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查看斯高帕斯 (Scopus) 概要
林 志忠
約聘研究員
電子物理學系
https://orcid.org/0000-0001-8640-3617
電話
03-5712121#31652
電子郵件
jjlin
nycu.edu
tw
h-index
h10-index
h5-index
3133
引文
30
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
337
引文
11
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
107
引文
5
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
1986 …
2024
每年研究成果
概覽
指紋
網路
計畫
(20)
研究成果
(157)
獎項
(2)
類似的個人檔案
(6)
指紋
查看啟用 Juhn-Jong Lin 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
排序方式
重量
按字母排序
Keyphrases
AuPd
21%
Composite System
15%
Conduction Process
11%
CoSi2
20%
Dephasing
35%
Dephasing Time
22%
Disordered Metals
23%
Elastic Mean Free Path
12%
Electrical Conductivity
18%
Electrical Transport
20%
Electron-electron Interaction
41%
Electron-electron Scattering
19%
Electron-phonon Interaction
19%
Electron-phonon Scattering
35%
Electron-phonon Scattering Rates
10%
Granular Metals
11%
High Temperature
11%
Impurities
15%
IrO2
22%
Law
19%
Liquid Helium Temperature
14%
Localization Studies
11%
Low Temperature
25%
Magnetic Field
12%
Magnetoresistance
42%
Nanowires
47%
Non-magnetic
12%
Quantum Interference
16%
Resistivity
68%
Room Temperature
10%
RuO2
29%
Scattering Time
34%
Superconducting Transition Temperature
19%
Superconductivity
19%
Temperature Effect
32%
Temperature Range
11%
Thermoelectric
24%
Thick Film
13%
Three-dimensional (3D)
27%
TiAl Alloy
14%
Transport Properties
14%
Tunnel Junction
11%
Two Dimensional
11%
Variable Range Hopping
11%
Volume Fraction
16%
Weak Localization
47%
Wide Temperature Range
17%
Wigner Solid
11%
Zn1-xMgxO
11%
ZnO Nanowires
14%
Material Science
Al2O3
5%
Annealing
10%
Carrier Concentration
15%
Charge Carrier
5%
Complex System
15%
Conductor
20%
Crystalline Material
24%
Density
9%
Dephasing
51%
Diffusivity
6%
Electrical Conductivity
6%
Electrical Resistivity
100%
Electron Transfer
8%
Ferromagnetism
14%
Film
69%
Graphene
9%
Heterojunction
8%
Indium
11%
Indium Tin Oxide
23%
Lithography
7%
Magnetoresistance
30%
Mechanical Strength
12%
Monolayers
5%
Nanocontact
5%
Nanocrystalline
5%
Nanocrystalline Material
6%
Nanowire
65%
Oxide Compound
11%
Oxide Film
14%
Oxygen Vacancy
7%
Percolation
19%
Physical Property
5%
Quantum Dot
5%
Silicon
8%
Single Crystal
5%
Superconducting Material
17%
Superconductivity
25%
Thermoelectrics
10%
Thick Films
16%
Thin Films
23%
Tin
5%
Volume Fraction
20%
X-Ray Diffraction
5%
ZnO
24%
