每年專案
個人檔案
研究專長
Single event effect (SEE) in semiconductor devices
Electrostatic discharge (ESD) and transient voltage suppressors (TVS)
教育/學術資格
PhD, 電機工程, The University of Tokyo
指紋
查看啟用 Chin-Han Chung 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
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A Comprehensive Study of Total Ionizing Dose Effect on the Electrical Performance of the GaN MIS-HEMT
Yang, C. Y., Chung, C. H., Yu, W., Ma, C. J., Wu, S. R., Dixit, A., Lee, C. T. & Chang, E. Y., 1 6月 2022, 於: IEEE Transactions on Device and Materials Reliability. 22, 2, p. 276-281 6 p.研究成果: Article › 同行評審
1 引文 斯高帕斯（Scopus） -
Annealing induced cation diffusion in TaOx-based memristor and its compatibility for back-end-of-line post-processing
Prasad, O. K., Chandrasekaran, S., Chung, C. H., Chang, K. M. & Simanjuntak, F. M., 5 12月 2022, 於: Applied Physics Letters. 121, 23, 233505.研究成果: Article › 同行評審
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Optimization of Forward and Reverse Electrical Characteristics of GaN-on-Si Schottky Barrier Diode Through Ladder-Shaped Hybrid Anode Engineering
Yang, C. Y., Wu, J. H., Chung, C. H., You, J. Y., Yu, T. C., Ma, C. J., Lee, C. T., Ueda, D., Hsu, H. T. & Chang, E. Y., 1 12月 2022, 於: IEEE Transactions on Electron Devices. 69, 12, p. 6644-6649 6 p.研究成果: Article › 同行評審
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Understanding the Difference in Soft-Error Sensitivity of Back-Biased Thin-BOX SOI SRAMs to Space and Terrestrial Radiation
Chung, C. H., Kobayashi, D. & Hirose, K., 12月 2019, 於: IEEE Transactions on Device and Materials Reliability. 19, 4, p. 751-756 6 p., 8882369.研究成果: Article › 同行評審
2 引文 斯高帕斯（Scopus） -
Resistance-Based Modeling for Soft Errors in SOI SRAMs Caused by Radiation-Induced Potential Perturbation under the BOX
Chung, C. H., Kobayashi, D. & Hirose, K., 12月 2018, 於: IEEE Transactions on Device and Materials Reliability. 18, 4, p. 574-582 9 p., 8477021.研究成果: Article › 同行評審
6 引文 斯高帕斯（Scopus）