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查看斯高帕斯 (Scopus) 概要
柯 富祥
教授
奈米科學及工程學士學位學程
https://orcid.org/0000-0001-6464-1737
電話
03-5712121#55803
電子郵件
fhko
nycu.edu
tw
網站
https://kolab-nycumse41.webnode.com/
h-index
h10-index
h5-index
4757
引文
38
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
1098
引文
20
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
304
引文
10
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
1996 …
2024
每年研究成果
概覽
指紋
網路
計畫
(30)
研究成果
(288)
類似的個人檔案
(6)
指紋
查看啟用 Fu-Hsiang Ko 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
排序方式
重量
按字母排序
Material Science
Film
100%
Lithography
90%
Silicon
79%
Dielectric Material
45%
Nanoparticle
41%
Thin-Film Transistor
39%
Nanocrystalline Material
37%
Density
36%
Gold Nanoparticle
35%
Sol-Gel
33%
Oxide Compound
31%
Nanowire
29%
Thin Films
25%
Permittivity
25%
Capacitor
23%
Thermal Stability
20%
Zinc Oxide
19%
Spin Coating
19%
Silicon Nitride
17%
Silver
16%
Self Assembly
15%
Annealing
15%
Field Effect Transistor
15%
Copolymer
14%
Nitride Compound
14%
Polyimide
13%
Silver Nanoparticle
12%
Zirconia
12%
Radioactive Tracer
12%
Silicon Dioxide
12%
ZnO
11%
Hafnium
10%
Oxide Film
10%
Scanning Electron Microscopy
10%
Optical Property
9%
Silicate
9%
Hydrogen Peroxide
9%
Silicon Wafer
8%
Titanium Dioxide
8%
Solar Cell
8%
Composite Material
8%
Carbon Nanotube
8%
Diamond
8%
Hydrogel
8%
Silicide
8%
Polystyrene
8%
Hydrogen Bonding
8%
Charge Trapping
8%
Inductively Coupled Plasma Mass Spectrometry
8%
Transistor
7%
Keyphrases
Bottom Anti-reflective Coating
39%
Gold Nanoparticles
33%
Au Nanoparticles (AuNPs)
24%
Antireflection Coating
24%
Sol-gel
23%
Electron Beam Lithography
22%
ArF Lithography
21%
Thin-film Transistors
20%
Photoresist
19%
Coating Structure
18%
Gate Dielectric
17%
Coating Layer
17%
Electrical Properties
16%
Polysilicon
15%
Limit of Detection
15%
Deep Ultraviolet
15%
Optical Lithography
15%
Microwave Digestion
14%
Sol-gel Spin Coating
14%
Nanoparticles
13%
Silica
13%
Metal-insulator-metal Capacitor
13%
Lithography
13%
Microwave Heating
13%
Oxygen Plasma
12%
Metallic Impurities
12%
Electron Beam
12%
Bio-inspired
12%
Fabry-Perot
12%
Organic Thin-film Transistors
12%
Baking Temperature
12%
Low Dielectric Constant
12%
Optical Properties
12%
Photodetector
11%
Contact Holes
10%
KrF Lithography
10%
Thermal Stability
10%
Substrate Type
10%
High Performance
10%
Nanocrystal Memory
10%
Nanogap Electrodes
10%
Silver Nanorods
10%
Zinc Oxide
9%
Photocurrent
9%
Hafnium Silicate
9%
Silicon Substrate
9%
Zinc Oxide Thin Films
9%
Silicon Nanowire Field-effect Transistor (SNWFET)
9%
Annealing
9%
Silver Nanoparticles
9%
Engineering
Nanowires
29%
Nanoparticle
20%
Field-Effect Transistor
17%
Gold Nanoparticle
15%
Electron Optical Lithography
15%
Thin-Film Transistor
14%
Lithography
12%
Reflectance
10%
Dielectrics
10%
Energy Engineering
9%
Conversion Efficiency
9%
Photodetector
9%
Fabry Perot
9%
Coating Structure
8%
One Step
8%
Thin Films
8%
Biosensing
8%
Core-Shell
8%
Extreme-Ultraviolet Lithography
8%
Biosensor
8%
Photocurrent
7%
Nanopillar
7%
Plasma Treatment
6%
Solar Cell
6%
Low-Temperature
6%
Resistive
6%
Interfacial Layer
6%
Electrical Performance
5%
Photoresist
5%
Metal-Insulator-Metal
5%
Rapid Thermal Annealing
5%
Gate Dielectric
5%
