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查看斯高帕斯 (Scopus) 概要
郭 政煌
教授
照明與能源光電研究所
電話
06-3032121#57798
電子郵件
kuoch
nycu.edu
tw
h-index
h10-index
h5-index
2993
引文
25
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
54
引文
5
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
40
引文
4
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
2000
2024
每年研究成果
概覽
指紋
網路
計畫
(11)
研究成果
(132)
類似的個人檔案
(10)
指紋
查看啟用 Cheng-Huang Kuo 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
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重量
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Keyphrases
Light-emitting Diodes
82%
Nitrides
47%
Indium Gallium Nitride (InGaN)
41%
GaN-based Light-emitting Diodes
33%
Multiple Quantum Wells
27%
Metal-organic Chemical Vapor Deposition (MOCVD)
23%
GaN-based
22%
P-GaN
21%
Power Output
15%
Aluminum Gallium Nitride (AlGaN)
14%
GaN Buffer
13%
Contact Layer
13%
Short-period Superlattice
13%
Indium Tin Oxide
11%
Sapphire Substrate
10%
GaN Epitaxial Layers
10%
Forward Voltage
10%
GaN Layers
10%
GaN Template
10%
Low Temperature
10%
Blue Light-emitting Diodes
9%
Nanorods
9%
Patterned Sapphire Substrate
9%
N-GaN
8%
Crystal Quality
8%
Near Ultraviolet
8%
Ohmic Contact
8%
Injection Current
8%
Si-doped
7%
Light Extraction Efficiency
7%
DUV LED
7%
Transparent Contacts
7%
Sapphire
7%
Sidewall
7%
White Light-emitting Diodes
6%
GaN Films
6%
Annealing
6%
Barrier Layer
6%
AlInGaN
6%
Surface Layer
6%
Schottky Barrier Photodetectors
6%
AlGaN-GaN
6%
Diode Structures
5%
AlGaN Barrier
5%
Near-ultraviolet Light-emitting Diode
5%
Output Intensity
5%
Green Light-emitting Diodes
5%
Material Science
Light-Emitting Diode
100%
Nitride Compound
42%
Superlattice
17%
Sapphire
17%
Epitaxial Film
15%
Indium Tin Oxide
14%
Surface (Surface Science)
14%
Metal-Organic Chemical Vapor Deposition
13%
ZnO
12%
Buffer Layer
12%
Nanorod
12%
Film
11%
Schottky Barrier
10%
Quantum Well
10%
Density
10%
Chemical Vapor Deposition
9%
Aluminum Nitride
8%
Electrical Resistivity
7%
Oxide Compound
6%
Annealing
5%
Vapor Phase Epitaxy
5%
Nucleation
5%
Engineering
Light-Emitting Diode
88%
Nitride
37%
Superlattice
17%
Output Power
14%
Metal Organic Chemical Vapor Deposition
12%
Quantum Well
11%
Sapphire Substrate
11%
Forward Voltage
11%
Indium-Tin-Oxide
10%
Epitaxial Film
10%
Ultraviolet Light
9%
Current Injection
8%
Vapor Deposition
8%
Low-Temperature
7%
Side Wall
7%
Light Extraction Efficiency
7%
Chemical Vapor Deposition
6%
Buffer Layer
6%
Blue Light
6%
Ohmic Contacts
6%
Surface Layers
6%
Photometer
6%
Crystal Quality
6%
Heterojunctions
5%
Schottky Barrier
5%
Growth Temperature
5%
Barrier Layer
5%
Reflectance
5%
