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查看斯高帕斯 (Scopus) 概要
莊 振益
約聘研究員
電子物理學系
https://orcid.org/0000-0002-8654-9015
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4323
引文
31
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按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
1524
引文
20
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
395
引文
10
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
1986 …
2024
每年研究成果
概覽
指紋
網路
計畫
(19)
研究成果
(299)
類似的個人檔案
(6)
指紋
查看啟用 Jenh-Yih Juang 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
排序方式
重量
按字母排序
Material Science
Thin Films
100%
Film
89%
Single Crystal
21%
Pulsed Laser Deposition
21%
Density
20%
Superconducting Film
17%
Nanoindentation
16%
Surface (Surface Science)
16%
ZnO
16%
X-Ray Diffraction
15%
Reflectivity
14%
Superconducting Material
13%
Anisotropy
12%
Annealing
12%
Solar Cell
10%
Multiferroic Material
10%
Energy Levels
10%
Magnetic Property
9%
Transmission Electron Microscopy
9%
Physical Property
9%
Resonator
9%
Electrical Resistivity
8%
Bismuth Ferrite
7%
Magnesium Oxide
6%
Young's Modulus
6%
Heterojunction
6%
Indentation
6%
X-Ray Absorption Spectroscopy
6%
Zinc Oxide
6%
Superconductivity
5%
Titanium Dioxide
5%
Oxide Compound
5%
Sapphire
5%
Epitaxy
5%
Nanostructure
5%
Photoluminescence
5%
Magnetism
5%
Keyphrases
Pulsed Laser Deposition
24%
YBa2Cu3O7
20%
Temperature Effect
19%
Superconducting Thin Films
17%
Ultrafast Pump-probe Spectroscopy
15%
Nanoindentation
15%
Single Crystal
14%
Nanomechanical Properties
14%
In Situ
12%
SrTiO3
12%
Ultrafast Dynamics
11%
Transient Reflectivity
11%
C-axis
11%
Orthorhombic
10%
LaAlO3
10%
Structural Properties
10%
Magnetic Properties
9%
Annealing
9%
X-ray Absorption Spectroscopy
9%
Low Temperature
9%
Young's Modulus
8%
YBa2Cu3O7-δ Thin Film
8%
Epitaxial
8%
HoMnO3
8%
Physical Properties
8%
Quasiparticles
7%
CoFe2O4
7%
Room Temperature
7%
X Ray Diffraction
7%
Pop-in
7%
Transport Properties
7%
Deformation Behavior
7%
Photoinduced
7%
Multiferroics
6%
Critical Current Density
6%
Si Substrate
6%
Oxygen Deficiency
6%
Post-annealing
6%
Cross-sectional Transmission Electron Microscopy
6%
Antiferromagnetic Order
6%
Reflection High-energy Electron Diffraction
6%
Oxygen Content
6%
Resistivity
6%
BiFeO3
6%
Nanostructures
6%
Atomic Force Microscopy
5%
Electronic Structure
5%
Cu(In,Ga)Se2
5%
Angle-dispersive Diffraction
5%
Oscillation
5%
Engineering
Thin Films
75%
Pulsed Laser
21%
Ray Diffraction
14%
Reflectance
10%
Ray Absorption
9%
Transients
9%
Young's Modulus
8%
Deposited Film
7%
Electronic State
7%
Temperature Dependence
6%
Energy Levels
6%
Deformation Behavior
6%
Resonator
6%
Room Temperature
6%
Low-Temperature
6%
Indentation
6%
Atomic Force Microscopy
6%
Nanopillar
6%
Si Substrate
5%
Field Emission
5%
Load Displacement Curve
5%
Anisotropic
5%
Penetration Depth
5%
