每年專案
個人檔案
研究專長
積體電路測試、電子設計自動化、積體電路統計時序分析
經歷
2006/08~迄今 國立交通大學電子工程學系/電子研究所教授
教育/學術資格
PhD, 電機工程, University of California, Santa Barbara
外部位置
指紋
查看啟用 Mango Chia-Tso Chao 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
- 1 類似的個人檔案
過去五年中的合作和熱門研究領域
國家/地區層面的近期外部共同作業。按一下圓點深入探索詳細資料，或
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降低客退率之機器學習技術與自動化測試向量產生方法(II)
Chao, M.C.-T. (PI)
1/08/24 → 31/07/25
研究計畫: Other Government Ministry Institute
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基於強化學習之多層障礙物排除直角史坦納最小樹繞線器
Chao, M.C.-T. (PI)
1/08/23 → 31/07/24
研究計畫: Other Government Ministry Institute
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降低客退率之機器學習技術與自動化測試向量產生方法(II)
Chao, M.C.-T. (PI)
1/08/23 → 31/07/24
研究計畫: Other Government Ministry Institute
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降低客退率之機器學習技術與自動化測試向量產生方法(II)
Chao, M.C.-T. (PI)
1/08/22 → 31/07/23
研究計畫: Other Government Ministry Institute
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基於強化學習之多層障礙物排除直角史坦納最小樹繞線器
Chao, M.C.-T. (PI)
1/08/22 → 31/07/23
研究計畫: Other Government Ministry Institute
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Arbitrary-size Multi-layer OARSMT RL Router Trained with Combinatorial Monte-Carlo Tree Search
Chen, L. T., Kuo, H. R., Li, Y. L. & Chao, M. C. T., 7 11月 2024, Proceedings of the 61st ACM/IEEE Design Automation Conference, DAC 2024. Institute of Electrical and Electronics Engineers Inc., 218. (Proceedings - Design Automation Conference).研究成果: Conference contribution › 同行評審
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Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks
Yen, C. H., Wang, T. R., Liu, C. M., Yang, C. H., Chen, C. T., Chen, Y. Y., Lee, J. N., Kao, S. Y., Wu, K. C. & Chao, M. C. T., 2024, 於: IEEE Transactions on Semiconductor Manufacturing. 37, 3, p. 280-292 13 p.研究成果: Article › 同行評審
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IR-drop and Routing Congestion Aware PDN Refinement Framework for Timing Optimization
Chen, Y. G., Chang, H. H., Liang, Y. C., Chang, W. H., Tsai, I. C., Lin, C. W., Chang, Y. C. & Chao, M. C. T., 2024, Proceedings - International SoC Design Conference 2024, ISOCC 2024. Institute of Electrical and Electronics Engineers Inc., p. 133-134 2 p. (Proceedings - International SoC Design Conference 2024, ISOCC 2024).研究成果: Conference contribution › 同行評審
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Transformer and Its Variants for Identifying Good Dice in Bad Neighborhoods
Lu, C. C., Chang, C. C., Yen, C. H., Chang, S. W., Chu, Y. H., Wu, K. C. & Chao, M. C. T., 2024, Proceedings - 2024 IEEE 42nd VLSI Test Symposium, VTS 2024. IEEE Computer Society, (Proceedings of the IEEE VLSI Test Symposium).研究成果: Conference contribution › 同行評審
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Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant
Li, S. W., Yen, C. H., Chang, S. W., Chu, Y. H., Wu, K. C. & Chao, M. C. T., 2024, Proceedings - 2024 IEEE International Test Conference, ITC 2024. Institute of Electrical and Electronics Engineers Inc., p. 76-80 5 p. (Proceedings - International Test Conference).研究成果: Conference contribution › 同行評審