每年專案
個人檔案
研究專長
矽奈米電子、半導體元件物理、元件模型及設計
經歷
2003/08~迄今 國立交通大學電子工程學系/電子研究所教授
教育/學術資格
PhD, 電機工程, University of California, Berkeley
外部位置
指紋
查看啟用 Pin Su 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
- 1 類似的個人檔案
過去五年中的合作和熱門研究領域
國家/地區層面的近期外部共同作業。按一下圓點深入探索詳細資料，或
專案
- 20 已完成
-
-
次奈米節點鐵電電晶體關鍵技術：鐵電反鐵電材料與物理,低能耗邏輯與記憶體元件及其高效能運算(2/2)
1/05/22 → 30/04/23
研究計畫: Other Government Ministry Institute
-
-
次奈米節點鐵電電晶體關鍵技術：鐵電反鐵電材料與物理, 低能耗邏輯與記憶體元件及其高效能運算(1/2)
1/05/21 → 30/04/22
研究計畫: Other Government Ministry Institute
-
-
Analysis and Design of Stacked-Nanosheet FeFET Synapse Conductance Response under Identical Pulse Scheme for Neuromorphic Applications
Lin, H. L. & Su, P., 2023, 7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023. Institute of Electrical and Electronics Engineers Inc., (7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023).研究成果: Conference contribution › 同行評審
-
A Tall Gate Stem GaN HEMT with Improved Power Density and Efficiency at Ka-Band
Lee, P. H., Lin, Y. C., Hsu, H. T., Tsao, Y. F., Dee, C. F., Su, P. & Chang, E. Y., 2023, (Accepted/In press) 於: IEEE Journal of the Electron Devices Society. p. 1 1 p.研究成果: Article › 同行評審
開啟存取2 引文 斯高帕斯（Scopus） -
Cryogenic Endurance of Anti-ferroelectric and Ferroelectric Hf_1-xZr_XO_2 for Quantum Computing Applications
Hsiang, K. Y., Lee, J. Y., Lou, Z. F., Chang, F. S., Li, Z. X., Liu, C. W., Hou, T. H., Su, P. & Lee, M. H., 2023, 2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings. Institute of Electrical and Electronics Engineers Inc., (IEEE International Reliability Physics Symposium Proceedings; 卷 2023-March).研究成果: Conference contribution › 同行評審
-
Fatigue Mechanism of Antiferroelectric Hf0.1Zr0.9O2 Toward Endurance Immunity by Opposite Polarity Cycling Recovery (OPCR) for eDRAM
Hsiang, K. Y., Lee, J. Y., Lou, Z. F., Chang, F. S., Chen, Y. C., Li, Z. X., Liao, M. H., Liu, C. W., Hou, T. H., Su, P. & Lee, M. H., 1 4月 2023, 於: IEEE Transactions on Electron Devices. 70, 4, p. 2142-2146 5 p.研究成果: Article › 同行評審
開啟存取1 引文 斯高帕斯（Scopus） -
NLS based Modeling of Temperature-dependent Phase Transition Characteristics for Antiferroelectric/Ferroelectric Hafnium Zirconium Oxides
Chen, Y. C., Hsiang, K. Y., Lee, M. H. & Su, P., 2023, 2023 International VLSI Symposium on Technology, Systems and Applications, VLSI-TSA/VLSI-DAT 2023 - Proceedings. Institute of Electrical and Electronics Engineers Inc., (2023 International VLSI Symposium on Technology, Systems and Applications, VLSI-TSA/VLSI-DAT 2023 - Proceedings).研究成果: Conference contribution › 同行評審