搜尋結果
2013
Charge trapping
100%
Dielectric Film
93%
Nanowires
78%
Polysilicon
73%
Dielectric Material
56%
Chen, K. M. ,
Tsai, T. I. ,
Lin, T. Y. ,
Lin, H-C. ,
Chao, T-S. ,
Huang, G. W. &
Huang, T. Y. ,
12 7月 2013 ,
於: IEEE Electron Device Letters. 34 ,
8 ,
p. 1020-1022 3 p. , 6553156.
研究成果: Article › 同行評審
Thin film transistors
100%
Polysilicon
90%
Polycrystalline Solid
69%
Transconductance
40%
Length
31%
Lin, H-C. ,
Lin, C. I. ,
Lin, Z. M. ,
Shie, B. S. &
Huang, T. Y. ,
5 2月 2013 ,
於: IEEE Transactions on Electron Devices. 60 ,
3 ,
p. 1142-1148 7 p. , 6428639.
研究成果: Article › 同行評審
Charge density
100%
Thin film transistors
90%
Polysilicon
81%
Charge Density
68%
Doping (additives)
39%
Zhong, C. W. ,
Tzeng, W. H. ,
Liu, K. C. ,
Lin, H-C. ,
Chang, K-M. ,
Chan, Y. C. ,
Kuo, C. C. ,
Chen, P. S. ,
Lee, H. Y. ,
Chen, F. &
Tsai, M. J. ,
25 9月 2013 ,
於: Surface and Coatings Technology. 231 ,
p. 563-566 4 p. 研究成果: Article › 同行評審
RRAM
100%
Tin oxides
98%
Indium
92%
indium oxides
70%
tin oxides
68%
Thin film transistors
100%
Fabrication
57%
Length
46%
Field Effect
25%
Oxides
22%
Lee, K. H. ,
Tsai, J. R. ,
Chang, R. D. ,
Lin, H-C. &
Huang, T. Y. ,
7 10月 2013 ,
於: Applied Physics Letters. 103 ,
15 , 153102.
研究成果: Article › 同行評審
programming
100%
floating
85%
low voltage
84%
nanowires
69%
high speed
65%
Nanowires
100%
Polysilicon
93%
Field effect transistors
86%
Field Effect
80%
Nanowire
69%
Chen, K. M. ,
Chen, B. Y. ,
Chiu, C. S. ,
Huang, G. W. ,
Chen, C. H. ,
Lin, H-C. ,
Huang, T. Y. ,
Chen, M. Y. ,
Yang, Y. C. ,
Jaw, B. &
Wang, K. L. ,
29 7月 2013 ,
於: IEEE Electron Device Letters. 34 ,
9 ,
p. 1085-1087 3 p. , 6566056.
研究成果: Article › 同行評審
MOS devices
100%
Oxide semiconductors
85%
Cutoff frequency
83%
Transistors
61%
Metals
46%
2012
Su, C. J. ,
Su, T. K. ,
Tsai, T. I. ,
Lin, H-C. &
Huang, T. Y. ,
8 3月 2012 ,
於: Nanoscale Research Letters. 7 ,
p. 1-9 9 p. , 162.
研究成果: Article › 同行評審
Nanowires
100%
Polysilicon
93%
Polycrystalline Solid
72%
Nanowire
69%
nanowires
64%
Lin, Z. M. ,
Lin, H-C. ,
Liu, K. M. &
Huang, T. Y. ,
1 2月 2012 ,
於: Japanese Journal of Applied Physics. 51 ,
2 PART 2 , 02BC14.
研究成果: Article › 同行評審
Threshold voltage
100%
threshold voltage
86%
Transistors
77%
Analytical models
77%
transistors
72%
Kuo, C. H. ,
Lin, H-C. ,
Lee, I. C. ,
Cheng, H-C. &
Huang, T. Y. ,
8 5月 2012 ,
於: IEEE Electron Device Letters. 33 ,
6 ,
p. 833-835 3 p. , 6193120.
研究成果: Article › 同行評審
Nanowires
100%
Oxide semiconductors
95%
Polysilicon
93%
Field effect transistors
86%
Field Effect
80%
Transistors
100%
transistors
93%
MOSFET devices
34%
Leakage currents
31%
Thin films
27%
Thin film transistors
100%
Polysilicon
90%
Carrier concentration
27%
Time
14%
Thin film transistors
100%
Nanowires
97%
Polysilicon
90%
Crystallization
85%
Recrystallization
79%
Tsai, T. I. ,
Chen, K. M. ,
Lin, H-C. ,
Lin, T. Y. ,
Su, C. J. ,
Chao, T-S. &
Huang, T. Y. ,
21 9月 2012 ,
於: IEEE Electron Device Letters. 33 ,
11 ,
p. 1565-1567 3 p. , 6302168.
研究成果: Article › 同行評審
Thin film transistors
100%
Polysilicon
90%
Drain Current
60%
Electric potential
40%
Drain current
33%
Su, C. J. ,
Tsai, T. I. ,
Lin, H-C. ,
Huang, T. Y. &
Chao, T-S. ,
24 7月 2012 ,
於: Nanoscale Research Letters. 7 ,
p. 1-14 14 p. 研究成果: Article › 同行評審
Nanowires
100%
Polysilicon
93%
Aluminum oxide
77%
Nanowire
69%
nanowires
64%
Nanocrystals
100%
Thin film transistors
85%
Nanowires
82%
Nitrides
80%
Polysilicon
77%
Electric properties
100%
Crystalline materials
98%
Electrical Property
78%
Amorphous Material
65%
Flow Kinetics
57%
Tzeng, W. H. ,
Zhong, C. W. ,
Liu, K. C. ,
Chang, K-M. ,
Lin, H-C. ,
Chan, Y. C. ,
Kuo, C. C. ,
Tsai, F. Y. ,
Tseng, M. H. ,
Chen, P. S. ,
Lee, H. Y. ,
Chen, F. &
Tsai, M. J. ,
1 2月 2012 ,
於: Thin Solid Films. 520 ,
8 ,
p. 3415-3418 4 p. 研究成果: Article › 同行評審
Tin oxides
100%
Indium
94%
indium oxides
71%
tin oxides
69%
Thin films
68%
2011
García-Sánchez, F. J. ,
Latorre-Rey, A. D. ,
Liu, W. ,
Chen, W. C. ,
Lin, H-C. ,
Liou, J. J. ,
Muci, J. &
Ortiz-Conde, A. ,
1 9月 2011 ,
於: Solid-State Electronics. 63 ,
1 ,
p. 22-26 5 p. 研究成果: Article › 同行評審
Nanowires
100%
Polysilicon
93%
Polycrystalline Solid
72%
Nanowire
69%
nanowires
64%
Kuo, C. H. ,
Hsu, C. W. ,
Lin, H-C. &
Huang, T. Y. ,
1 7月 2011 ,
於: Micro and Nano Letters. 6 ,
7 ,
p. 543-545 3 p. 研究成果: Article › 同行評審
Thin film transistors
100%
Nanowires
97%
Nanowire
67%
nanowires
63%
transistors
62%
Lin, H-C. ,
Tsai, T. I. ,
Chao, T-S. ,
Jian, M. F. &
Huang, T. Y. ,
1 1月 2011 ,
於: Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 29 ,
2 , 021007.
研究成果: Article › 同行評審
MOSFET devices
100%
Polysilicon
98%
metal oxide semiconductors
87%
Field Effect
85%
Polycrystalline Solid
76%
Su, C. J. ,
Tsai, T. I. ,
Liou, Y. L. ,
Lin, Z. M. ,
Lin, H-C. &
Chao, T-S. ,
1 4月 2011 ,
於: IEEE Electron Device Letters. 32 ,
4 ,
p. 521-523 3 p. , 5716662.
研究成果: Article › 同行評審
Nanowires
100%
Polysilicon
93%
Polycrystalline Solid
72%
Nanowire
69%
Transistors
68%
Hsu, H. H. ,
Lin, H-C. ,
Luo, C. W. ,
Su, C. J. &
Huang, T. Y. ,
1 3月 2011 ,
於: IEEE Transactions on Electron Devices. 58 ,
3 ,
p. 641-649 9 p. , 5699915.
研究成果: Article › 同行評審
Silicon oxides
100%
Nanowires
85%
Nitrides
83%
Polysilicon
79%
Nanowire
59%
Luo, C. W. ,
Lin, H-C. ,
Lee, K. H. ,
Chen, W. C. ,
Hsu, H. H. &
Huang, T. Y. ,
1 7月 2011 ,
於: IEEE Transactions on Electron Devices. 58 ,
7 ,
p. 1879-1885 7 p. , 5756229.
研究成果: Article › 同行評審
Nanocrystals
100%
Nitrides
80%
Polysilicon
77%
Nitride
64%
Nanocrystal
54%
Thin film transistors
100%
Nanowires
97%
Polysilicon
90%
programming
75%
Oxides
67%
Nanowires
100%
Polysilicon
93%
Nanowire
69%
Dopamine
11%
Data storage equipment
8%
Lin, H-C. ,
Lin, Z. M. ,
Chen, W. C. &
Huang, T. Y. ,
1 11月 2011 ,
於: IEEE Transactions on Electron Devices. 58 ,
11 ,
p. 3771-3777 7 p. , 6017198.
研究成果: Article › 同行評審
Nanowires
100%
Polysilicon
93%
Nanowire
69%
Oxides
69%
Nitrides
58%
2010
Weng, W. T. ,
Lee, Y. J. ,
Lin, H-C. &
Huang, T. Y. ,
1 4月 2010 ,
於: Solid-State Electronics. 54 ,
4 ,
p. 368-377 10 p. 研究成果: Article › 同行評審
Oxide semiconductors
100%
Field Effect
83%
Plasmas
77%
CMOS
75%
Dielectric Material
74%
Tsai, T. I. ,
Lin, H-C. ,
Jian, M. F. ,
Huang, T. Y. &
Chao, T-S. ,
1 5月 2010 ,
於: Microelectronics Reliability. 50 ,
5 ,
p. 584-588 5 p. 研究成果: Article › 同行評審
Field Effect
100%
MOSFET devices
58%
Polysilicon
58%
Lithography
54%
Electron Particle
54%
Chen, W. C. ,
Lin, H-C. ,
Lin, Z. M. ,
Hsu, C. T. &
Huang, T. Y. ,
29 10月 2010 ,
於: Nanotechnology. 21 ,
43 , 435201.
研究成果: Article › 同行評審
Ion implantation
100%
Thin film transistors
94%
Transport properties
93%
Nanowires
91%
Polysilicon
85%
Wang, B. M. ,
Yang, T. M. ,
Wu, Y-C. ,
Su, C. J. &
Lin, H-C. ,
1 11月 2010 ,
於: Materials Chemistry and Physics. 124 ,
1 ,
p. 880-883 4 p. 研究成果: Article › 同行評審
Thin film transistors
100%
Nanowires
97%
Polysilicon
90%
Crystallization
85%
Nickel
72%
Lin, Z. M. ,
Lin, H-C. ,
Chen, W. C. &
Huang, T. Y. ,
1 3月 2010 ,
於: Applied Physics Letters. 96 ,
7 , 072108.
研究成果: Article › 同行評審
transistors
100%
augmentation
76%
silicon
67%
thin films
64%
performance
55%
Chen, W. C. ,
Lin, H-C. ,
Chang, Y. C. ,
Lin, C. D. &
Huang, T. Y. ,
1 7月 2010 ,
於: IEEE Transactions on Electron Devices. 57 ,
7 ,
p. 1608-1615 8 p. , 5471146.
研究成果: Article › 同行評審
Nanowires
100%
Polysilicon
93%
Nanowire
69%
Transistors
68%
Implanted Ion
38%
Lin, H-C. ,
Kuo, C. H. ,
Li, G. J. ,
Su, C. J. &
Huang, T. Y. ,
1 5月 2010 ,
於: IEEE Electron Device Letters. 31 ,
5 ,
p. 384-386 3 p. , 5437292.
研究成果: Article › 同行評審
Nanowires
100%
Nanowire
69%
Polysilicon
62%
Wet etching
37%
Etching
28%
Nanowires
100%
Polysilicon
93%
Nanowire
69%
Compound Mobility
30%
Ortiz-Conde, A. ,
Latorre Rey, A. D. ,
Liu, W. ,
Chen, W. C. ,
Lin, H-C. ,
Liou, J. J. ,
Muci, J. &
García-Sánchez, F. J. ,
1 6月 2010 ,
於: Solid-State Electronics. 54 ,
6 ,
p. 635-641 7 p. 研究成果: Article › 同行評審
Current voltage characteristics
100%
Parameter extraction
95%
Nanowires
93%
Polysilicon
87%
Threshold voltage
82%
Lin, H-C. ,
Liu, T. W. ,
Hsu, H. H. ,
Lin, C. D. &
Huang, T. Y. ,
1 5月 2010 ,
於: IEEE Transactions on Nanotechnology. 9 ,
3 ,
p. 386-391 6 p. , 5223592.
研究成果: Article › 同行評審
Nanowires
100%
Polysilicon
93%
Gate dielectrics
28%
Thin film transistors
25%
Data storage equipment
24%
2009
Hot carriers
100%
Thin film transistors
95%
Polysilicon
86%
Degradation
52%
Energy
35%
Chen, W. C. ,
Lin, H-C. ,
Chang, Y. C. &
Huang, T. Y. ,
12 10月 2009 ,
於: Applied Physics Letters. 95 ,
13 , 133502.
研究成果: Article › 同行評審
programming
100%
configurations
92%
oxides
53%
nitrides
40%
film thickness
35%
Weng, W. T. ,
Lee, Y. J. ,
Lin, H-C. &
Huang, T. Y. ,
1 12月 2009 ,
於: Japanese Journal of Applied Physics. 48 ,
8 Part 1 ,
p. 860011-860017 7 p. 研究成果: Article › 同行評審
MOSFET devices
100%
metal oxide semiconductors
87%
Plasmas
78%
capacitors
74%
radio frequencies
73%
Liu, W. ,
Liou, J. J. ,
Chung, A. ,
Jeong, Y. H. ,
Chen, W. C. &
Lin, H-C. ,
24 7月 2009 ,
於: IEEE Electron Device Letters. 30 ,
9 ,
p. 969-971 3 p. 研究成果: Article › 同行評審
Electrostatic Discharge
100%
Electrostatic discharge
83%
Nanowires
79%
Field effect transistors
68%
Field Effect
63%
MOSFET devices
100%
Dangling bonds
77%
Passivation
51%
Tensile stress
42%
Hydrogen
34%
Hsiao, C. Y. ,
Lin, C. H. ,
Hung, C. H. ,
Su, C. J. ,
Lo, Y. R. ,
Lee, C. C. ,
Lin, H-C. ,
Ko, F-H. ,
Huang, T. Y. &
Yang, Y-S. ,
1 1月 2009 ,
於: Biosensors and Bioelectronics. 24 ,
5 ,
p. 1223-1229 7 p. 研究成果: Article › 同行評審
Nanowires
100%
Silicon
74%
Field effect transistors
65%
Field Effect
60%
Nanowire
53%
Lin, H-C. ,
Hung, C. H. ,
Chen, W. C. ,
Lin, Z. M. ,
Hsu, H. H. &
Hunag, T. Y. ,
24 3月 2009 ,
於: Journal of Applied Physics. 105 ,
5 , 054502.
研究成果: Article › 同行評審
transistors
100%
hysteresis
97%
electric potential
67%
silicon
67%
thin films
64%
Lin, H-C. ,
Chen, W. C. ,
Huang, T. Y. &
Lin, C. D. ,
30 4月 2009 ,
於: IEEE Electron Device Letters. 30 ,
6 ,
p. 644-646 3 p. 研究成果: Article › 同行評審
Nanowires
100%
Polysilicon
93%
Polycrystalline Solid
72%
Nanowire
69%
Transistors
68%
Lee, K. H. ,
Hsu, H. H. ,
Lin, H-C. &
Huang, T. Y. ,
1 2月 2009 ,
於: Japanese journal of applied physics. 48 ,
2 , 021203.
研究成果: Article › 同行評審
Thin film transistors
100%
Nanowires
97%
Passivation
94%
Polysilicon
90%
nanowires
63%
Oxide semiconductors
100%
Plasmas
77%
CMOS
75%
damage
60%
Transistors
57%
Lin, C. H. ,
Hung, C. H. ,
Hsiao, C. Y. ,
Lin, H-C. ,
Ko, F-H. &
Yang, Y-S. ,
15 6月 2009 ,
於: Biosensors and Bioelectronics. 24 ,
10 ,
p. 3019-3024 6 p. 研究成果: Article › 同行評審
Nanowires
100%
Influenza in Birds
75%
Silicon
74%
Field effect transistors
65%
DNA
63%
Hsu, H. H. ,
Lin, H-C. ,
Chan, L. &
Huang, T. Y. ,
24 2月 2009 ,
於: IEEE Electron Device Letters. 30 ,
3 ,
p. 243-245 3 p. 研究成果: Article › 同行評審
Nanowires
100%
Polysilicon
93%
Threshold voltage
88%
Field effect transistors
86%
Field Effect
80%