搜尋結果
2016
Tiwari, N. ,
Chauhan, R. N. ,
Liu, P-T. &
Shieh, H. P. D. ,
1 1月 2016 ,
於: RSC Advances. 6 ,
79 ,
p. 75393-75398 6 p. 研究成果: Article › 同行評審
Thin film transistors
100%
Thin films
73%
Photoluminescence
60%
Compound Mobility
59%
Defects
53%
Tiwari, N. ,
Chauhan, R. N. ,
Shieh, H. P. D. ,
Liu, P-T. &
Huang, Y-P. ,
4月 2016 ,
於: IEEE Transactions on Electron Devices. 63 ,
4 ,
p. 1578-1581 4 p. , 7416615.
研究成果: Article › 同行評審
Photoluminescence
100%
Gallium
87%
Zinc oxide
81%
Indium
80%
Thin film transistors
78%
Liu, P-T. ,
Chang, C. H. ,
Zheng, G. T. ,
Fuh, C. S. ,
Teng, L. F. ,
Wu, M. C. &
Lee, Y. J. ,
30 11月 2016 ,
於: Thin Solid Films. 619 ,
p. 148-152 5 p. 研究成果: Article › 同行評審
Thin film transistors
100%
Contact Resistance
98%
Parasitic
96%
Contact resistance
90%
contact resistance
82%
Chauhan, R. N. ,
Tiwari, N. ,
Liu, P-T. ,
Shieh, H. P. D. &
Kumar, J. ,
14 11月 2016 ,
於: Applied Physics Letters. 109 ,
20 , 202107.
研究成果: Article › 同行評審
indium oxides
100%
zinc oxides
97%
transistors
80%
silicon
54%
thin films
52%
tungsten oxides
100%
indium oxides
77%
transistors
62%
retarding
59%
thin films
40%
2015
Tiwari, N. ,
Chauhan, R. N. ,
Liu, P-T. &
Shieh, H. P. D. ,
1 1月 2015 ,
於: RSC Advances. 5 ,
64 ,
p. 51983-51989 7 p. 研究成果: Article › 同行評審
Gallium
100%
Zinc oxide
93%
Indium
91%
Sputtering
90%
Thin film transistors
89%
Fan, Y. S. ,
Liu, P-T. ,
Chen, C. C. &
Chang, C. C. ,
1月 2015 ,
於: ECS Solid State Letters. 4 ,
9 ,
p. Q41-Q43 研究成果: Article › 同行評審
RRAM
100%
Thin film transistors
90%
Oxide semiconductors
84%
Durability
57%
Oxide
38%
Photoluminescence
100%
Gallium
87%
Zinc oxide
81%
Indium
80%
gallium oxides
79%
2014
Sputtering
100%
Solar Cell
67%
Antireflection coatings
63%
Thin film solar cells
59%
Tin
45%
Tin oxides
100%
Zinc oxide
96%
Oxide films
89%
Tin Oxide
77%
Diodes
66%
Fuh, C. S. ,
Liu, P-T. ,
Huang, W. H. &
Sze, S. M. ,
11月 2014 ,
於: IEEE Electron Device Letters. 35 ,
11 ,
p. 1103-1105 3 p. , 6899612.
研究成果: Article › 同行評審
Tin oxides
100%
Zinc oxide
96%
Indium
94%
Thin film transistors
92%
Oxide films
89%
Zinc oxide
100%
Solar cells
79%
Zinc Oxide
73%
zinc oxides
72%
Solar Cell
65%
Tin oxides
100%
Zinc oxide
96%
Filament
64%
Data storage equipment
58%
Aluminum
55%
Liu, P-T. ,
Fuh, C. S. ,
Fan, Y. S. &
Sze, S. M. ,
1月 2014 ,
於: ECS Journal of Solid State Science and Technology. 3 ,
9 ,
p. Q3054-Q3057 4 p. 研究成果: Article › 同行評審
Flat panel displays
100%
Thin film transistors
90%
Threshold voltage
77%
Voltage
51%
Oxide semiconductors
41%
Fuh, C. S. ,
Liu, P-T. ,
Fan, Y. S. ,
Chang, C. H. &
Chang, C. C. ,
1 1月 2014 ,
於: Digest of Technical Papers - SID International Symposium. 45 ,
1 ,
p. 1017-1020 4 p. 研究成果: Article › 同行評審
Tin oxides
100%
Zinc oxide
96%
Indium
94%
Thin film transistors
92%
Oxide films
89%
Wang, Y. C. ,
Lin, B. Y. ,
Liu, P-T. &
Shieh, H. P. D. ,
13 1月 2014 ,
於: Optics Express. 22 ,
S1 ,
p. A13-A20 8 p. 研究成果: Article › 同行評審
nanorods
100%
solar cells
75%
electrical properties
74%
photocurrents
62%
thin films
52%
Meena, J. S. ,
Chu, M. C. ,
Singh, R. ,
Wu, C. S. ,
Chand, U. ,
You, H. C. ,
Liu, P-T. ,
Shieh, H. P. D. &
Ko, F-H. ,
1 1月 2014 ,
於: RSC Advances. 4 ,
36 ,
p. 18493-18502 10 p. 研究成果: Article › 同行評審
Plastic films
100%
Gate dielectrics
98%
Thin film transistors
88%
Polystyrenes
79%
Dielectric Material
61%
2013
Meena, J. S. ,
Chu, M. C. ,
Singh, R. ,
Shieh, H. P. D. ,
Liu, P-T. &
Ko, F-H. ,
6月 2013 ,
於: Journal of Materials Science: Materials in Electronics. 24 ,
6 ,
p. 1807-1812 6 p. 研究成果: Article › 同行評審
Ultrathin films
100%
Gate dielectrics
88%
Leakage Current
81%
Ultrathin Film
76%
Leakage currents
66%
Zheng, G. T. ,
Liu, P-T. ,
Wu, M. C. ,
Chu, L. W. &
Yang, M. C. ,
2月 2013 ,
於: IEEE/OSA Journal of Display Technology. 9 ,
2 ,
p. 91-99 9 p. , 6410362.
研究成果: Article › 同行評審
Foundry
100%
Amorphous silicon
96%
Amorphous Silicon
96%
Liquid crystal displays
76%
amorphous silicon
65%
Fuh, C. S. ,
Liu, P-T. ,
Teng, L. F. ,
Fan, Y. S. ,
Chang, C. H. ,
Wu, Y. T. ,
Huang, S. W. &
Shieh, H. P. D. ,
1 1月 2013 ,
於: Digest of Technical Papers - SID International Symposium. 44 ,
1 ,
p. 1026-1028 3 p. 研究成果: Article › 同行評審
Annealing
100%
Oxides
86%
Microwaves
53%
Furnaces
35%
Amorphous films
32%
Meena, J. S. ,
Chu, M. C. ,
Chang, Y. C. ,
You, H. C. ,
Singh, R. ,
Liu, P-T. ,
Shieh, H. P. D. ,
Chang, F. C. &
Ko, F-H. ,
28 10月 2013 ,
於: Journal of Materials Chemistry C. 1 ,
40 ,
p. 6613-6622 10 p. 研究成果: Article › 同行評審
Plastic sheets
100%
Surface states
96%
Plastic Film
93%
Zinc oxide
89%
Thin film transistors
85%
Fuh, C. S. ,
Liu, P-T. ,
Teng, L. F. ,
Huang, S. W. ,
Lee, Y. J. ,
Shieh, H. P. D. &
Sze, S. M. ,
9月 2013 ,
於: IEEE Electron Device Letters. 34 ,
9 ,
p. 1157-1159 3 p. , 6564440.
研究成果: Article › 同行評審
Thin film transistors
100%
Annealing
77%
Microwaves
68%
Microwave
63%
Amorphous Material
54%
Jheng, B. T. ,
Liu, P-T. ,
Wang, M. C. &
Wu, M. C. ,
29 7月 2013 ,
於: Applied Physics Letters. 103 ,
5 ,
p. 1-4 4 p. , 052904.
研究成果: Article › 同行評審
energy conversion efficiency
100%
antireflection coatings
97%
nanorods
81%
absorbers
68%
sputtering
65%
Supercritical fluids
100%
Thin film transistors
92%
Supercritical Fluid
82%
Trap Density Measurement
36%
Carrier mobility
26%
Zhan, R. ,
Dong, C. ,
Liu, P-T. &
Shieh, H. P. D. ,
12月 2013 ,
於: Microelectronics Reliability. 53 ,
12 ,
p. 1879-1885 7 p. 研究成果: Article › 同行評審
Amorphous films
100%
Thin film transistors
78%
Passivation
74%
Chemical Passivation
62%
passivity
57%
high speed
100%
Amorphous Material
91%
Data storage equipment
80%
Sputtering
71%
Flash memory
52%
Thin film transistors
100%
Plasmas
72%
transistors
62%
Plasma
48%
thin films
40%
gallium oxides
100%
zinc oxides
75%
indium
74%
random access memory
45%
thin films
40%
Chu, M. C. ,
Meena, J. S. ,
Liu, P-T. ,
D. Shieh, H. P. ,
You, H. C. ,
Tu, Y. W. ,
Chang, F. C. &
Ko, F-H. ,
7月 2013 ,
於: Applied Physics Express. 6 ,
7 , 076501.
研究成果: Article › 同行評審
Charge carriers
100%
Carrier concentration
92%
Zinc oxide
87%
Thin film transistors
83%
Oxide films
81%
Tsai, M. Y. ,
Tsai, Y. C. ,
Teng, L. F. ,
Liu, P-T. &
Shieh, H. P. D. ,
1 1月 2013 ,
於: Digest of Technical Papers - SID International Symposium. 44 ,
1 ,
p. 178-181 4 p. 研究成果: Article › 同行評審
Shielding
100%
Photosensitivity
52%
Lighting
51%
Passivation
38%
Jheng, B. T. ,
Liu, P-T. ,
Chang, Y. P. &
Wu, M. C. ,
1 1月 2013 ,
於: ECS Transactions. 50 ,
49 ,
p. 53-58 6 p. 研究成果: Article › 同行評審
Thin films
100%
Raman spectroscopy
70%
Sputtering
67%
Surface morphology
59%
Chemical properties
59%
Fuh, C. S. ,
Liu, P-T. ,
Chou, Y. T. ,
Teng, L. F. &
Sze, S. M. ,
1月 2013 ,
於: ECS Journal of Solid State Science and Technology. 2 ,
1 ,
p. Q1-Q5 5 p. 研究成果: Article › 同行評審
Thin film transistors
100%
Amorphous films
63%
Oxygen
63%
Annealing
58%
Amorphous Material
54%
2012
Jheng, B. T. ,
Liu, P-T. ,
Wu, M. C. &
Shieh, H. P. D. ,
1 7月 2012 ,
於: Optics Letters. 37 ,
13 ,
p. 2760-2762 3 p. 研究成果: Article › 同行評審
sputtering
100%
solar cells
94%
thin films
65%
p-type semiconductors
54%
exclusion
47%
Fan, Y. S. ,
Liu, P-T. ,
Teng, L. F. &
Hsu, C. H. ,
30 7月 2012 ,
於: Applied Physics Letters. 101 ,
5 ,
p. 1-3 3 p. , 052901.
研究成果: Article › 同行評審
zinc oxides
100%
tin oxides
99%
conduction
68%
random access memory
39%
low resistance
39%
Teng, L. F. ,
Liu, P-T. ,
Lo, Y. J. &
Lee, Y. J. ,
24 9月 2012 ,
於: Applied Physics Letters. 101 ,
13 ,
p. 1-4 4 p. , 132901.
研究成果: Article › 同行評審
transistors
100%
microwaves
84%
oxides
78%
augmentation
76%
annealing
75%
Surface potential
100%
Surface Potential
80%
Electrons
74%
probes
44%
image contrast
41%
2011
Liu, P-T. ,
Chou, Y. T. ,
Teng, L. F. ,
Li, F. H. ,
Fuh, C. S. &
Shieh, H. P. D. ,
1 10月 2011 ,
於: IEEE Electron Device Letters. 32 ,
10 ,
p. 1397-1399 3 p. , 5995139.
研究成果: Article › 同行評審
Thin film transistors
100%
Amorphous Material
54%
Amorphous films
36%
Passivation
27%
Nitrogen
20%
Thin film transistors
100%
Liquid crystal displays
84%
pixels
63%
analogs
63%
transistors
62%
Amorphous silicon
100%
Amorphous Silicon
99%
Threshold voltage
80%
Liquid crystal displays
79%
cancellation
75%
elimination
100%
leakage
56%
controllability
40%
interlayers
30%
germanium
30%
Yao, J. ,
Xu, N. ,
Deng, S. ,
Chen, J. ,
She, J. ,
Shieh, H. P. D. ,
Liu, P-T. &
Huang, Y-P. ,
1 4月 2011 ,
於: IEEE Transactions on Electron Devices. 58 ,
4 ,
p. 1121-1126 6 p. , 5730484.
研究成果: Article › 同行評審
Amorphous films
100%
Oxygen vacancies
94%
Thin film transistors
78%
Amorphous Material
42%
Dioxygen
29%
Negative bias temperature instability
100%
Thin film transistors
89%
Polysilicon
80%
Diodes
64%
Polycrystalline Solid
62%
Nanoprobes
100%
Mirrors
56%
Electrons
55%
Electron microscopes
52%
Scanning
42%
Liu, L. W. ,
Tsai, Y. C. ,
Liu, P-T. &
Shieh, H. P. D. ,
1 6月 2011 ,
於: Digest of Technical Papers - SID International Symposium. 42 ,
1 ,
p. 1162-1165 4 p. 研究成果: Article › 同行評審
Amorphous films
100%
Surface states
88%
Thin film transistors
78%
Geometry
37%
Liu, P-T. ,
Chou, Y. T. ,
Teng, L. F. ,
Li, F. H. &
Shieh, H. P. ,
31 1月 2011 ,
於: Applied Physics Letters. 98 ,
5 , 052102.
研究成果: Article › 同行評審
transistors
100%
thin films
64%
nitrogen
55%
carrier mobility
25%
gas mixtures
23%
Doping (additives)
100%
Electrons
90%
Doping Material
78%
Voltage
64%
Electron Particle
48%
Fuh, C. S. ,
Sze, S. M. ,
Liu, P-T. ,
Teng, L. F. &
Chou, Y. T. ,
30 12月 2011 ,
於: Thin Solid Films. 520 ,
5 ,
p. 1489-1494 6 p. 研究成果: Article › 同行評審
Passivation
100%
Annealing
82%
passivity
76%
Thin film transistors
52%
annealing
49%
Liu, P-T. ,
Chou, Y. T. ,
Hsu, T. H. &
Fuh, C. S. ,
28 1月 2011 ,
於: Electrochemical and Solid-State Letters. 14 ,
2 ,
3 p. 研究成果: Article › 同行評審
Lanthanum alloys
100%
lanthanum alloys
85%
Thin film transistors
57%
Nickel alloys
57%
nickel alloys
52%
2010
Liu, P-T. ,
Huang, C. S. ,
Huang, Y. L. ,
Lin, J. R. ,
Cheng, S. L. ,
Nishi, Y. &
Sze, S. M. ,
26 3月 2010 ,
於: Applied Physics Letters. 96 ,
11 ,
3 p. , 112902.
研究成果: Article › 同行評審
supercritical fluids
100%
metal oxide semiconductors
78%
semiconductor devices
78%
germanium
68%
capacitance-voltage characteristics
18%
Liu, P-T. ,
Chou, Y. T. ,
Teng, L. F. &
Fuh, C. S. ,
23 8月 2010 ,
於: Applied Physics Letters. 97 ,
8 , 083505.
研究成果: Article › 同行評審
inverters
100%
high gain
86%
CMOS
72%
transistors
64%
electric potential
43%