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查看斯高帕斯 (Scopus) 概要
洪 浩喬
教授
電機工程學系
https://orcid.org/0000-0003-0757-1001
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h10-index
h5-index
635
引文
12
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
209
引文
8
h-指數
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64
引文
5
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
1900 …
2025
每年研究成果
概覽
指紋
網路
計畫
(26)
研究成果
(106)
獎項
(24)
活動
(1)
類似的個人檔案
(1)
指紋
查看啟用 Hao-Chiao Hong 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
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重量
按字母排序
Keyphrases
Built-in-self-test (BiST)
85%
Testability
60%
Measurement Results
44%
Analog-to-digital Converter
41%
Printed Circuit Board Technology
37%
CMOS-MEMS
34%
Microelectromechanical Systems (MEMS) Accelerometer
34%
On chip
33%
Switched Capacitor
33%
Fully Integrated
31%
Linear Behavior
30%
SAR ADC
29%
Circuitry
29%
Output Frequency
29%
Fitting Method
28%
Electromagnetic Energy Harvester
26%
Dynamic Range
25%
Circuit Testing
24%
Capacitors
24%
Accelerometer
24%
Rigid-flexible
24%
Flex Printed Circuit Board
24%
CMOS Process
23%
LC Oscillator
23%
Transfer Function
22%
90-nm CMOS Technology
22%
Biquad
22%
Calibration Scheme
22%
Demodulator
22%
Wafer Acceptance Test
22%
In-memory
22%
8T SRAM
22%
Nonlinearity
21%
Sine Wave Fitting
21%
Parametric Faults
20%
Analog Fault Simulation
19%
Signal-to-noise-and-distortion Ratio
19%
Extractor
19%
Process Variation
19%
Design for Testability
19%
Test Accuracy
18%
Bitstream
18%
Device Testing
18%
At-speed Test
18%
Decorrelating
17%
Harvester
17%
Micro-electro-mechanical Systems
17%
Pressure Sensor
16%
Operational Amplifier
15%
Digital-to-analog Converter
15%
Engineering
Built-in Self Test
100%
Testability
84%
Microelectromechanical System
79%
Analog-to-Digital Converter
57%
Oscillator
52%
Experimental Result
43%
Dynamic Range
42%
Harvester
29%
Printed Circuit Board
29%
Simulation Result
28%
Linear Behavior
26%
Switched Capacitor
25%
Transfer Function
24%
Fault Model
24%
Bitstream
23%
Amplifier
22%
Demodulator
22%
Acceptance Tests
22%
Pressure Sensor
22%
Process Variation
20%
Nonlinearity
19%
Extractor
19%
Fitting Procedure
18%
Test Circuit
18%
Comparator
18%
Capacitive
17%
Circuit Design
17%
Phase Locked Loop
17%
Signal-to-Noise Ratio
16%
Analog Circuit
16%
Active Area
15%
Digital-to-Analog Converter
15%
Successive Approximation
14%
Output Response
14%
Micro-Electro-Mechanical System
14%
Interferometry
14%
Complementary Metal-Oxide-Semiconductor
14%
Current Output
14%
Internet-Of-Things
14%
Synthetic Aperture Radar
14%
Integrated Circuit
14%
Energy Efficiency
14%
Energy Conservation
14%
Data Converter
14%
Phase-Shift Keying
14%
Test Procedure
14%
Hardware Overhead
13%
Operational Amplifier
12%
Frequency Response
12%
Electric Power Utilization
12%
