郭 治群

研究成果

每年研究成果 1993 2003 2004 2006 2007 2008 2009 2010 2014 2017 2022 2022

• 37 Conference contribution
• 30 Article
• 7 Conference article
• 5 Paper
• 4 更多
  • 4 Patent

每年研究成果

每年研究成果

搜尋結果

• 2005

  A lossy substrate model for sub-100nm, super-100 GHz f_T RF CMOS noise extraction and modeling

  Guo, J-C. & Lin, Y. M., 15 11月 2005, 於: Digest of papers - IEEE Radio Frequency Integrated Circuits Symposium. p. 145-148 4 p., RMO2C-2.

  研究成果: Conference article › 同行評審

  • Substrates 100%
  • Thermal noise 74%
  • Scattering parameters 32%
  • Circuit simulation 32%
  • Frequency response 25%
  4 引文 斯高帕斯（Scopus）
• 2003

  A 90nm CMOS MS/RF based Foundry SOC Technology Comprising Superb 185 GHz f_T RFMOS and Versatile, high-Q Passive Components for Cost/Performance Optimization

  Chen, C. H., Chang, C. S., Chao, C. P., Kuan, J. F., Chang, C. L., Wang, S. H., Hsu, H. M., Lien, W. Y., Tsai, Y. C., Lin, H. C., Wu, C. C., Huang, C. F., Chen, S. M., Tseng, P. M., Chen, C. W., Ku, C. C., Lin, T. Y., Chang, C. F., Lin, H. J., Tsai, M. R., 及其他14Chen, S., Chen, C. F., Wei, M. Y., Wang, Y. J., Lin, J. C. H., Chen, W. M., Chang, C. C., King, M. C., Huang, C. M., Lin, C. T., Guo, J. C., Chern, G. J., Tang, D. D. & Sun, J. Y. C., 1 12月 2003, 於: Technical Digest - International Electron Devices Meeting. p. 39-42 4 p.

  研究成果: Conference article › 同行評審

  • Inductor 100%
  • MIM (semiconductors) 97%
  • Foundry 97%
  • foundries 90%
  • Foundries 78%
  32 引文 斯高帕斯（Scopus）

• Low-K/Cu CMOS Logic Based SoC Technology for 10Gb Transceiver with 115GHz f_T, 80GHz f_MAX RF CMOS, High-Q MiM Capacitor and Spiral Cu Inductor

  Guo, J. C., Lien, W. Y., Hung, M. C., Liu, C. C., Chen, C. W., Wu, C. M., Sun, Y. C. & Yang, P., 1 10月 2003, 於: Digest of Technical Papers - Symposium on VLSI Technology. p. 39-40 2 p.

  研究成果: Conference article › 同行評審

  • Varactors 100%
  • Foundries 92%
  • Variable frequency oscillators 90%
  • System-on-chip 82%
  • Transceivers 76%
  17 引文 斯高帕斯（Scopus）

• The Integration of Proton Bombardment Process into the manufacturing of Mixed-signal/RF Chips

  Tang, D. D., Lin, W. C., Lai, L. S., Wang, C. H., Lee, L. P., Hsu, H. M., Wu, C. M., Chang, C. W., Lien, W. Y., Chao, C. P., Lee, C. Y., Chern, G. J., Guo, J-C., Chang, C. S., Sun, Y. C., Du, D. S., Lan, K. C. & Lin, L. F., 1 12月 2003, 於: Technical Digest - International Electron Devices Meeting. p. 673-676 4 p.

  研究成果: Conference article › 同行評審

  • Inductor 100%
  • Protons 82%
  • Masks 65%
  • bombardment 64%
  • manufacturing 57%
  5 引文 斯高帕斯（Scopus）
• 1997

  Characterization of bitline stress effects on flash cell after program/erase cycle

  Liu, Y. C., Guo, J-C., Chang, K. L., Huang, C. I., Wang, M. T., Chang, A. & Shone, F., 1 1月 1997, 於: Annual Proceedings - Reliability Physics (Symposium). p. 97-103 7 p.

  研究成果: Conference article › 同行評審

  • Hole traps 100%
  • Oxides 86%
  • Interface states 77%
  • Flash memory 60%
  • Degradation 35%
  1 引文 斯高帕斯（Scopus）
• 1996

  Mechanisms and characteristics of oxide charge detrapping in n-MOSFET's

  Wang, T-H., Chang, T. E., Chiang, L. P., Huang, C. & Guo, J-C., 1 1月 1996, 於: Digest of Technical Papers - Symposium on VLSI Technology. p. 232-233 2 p.

  研究成果: Conference article › 同行評審

  • Oxides 100%
  • Electrons 78%
  • Hot carriers 51%
  • Analytical models 33%
  3 引文 斯高帕斯（Scopus）
• 1995

  Direct observation of the lateral nonuniform channel doping profile in submicron MOSFET's from an anomalous charge pumping measurement results

  Chung, S. S., Cheng, S. M., Lee, G. H. & Guo, J-C., 1 12月 1995, 於: Digest of Technical Papers - Symposium on VLSI Technology. p. 103-104 2 p.

  研究成果: Conference article › 同行評審

  • Semiconductor doping 100%
  • Doping (additives) 18%
  • Threshold voltage 18%
  • Defects 11%
  5 引文 斯高帕斯（Scopus）