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查看斯高帕斯 (Scopus) 概要
柯 富祥
教授
材料科學與工程學系
https://orcid.org/0000-0001-6464-1737
h-index
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h5-index
4786
引文
38
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1113
引文
20
h-指數
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316
引文
10
h-指數
按照存儲在普爾(Pure)的出版物數量及斯高帕斯(Scopus)引文計算。
1996 …
2024
每年研究成果
概覽
指紋
網路
計畫
(30)
研究成果
(288)
類似的個人檔案
(6)
指紋
查看啟用 Fu-Hsiang Ko 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
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重量
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Material Science
Annealing
16%
Capacitor
21%
Carbon Nanotube
8%
Charge Trapping
8%
Composite Material
8%
Copolymer
14%
Density
38%
Diamond
8%
Dielectric Material
45%
Field Effect Transistor
15%
Film
100%
Gold Nanoparticle
35%
Hafnium
10%
Hydrogel
8%
Hydrogen Bonding
8%
Hydrogen Peroxide
9%
Lithography
90%
Nanoparticle
41%
Nanostructure
16%
Nanowire
29%
Nitride Compound
13%
Optical Property
9%
Oxide Compound
31%
Oxide Film
10%
Permittivity
25%
Polyimide
13%
Polystyrene
8%
Radioactive Tracer
12%
Scanning Electron Microscopy
10%
Self Assembly
15%
Silicate
9%
Silicide
8%
Silicon
80%
Silicon Dioxide
12%
Silicon Nitride
17%
Silicon Wafer
8%
Silver
16%
Silver Nanoparticle
12%
Sol-Gel
33%
Solar Cell
8%
Spin Coating
19%
Surface (Surface Science)
54%
Thermal Stability
20%
Thin Films
25%
Thin-Film Transistor
39%
Titanium Dioxide
8%
Zinc Oxide
19%
Zirconia
12%
Zirconium
8%
ZnO
11%
Keyphrases
Annealing
9%
Antireflection Coating
24%
ArF Lithography
21%
Au Nanoparticles (AuNPs)
25%
Baking Temperature
12%
Bio-inspired
12%
Bottom Anti-reflective Coating
39%
Coating Layer
17%
Coating Structure
18%
Contact Holes
10%
Deep Ultraviolet
15%
Electrical Properties
16%
Electron Beam
12%
Electron Beam Lithography
22%
Fabry-Perot
12%
Gate Dielectric
17%
Gold Nanoparticles
33%
Hafnium Silicate
9%
High Performance
10%
KrF Lithography
10%
Limit of Detection
15%
Lithography
13%
Low Dielectric Constant
12%
Metal-insulator-metal Capacitor
13%
Metallic Impurities
12%
Microwave Digestion
14%
Microwave Heating
13%
Nanocrystal Memory
10%
Nanogap Electrodes
10%
Nanoparticles
13%
Optical Lithography
15%
Optical Properties
12%
Organic Thin-film Transistors
12%
Oxygen Plasma
12%
Photocurrent
9%
Photodetector
11%
Photoresist
19%
Polysilicon
15%
Silica
13%
Silicon Nanowire Field-effect Transistor (SNWFET)
9%
Silicon Substrate
9%
Silver Nanoparticles
9%
Silver Nanorods
10%
Sol-gel
23%
Sol-gel Spin Coating
14%
Substrate Type
10%
Thermal Stability
10%
Thin-film Transistors
20%
Zinc Oxide
9%
Zinc Oxide Thin Films
9%