每年專案
個人檔案
研究專長
積體電路測試、電子設計自動化、積體電路統計時序分析
經歷
2006/08~迄今 國立交通大學電子工程學系/電子研究所教授
教育/學術資格
PhD, 電機工程, University of California, Santa Barbara
外部位置
指紋
查看啟用 Mango Chia-Tso Chao 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
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網路
國家/地區層面的近期外部共同作業。按一下圓點深入探索詳細資料，或
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A Reinforcement Learning Agent for Obstacle-Avoiding Rectilinear Steiner Tree Construction
Chen, P. Y., Ke, B. T., Lee, T. C., Tsai, I. C., Kung, T. W., Lin, L. Y., Liu, E. C., Chang, Y. C., Li, Y. L. & Chao, M. C. T., 13 4月 2022, ISPD 2022 - Proceedings of the 2022 International Symposium on Physical Design. Association for Computing Machinery, p. 107-115 9 p. (Proceedings of the International Symposium on Physical Design).研究成果: Conference contribution › 同行評審
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Improving Cell-Aware Test for Intra-Cell Short Defects
Lee, D. Z., Chen, Y. Y., Wu, K. C. & Chao, M. C. T., 2022, Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022. Bolchini, C., Verbauwhede, I. & Vatajelu, I. (編輯). Institute of Electrical and Electronics Engineers Inc., p. 436-441 6 p. (Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022).研究成果: Conference contribution › 同行評審
2 引文 斯高帕斯（Scopus） -
Path-Based Pre-Routing Timing Prediction for Modern Very Large-Scale Integration Designs
Chen, L. W., Sui, Y. N., Lee, T. C., Li, Y. L., Chao, M. C. T., Tsai, I. C., Kung, T. W., Liu, E. C. & Chang, Y. C., 2022, Proceedings of the 23rd International Symposium on Quality Electronic Design, ISQED 2022. IEEE Computer Society, (Proceedings - International Symposium on Quality Electronic Design, ISQED; 卷 2022-April).研究成果: Conference contribution › 同行評審
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Rule Generation for Classifying SLT Failed Parts
Hsu, H. C., Lu, C. C., Wang, S. W., Jones, K., Wu, K. C. & Chao, M. C. T., 2022, Proceedings - 2022 IEEE 40th VLSI Test Symposium, VTS 2022. IEEE Computer Society, (Proceedings of the IEEE VLSI Test Symposium; 卷 2022-April).研究成果: Conference contribution › 同行評審
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Test Methodology for Defect-Based Bridge Faults
Chang, S. W., Nien, Y. T., Hu, Y. P., Wu, K. C., Wang, C. C., Huang, F. S., Tang, Y. L., Chen, Y. C., Chen, M. C. & Chao, M. C. T., 2022, (Accepted/In press) 於: IEEE Transactions on Very Large Scale Integration (VLSI) Systems.研究成果: Article › 同行評審