacturing Technology. 4 ,
5 ,
p. 831-839 9 p. , 6725611.
研究成果: Article › 同行評審
Electrochromic devices
100%
Nanowires
70%
Tungsten
61%
Seed
58%
Nanowire
49%
Ho, S. H. ,
Chang, T. C. ,
Lu, Y. H. ,
Chen, C. E. ,
Tsai, J. Y. ,
Liu, K. J. ,
Tseng, T-Y. ,
Cheng, O. ,
Huang, C. T. &
Lu, C. S. ,
17 3月 2014 ,
於: Applied Physics Letters. 104 ,
11 , 113503.
研究成果: Article › 同行評審
metal oxide semiconductors
100%
threshold voltage
92%
field effect transistors
76%
traps
72%
shift
59%
Gibbs free energy
100%
Gibbs Free Energy
54%
Data storage equipment
44%
Redox reactions
38%
RRAM
34%
Chen, C. E. ,
Chang, T. C. ,
Chen, H. M. ,
You, B. ,
Yang, K. H. ,
Ho, S. H. ,
Tsai, J. Y. ,
Liu, K. J. ,
Lu, Y. H. ,
Hung, Y. J. ,
Tai, Y-H. &
Tseng, T-Y. ,
1 6月 2014 ,
於: IEEE Electron Device Letters. 35 ,
6 ,
p. 651-653 3 p. , 6805192.
研究成果: Article › 同行評審
Charge Pumping
100%
Hot carriers
98%
Nitrides
88%
Nitride
70%
Transistors
62%
Meena, J. S. ,
Sze, S. M. ,
Chand, U. &
Tseng, T-Y. ,
25 9月 2014 ,
於: Nanoscale Research Letters. 9 ,
1 ,
p. 1-33 33 p. 研究成果: Article › 同行評審
Torque
100%
Field Effect
78%
emerging
70%
Data storage equipment
48%
random access memory
30%
Ismail, M. ,
Talib, I. ,
Huang, C. Y. ,
Hung, C. J. ,
Tsai, T. L. ,
Jieng, J. H. ,
Chand, U. ,
Lin, C. A. ,
Ahmed, E. ,
Rana, A. M. ,
Nadeem, M. Y. &
Tseng, T-Y. ,
5月 2014 ,
於: Japanese journal of applied physics. 53 ,
6 ,
4 p. , 060303.
研究成果: Article › 同行評審
Data storage equipment
100%
Fluorspar
90%
High resolution transmission electron microscopy
89%
Photoelectrons
85%
Oxygen vacancies
84%
Huang, C. Y. ,
Huang, C. Y. ,
Tsai, T. L. ,
Lin, C. A. &
Tseng, T-Y. ,
2月 2014 ,
於: Applied Physics Letters. 104 ,
6 , 062901.
研究成果: Article › 同行評審
endurance
100%
filaments
48%
random access memory
32%
oxygen ions
30%
electric potential
30%
2013
Tsai, J. Y. ,
Chang, T. C. ,
Lo, W. H. ,
Ho, S. H. ,
Chen, C. E. ,
Chen, H. M. ,
Tseng, T-Y. ,
Tai, Y-H. ,
Cheng, O. &
Huang, C. T. ,
9月 2013 ,
於: Journal of Applied Physics. 114 ,
12 ,
6 p. , 124505.
研究成果: Article › 同行評審
metal oxide semiconductors
100%
threshold voltage
92%
field effect transistors
76%
shift
59%
nitrogen
35%
Zhang, G. Y. ,
Zheng, H. R. ,
Huang, W. H. ,
Zhang, X. Y. ,
Gao, D. L. ,
Zhang, H. ,
Zhang, P. X. ,
Tseng, T-Y. ,
Habermeier, H. U. ,
Lin, C. T. &
Cheng, H. H. ,
1 11月 2013 ,
於: Applied Physics A: Materials Science and Processing. 113 ,
2 ,
p. 347-353 7 p. 研究成果: Article › 同行評審
Seebeck Effect
100%
Seebeck effect
92%
Thin films
53%
Lasers
42%
Energy
26%
Ho, S. H. ,
Chang, T. C. ,
Wu, C. W. ,
Lo, W. H. ,
Chen, C. E. ,
Tsai, J. Y. ,
Chen, H. M. ,
Liu, G. R. ,
Tseng, T-Y. ,
Cheng, O. ,
Huang, C. T. ,
Chen, D. &
Sze, S. M. ,
7月 2013 ,
於: ECS Journal of Solid State Science and Technology. 2 ,
9 ,
6 p. 研究成果: Article › 同行評審
Negative bias temperature instability
100%
Tunneling
71%
Field Effect
69%
Voltage
50%
Flow
45%
Chen, Y. C. ,
Chang, T. C. ,
Li, H. W. ,
Chung, W. F. ,
Chen, S. C. ,
Wu, C. P. ,
Chen, Y. H. ,
Tai, Y-H. ,
Tseng, T-Y. &
Yeh(Huang), F. S. ,
25 9月 2013 ,
於: Surface and Coatings Technology. 231 ,
p. 531-534 4 p. 研究成果: Article › 同行評審
Gallium
100%
Zinc oxide
93%
Indium
91%
gallium oxides
90%
Thin film transistors
89%
Manganese oxide
100%
manganese oxides
84%
Graphene
74%
Nanocomposites
67%
Carbon nanotubes
66%
Ho, S. H. ,
Chang, T. C. ,
Lu, Y. H. ,
Wang, B. W. ,
Lo, W. H. ,
Chen, C. E. ,
Tsai, J. Y. ,
Chen, H. M. ,
Liu, K. J. ,
Tseng, T-Y. ,
Cheng, O. ,
Huang, C. T. ,
Chen, T. F. &
Cao, X. X. ,
7 11月 2013 ,
於: Journal of Applied Physics. 114 ,
17 , 174506.
研究成果: Article › 同行評審
pumping
100%
traps
88%
falling
33%
electrons
13%
curves
11%
Huang, C. Y. ,
Jieng, J. H. ,
Jang, W. Y. ,
Lin, C. H. &
Tseng, T-Y. ,
5月 2013 ,
於: ECS Solid State Letters. 2 ,
8 研究成果: Article › 同行評審
Aluminum oxide
100%
Voltage
75%
Data storage equipment
63%
Atomic Layer Epitaxy
60%
Crystallization Point
55%
Ho, S. H. ,
Chang, T. C. ,
Wu, C. W. ,
Lo, W. H. ,
Chen, C. E. ,
Tsai, J. Y. ,
Liu, G. R. ,
Chen, H. M. ,
Lu, Y. S. ,
Wang, B. W. ,
Tseng, T-Y. ,
Cheng, O. ,
Huang, C. T. &
Sze, S. M. ,
7 1月 2013 ,
於: Applied Physics Letters. 102 ,
1 , 012103.
研究成果: Article › 同行評審
metal oxide semiconductors
100%
field effect transistors
76%
metals
49%
floating
32%
temperature
28%
Ho, S. H. ,
Chang, T. C. ,
Wang, B. W. ,
Lu, Y. S. ,
Lo, W. H. ,
Chen, C. E. ,
Tsai, J. Y. ,
Chen, H. M. ,
Liu, G. R. ,
Tseng, T-Y. ,
Cheng, O. ,
Huang, C. T. &
Cao, X. X. ,
7 1月 2013 ,
於: Applied Physics Letters. 102 ,
1 ,
5 p. , 012106.
研究成果: Article › 同行評審
metal oxide semiconductors
100%
high voltages
85%
pumping
82%
field effect transistors
76%
traps
72%
Chen, C. E. ,
Chang, T. C. ,
You, B. ,
Lo, W. H. ,
Ho, S. H. ,
Dai, C. H. ,
Tsai, J. Y. ,
Chen, H. M. ,
Liu, G. R. ,
Tai, Y-H. &
Tseng, T-Y. ,
2 12月 2013 ,
於: ECS Solid State Letters. 2 ,
11 研究成果: Article › 同行評審
Telegraph
100%
Signal analysis
78%
Diffusion
43%
MOSFET devices
41%
Electrons
35%
ambience
100%
Sol-gels
93%
Thin films
67%
gels
56%
Heating
51%
resistors
100%
diodes
73%
random access memory
37%
readout
29%
filaments
28%
Zhang, G. Y. ,
Lee, D. Y. ,
Yao, I. C. ,
Hung, C. J. ,
Wang, S. Y. ,
Huang, T. Y. ,
Wu, J. W. &
Tseng, T-Y. ,
1 4月 2013 ,
於: Japanese Journal of Applied Physics. 52 ,
4 PART 1 ,
7 p. , 041101.
研究成果: Article › 同行評審
Thin films
100%
thin films
54%
filaments
34%
Sol-gel process
17%
Data storage equipment
16%
2012
Ho, S. H. ,
Chang, T. C. ,
Wu, C. W. ,
Lo, W. H. ,
Chen, C. E. ,
Tsai, J. Y. ,
Luo, H. P. ,
Tseng, T-Y. ,
Cheng, O. ,
Huang, C. T. &
Sze, S. M. ,
30 7月 2012 ,
於: Applied Physics Letters. 101 ,
5 , 052105.
研究成果: Article › 同行評審
metal oxide semiconductors
100%
field effect transistors
76%
metals
49%
floating
32%
trapping
12%
Ho, S. H. ,
Chang, T. C. ,
Lu, Y. S. ,
Lo, W. H. ,
Chen, C. E. ,
Tsai, J. Y. ,
Chen, H. M. ,
Wu, C. W. ,
Luo, H. P. ,
Liu, G. R. ,
Tseng, T-Y. ,
Cheng, O. ,
Huang, C. T. &
Sze, S. M. ,
3 12月 2012 ,
於: Applied Physics Letters. 101 ,
23 , 233509.
研究成果: Article › 同行評審
metal oxide semiconductors
100%
pumping
82%
field effect transistors
76%
traps
72%
metals
49%
Wu, M. C. ,
Jang, W. Y. ,
Lin, C. H. &
Tseng, T-Y. ,
1 6月 2012 ,
於: Semiconductor Science and Technology. 27 ,
6 , 065010.
研究成果: Article › 同行評審
low resistance
100%
Voltage
63%
Resistance
55%
Data storage equipment
53%
random access memory
50%
Nanodots
100%
Electrodes
41%
electrodes
33%
Data storage equipment
33%
Nanospheres
22%
Yao, I. C. ,
Lin, P. ,
Huang, S. H. &
Tseng, T-Y. ,
17 7月 2012 ,
於: IEEE Transactions on Components, Packaging and Manufacturing Technology. 2 ,
7 ,
p. 1143-1150 8 p. , 6203430.
研究成果: Article › 同行評審
Nanorods
100%
Electric properties
71%
Nanorod
57%
Electrical Property
56%
Field emission
43%
Yao, I. C. ,
Lee, D. Y. ,
Tseng, T-Y. &
Lin, P. ,
13 4月 2012 ,
於: Nanotechnology. 23 ,
14 , 145201.
研究成果: Article › 同行評審
Thin film devices
100%
Nanorods
89%
Nanorod
51%
Fabrication
44%
Thin films
40%
Nanotips
100%
Nanorods
74%
Field emission
63%
Flat panel displays
17%
Crystalline materials
13%
Chung, W. F. ,
Chang, T. C. ,
Lin, C. S. ,
Tu, K. J. ,
Li, H. W. ,
Tseng, T-Y. ,
Chen, Y. C. &
Tai, Y-H. ,
29 2月 2012 ,
於: Journal of the Electrochemical Society. 159 ,
3 研究成果: Article › 同行評審
Gallium
100%
Hot carriers
94%
Zinc oxide
93%
Indium
91%
Thin film transistors
89%
silicides
100%
nickel
77%
endurance
22%
electric potential
20%
Auger spectroscopy
19%
thin films
100%
electric potential
69%
chemical reactions
58%
x rays
58%
analyzers
57%
Buffer layers
100%
Calcium oxide
80%
Conductor
70%
Ions
64%
Oxygen
56%
Nanorods
100%
Photocurrents
97%
Photodetectors
86%
nanorods
66%
photometers
59%
2011
Lee, Y. J. ,
Chuang, S. S. ,
Hsueh, F. K. ,
Lin, H. M. ,
Wu, S. C. ,
Wu, C. Y. &
Tseng, T-Y. ,
1 2月 2011 ,
於: IEEE Electron Device Letters. 32 ,
2 ,
p. 194-196 3 p. , 5665750.
研究成果: Article › 同行評審
Germanium
100%
Sheet Resistance
90%
Doping (additives)
83%
Crystalline materials
78%
Annealing
74%
Manganese oxide
100%
manganese oxides
84%
Supercapacitor
73%
Nanocomposites
67%
Carbon nanotubes
66%
Chung, W. F. ,
Chang, T. C. ,
Li, H. W. ,
Chen, S. C. ,
Chen, Y. C. ,
Tseng, T-Y. &
Tai, Y-H. ,
11 4月 2011 ,
於: Applied Physics Letters. 98 ,
15 , 152109.
研究成果: Article › 同行評審
gallium oxides
100%
thermal instability
98%
zinc oxides
75%
indium
74%
transistors
62%
conduction
100%
thin films
77%
annealing
67%
filaments
64%
embedding
38%
Chung, W. F. ,
Chang, T. C. ,
Li, H. W. ,
Chen, S. C. ,
Chen, Y. C. ,
Tseng, T-Y. &
Tai, Y-H. ,
13 4月 2011 ,
於: Electrochemical and Solid-State Letters. 14 ,
6 研究成果: Article › 同行評審
Gallium
100%
Zinc oxide
93%
Sol-gels
92%
Indium
91%
gallium oxides
90%
Lin, M. H. ,
Wu, M. C. ,
Huang, Y. H. ,
Lin, C. H. &
Tseng, T-Y. ,
1 4月 2011 ,
於: IEEE Transactions on Electron Devices. 58 ,
4 ,
p. 1182-1188 7 p. , 5704573.
研究成果: Article › 同行評審
Rapid Thermal Annealing
100%
Oxygen
54%
Rapid thermal annealing
51%
Data storage equipment
40%
Reaction Yield
27%
Wang, S. Y. ,
Tsai, C. H. ,
Lee, D. Y. ,
Lin, C. Y. ,
Lin, C. C. &
Tseng, T-Y. ,
1 7月 2011 ,
於: Microelectronic Engineering. 88 ,
7 ,
p. 1628-1632 5 p. 研究成果: Article › 同行評審
RRAM
100%
Voltage
51%
Data storage equipment
43%
Compliance
43%
Electric potential
24%
Chung, W. F. ,
Chang, T. C. ,
Li, H. W. ,
Chen, C. W. ,
Chen, Y. C. ,
Chen, S. C. ,
Tseng, T-Y. &
Tai, Y-H. ,
28 1月 2011 ,
於: Electrochemical and Solid-State Letters. 14 ,
3 研究成果: Article › 同行評審
Gallium
100%
Zinc oxide
93%
Indium
91%
gallium oxides
90%
Thin film transistors
89%
Tsai, Y. T. ,
Chang, T. C. ,
Lin, C. C. ,
Chen, S. C. ,
Chen, C. W. ,
Sze, S. M. ,
Yeh, F. S. &
Tseng, T-Y. ,
28 1月 2011 ,
於: Electrochemical and Solid-State Letters. 14 ,
3 研究成果: Article › 同行評審
Nanocrystals
100%
metal oxides
64%
nanocrystals
59%
Oxides
57%
Metal Oxide
55%
Tsai, Y. T. ,
Chang, T. C. ,
Huang, W. L. ,
Huang, C. W. ,
Syu, Y. E. ,
Chen, S. C. ,
Sze, S. M. ,
Tsai, M. J. &
Tseng, T-Y. ,
29 8月 2011 ,
於: Applied Physics Letters. 99 ,
9 , 092106.
研究成果: Article › 同行評審
filaments
100%
conduction
25%
products
24%
electric potential
20%
electronics
20%
Wu, M. C. ,
Lin, Y. W. ,
Jang, W. Y. ,
Lin, C. H. &
Tseng, T-Y. ,
1 8月 2011 ,
於: IEEE Electron Device Letters. 32 ,
8 ,
p. 1026-1028 3 p. , 5929488.
研究成果: Article › 同行評審
RRAM
100%
Field Effect
70%
Voltage
51%
MOSFET devices
41%
Filament
35%