每年研究成果
每年研究成果
個人檔案
教育/學術資格
PhD, Electrical engineering, Indian Institute of Technology Kanpur
指紋
查看啟用 PAHWA GIRISH 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
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過去五年中的合作和熱門研究領域
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An All-Region BSIM Thin-Film Transistor Model for Display and BEOL 3-D Integration Applications
Pahwa, G., Salahuddin, S. & Hu, C., 2024, 於: IEEE Transactions on Electron Devices. 71, 8, p. 4701-4709 9 p.研究成果: Article › 同行評審
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ANN-based framework for modeling process induced variation using BSIM-CMG unified model
Singhal, A., Machhiwar, Y., Kumar, S., Pahwa, G. & Agarwal, H., 10月 2024, 於: Solid-State Electronics. 220, 108988.研究成果: Article › 同行評審
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A Novel Physics Aware ANN-Based Framework for BSIM-CMG Model Parameter Extraction
Singhal, A., Pahwa, G. & Agarwal, H., 1 5月 2024, 於: IEEE Transactions on Electron Devices. 71, 5, p. 3307-3314 8 p.研究成果: Article › 同行評審
2 引文 斯高帕斯（Scopus） -
Compact Modeling and Experimental Validation of Reverse Mode Impact Ionization in LDMOS Transistors within the BSIM-BULK Framework
Zarkob, Y. H., Sharma, A., Pahwa, G., Nandi, D., Dabhi, C. K., Kubrak, V., Peddenpohl, B., Tang, M., Hu, C. & Chauhan, Y. S., 2024, IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024. Institute of Electrical and Electronics Engineers Inc., (IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024).研究成果: Conference contribution › 同行評審
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Compact Modeling of Impact Ionization and Conductivity Modulation in LDMOS Transistors
Sharma, A., Hayat Zarkob, Y., Pahwa, G., Kumar Dabhi, C., Goel, R., Agarwal, H., Kubrak, V., Tang, M., Treiber, M., Hu, C. & Singh Chauhan, Y., 1 7月 2024, 於: IEEE Transactions on Electron Devices. 71, 7, p. 4240-4246 7 p.研究成果: Article › 同行評審