Gao, W., Nyein, H. Y. Y., Shahpar, Z.,
Tai, L. C., Wu, E., Bariya, M., Ota, H., Fahad, H. M., Chen, K. & Javey, A.,
31 1月 2017,
2016 IEEE International Electron Devices Meeting, IEDM 2016. Institute of Electrical and Electronics Engineers Inc.,
p. 6.6.1-6.6.4 7838363. (Technical Digest - International Electron Devices Meeting, IEDM).
研究成果: Conference contribution › 同行評審