Chun-Yu Lin

每年研究成果

PhD, 電子研究所, 國立陽明交通大學

指紋

查看啟用 Chun-Yu Lin 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。

2xVDD-Tolerant ESD Clamp with Dual Detection and Ultra-Low Leakage
Chen, K. Y., Wu, S. H., Chen, P. X. & Lin, C. Y., 2026, 於: IEEE Journal of the Electron Devices Society. 14, p. 205-212 8 p.
研究成果: Article › 同行評審

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A Co-Designed ESD Protection and Bypass Circuit for Wideband High-Speed TIA
Chien, E. W. & Lin, C. Y., 2026, (Accepted/In press) 於: IEEE Microwave and Wireless Technology Letters.
研究成果: Article › 同行評審
A Low-Capacitance BEOL Structure for Robust ESD Protection in FinFET Technology
Liang, C. Y., Lin, C. Y. & Ker, M. D., 1 8月 2026, 於: IEEE Transactions on Electron Devices. 73, 8, p. 4971-4978 8 p.
研究成果: Article › 同行評審
Bidirectional Gate-to-Source ESD Protection Design with Adjustable Turn-on Voltage and Dual-Gate Layout for GaN-on-Silicon Power HEMT
Ker, C. C., Lin, C. Y. & Ker, M. D., 2026, (Accepted/In press) 於: IEEE Transactions on Device and Materials Reliability.
研究成果: Article › 同行評審
Compact Inverter-Triggered SCR for ESD Protection in Broadband Communication Circuits
Lee, H. Y., Cheng, H. E. & Lin, C. Y., 2026, ISCAS 2026 - 2026 IEEE International Symposium on Circuits and Systems. Institute of Electrical and Electronics Engineers Inc., p. 1764-1768 5 p. (Proceedings - IEEE International Symposium on Circuits and Systems).
研究成果: Conference contribution › 同行評審