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查看斯高帕斯 (Scopus) 概要
洪 紹剛
副教授
機械工程學系
https://orcid.org/0000-0003-2249-6986
電話
03-5712121#55115
電子郵件
skhung
nctu.edu
tw
網站
http://www.cc.nctu.edu.tw/~skhung
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545
引文
13
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86
引文
4
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9
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2004
2022
每年研究成果
概覽
指紋
網路
計畫
(15)
研究成果
(54)
獎項
(3)
類似的個人檔案
(6)
如果您對這些純文本內容做了任何改變,很快就會看到。
指紋
查看啟用 Shao-Kang Hung 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
排序方式
重量
按字母排序
Engineering & Materials Science
Microscopes
100%
Actuators
71%
Atomic force microscopy
66%
Controllers
63%
Pickups
58%
Scanning
57%
Sensors
51%
Optical sensors
41%
Magnetic levitation
36%
Fabry-Perot interferometers
32%
Particle beam tracking
32%
Videodisks
30%
Lasers
28%
Buffer layers
27%
Eddy currents
25%
Fluids
24%
Optoelectronic devices
24%
Interferometry
23%
Permanent magnets
22%
ROM
22%
Magnetic actuators
22%
Quartz
21%
Hinges
21%
Costs
21%
Stiffness
20%
Sliding mode control
19%
Annealing
19%
Accelerometers
18%
Thin films
18%
Dynamic models
18%
Sapphire
18%
Photodiodes
18%
Unmanned aerial vehicles (UAV)
18%
Electric power utilization
17%
Tuning
17%
Mirrors
16%
Buoyancy
15%
Galvanometers
15%
Feedback
15%
Damping
14%
Substrates
14%
Electric cables
14%
3D printers
14%
Experiments
13%
Photomasks
13%
Microrobots
13%
Precision agriculture
13%
Lenses
13%
Liquids
13%
Structural properties
12%
Mathematics
Atomic Force Microscope
36%
Flexure
34%
Positioning
30%
Actuator
27%
Design
20%
Motion
19%
Controller
19%
Sliding Mode
18%
Coil
17%
Eddy Currents
17%
Experimental Results
15%
Mechanism Design
15%
Step Response
14%
Cantilever
13%
Damper
13%
Deflection
11%
Performance
11%
Damped
9%
Liquid
9%
Atomic Force Microscopy
9%
Stiffness
8%
Permanent Magnet
7%
Demonstrate
7%
Laser Interferometer
6%
Piezoelectric
6%
Stroke
6%
Vibration
6%
Hardware
5%
Sensor
5%
Non-contact
5%
Dynamic Model
5%
Range of data
5%
Physics & Astronomy
atomic force microscopy
22%
scanning
18%
positioning
16%
pilotless aircraft
15%
hovering
15%
agriculture
14%
ground stations
14%
galvanometers
13%
flight time
13%
photomasks
12%
surveillance
12%
displacement measurement
12%
sensors
11%
high altitude
11%
endurance
11%
accelerometers
11%
photolithography
10%
electric power
10%
probes
8%
high voltages
8%
buffers
8%
optical disks
8%
actuators
7%
electron microscopes
7%
lenses
7%
mirrors
6%
scanners
6%
photoresists
6%
annealing
5%
air
5%
deflection
5%
sensitivity
5%
zinc oxides
5%
coils
5%
image resolution
5%
microscopes
5%
thin films
5%