搜尋結果
Article
Chung, Y. Y. ,
Li, C. F. ,
Lin, C. T. ,
Ho, Y. T. &
Chien, C. H. ,
1 1月 2019 , (Accepted/In press)
於: IEEE Electron Device Letters. 研究成果: Article › 同行評審
Sulfurization
100%
Electric lines
62%
Sapphire
49%
Metals
47%
Contact Resistance
47%
Hsu, C. C. ,
Chi, W. C. ,
Tsai, Y. H. ,
Chou, C. H. ,
Chen, C. W. ,
Chien, H. P. ,
Chuang, S. S. ,
Luo, G. L. ,
Lee, Y. J. &
Chien, C. H. ,
1 7月 2016 ,
於: IEEE Transactions on Electron Devices. 63 ,
7 ,
p. 2714-2721 8 p. , 7484321.
研究成果: Article › 同行評審
Annealing
100%
Microwaves
88%
Alloy
70%
Schottky Contact
32%
Crystallinity
24%
Chou, C-H. ,
Tsai, Y. H. ,
Hsu, C. C. ,
Jau, Y. H. ,
Lin, Y. H. ,
Yeh, W. K. &
Chien, C-H. ,
1 5月 2017 ,
於: IEEE Transactions on Electron Devices. 64 ,
5 ,
p. 2314-2320 7 p. , 7885604.
研究成果: Article › 同行評審
Germanide
100%
Titanium nitride
93%
Nickel alloys
82%
Thermodynamic stability
67%
Nitride
63%
Hsu, C. C. ,
Chou, C. H. ,
Wang, S. Y. ,
Chi, W. C. ,
Chien, C. H. &
Luo, G. L. ,
14 9月 2015 ,
於: Applied Physics Letters. 107 ,
11 , 113503.
研究成果: Article › 同行評審
electric contacts
100%
electrical resistivity
71%
metals
58%
contact resistance
47%
roughness
18%
Chen, H. Y. ,
Lin, C. Y. ,
Chen, M. C. ,
Huang, C. C. &
Chien, C-H. ,
1 1月 2011 ,
於: Japanese journal of applied physics. 50 ,
4 PART 2 , 04DL05.
研究成果: Article › 同行評審
pH sensors
100%
Nanowires
80%
Oxide semiconductors
77%
Polysilicon
75%
Field effect transistors
69%
Chou, C. H. ,
Shih, A. S. ,
Yu, S. C. ,
Lin, Y. H. ,
Tsai, Y. H. ,
Lin, C-Y. ,
Yeh, W. K. &
Chien, C-H. ,
1 11月 2018 ,
於: IEEE Electron Device Letters. 39 ,
11 ,
p. 1632-1635 4 p. , 8470143.
研究成果: Article › 同行評審
Germanium
100%
Palladium
98%
Interstitial
78%
Demonstrations
61%
Germanide
48%
Cheng, C. C. ,
Chien, C-H. ,
Luo, G. L. ,
Liu, J. C. ,
Chen, Y. C. ,
Chang, Y. F. ,
Wang, S. Y. ,
Kei, C. C. ,
Hsiao, C. N. &
Chang, C. Y. ,
17 2月 2009 ,
於: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 27 ,
1 ,
p. 130-133 4 p. 研究成果: Article › 同行評審
Oxide semiconductors
100%
electrical impedance
88%
metal oxide semiconductors
86%
regression analysis
86%
Linear regression
85%
Lee, W. L. ,
Hsu, C. C. ,
Chung, C. T. ,
Lu, Y. H. ,
Luo, G. L. &
Chien, C-H. ,
1 1月 2017 ,
於: ECS Journal of Solid State Science and Technology. 6 ,
8 ,
p. P507-P511 研究成果: Article › 同行評審
Alloy
100%
Field Effect
94%
Metals
91%
Resistance
90%
Field effect transistors
76%
Multiwalled carbon nanotubes (MWCN)
100%
Single-walled carbon nanotubes (SWCN)
91%
Thin film transistors
85%
Multi Walled Nanotube
56%
Electrodes
51%
Nguyen, Q. K. ,
Lin, Y. J. ,
Sun, C. ,
Lee, X. H. ,
Lin, S. K. ,
Wu, C. S. ,
Yang, T. H. ,
Wu, T. L. ,
Lee, T. X. ,
Chien, C. H. ,
Yu, Y. W. &
Sun, C. C. ,
12月 2022 ,
於: Scientific reports. 12 ,
1 , 6444.
研究成果: Article › 同行評審
Lighting
100%
Light
64%
Glare
42%
Technology
19%
Luo, G. L. ,
Han, Z. Y. ,
Chien, C-H. ,
Ko, C. H. ,
Wann, C. H. ,
Lin, H. Y. ,
Shen, Y. L. ,
Chung, C. T. ,
Huang, S. C. ,
Cheng, C. C. &
Chang, C. Y. ,
1 1月 2010 ,
於: Journal of the Electrochemical Society. 157 ,
1 研究成果: Article › 同行評審
Epitaxial growth
100%
Epitaxial Growth
86%
Field Effect
70%
Chemical Vapour Deposition
64%
Vacuum
56%
Chen, C. W. ,
Chung, C. T. ,
Tzeng, J. Y. ,
Li, P. H. ,
Chang, P. S. ,
Chien, C-H. &
Luo, G. L. ,
3 4月 2013 ,
於: IEEE Transactions on Electron Devices. 60 ,
4 ,
p. 1334-1341 8 p. , 6482668.
研究成果: Article › 同行評審
Germanium
100%
Heterojunctions
97%
Field effect transistors
79%
Field Effect
74%
Substrates
52%
Perng, T. H. ,
Chien, C-H. ,
Chen, C. W. ,
Yang, M. J. ,
Lehnen, P. ,
Chang, C. Y. &
Huang, T. Y. ,
1 12月 2004 ,
於: IEEE Electron Device Letters. 25 ,
12 ,
p. 784-786 3 p. 研究成果: Article › 同行評審
Management information systems
100%
Capacitor
82%
Dielectric Material
71%
Copper
65%
Capacitors
63%
Nanocrystals
100%
nanocrystals
59%
Nanocrystal
54%
Data storage equipment
40%
Retention Time
30%
Chung, Y. Y. ,
Cheng, C. C. ,
Chou, Y. C. ,
Chueh, W. C. ,
Chung, W. H. ,
Yu, Z. ,
Hung, T. Y. T. ,
Huang, L. Y. ,
Wang, S. Y. ,
Teng, L. C. ,
Chang, W. H. ,
Li, L. J. &
Chien, C-H. ,
11月 2020 ,
於: Ieee Electron Device Letters. 41 ,
11 ,
p. 1649-1652 4 p. , 9206053.
研究成果: Article › 同行評審
Field effect transistors
100%
Deep neural networks
90%
Conductance
89%
Nonvolatile storage
76%
Charge trapping
73%
Perng, T. H. ,
Chien, C-H. ,
Chen, C. W. ,
Lehnen, P. &
Chang, C. Y. ,
22 12月 2004 ,
於: Thin Solid Films. 469-470 ,
SPEC. ISS. ,
p. 345-349 5 p. 研究成果: Article › 同行評審
Capacitor
100%
Dielectric Material
86%
capacitors
84%
Capacitors
77%
insulators
71%
Lee, M. C. ,
Lee, W. L. ,
Lin, H. R. ,
Luo, G. L. &
Chien, C. H. ,
1 12月 2021 ,
於: Ieee Electron Device Letters. 42 ,
12 ,
p. 1723-1726 4 p. 研究成果: Article › 同行評審
Oxides
100%
Aluminum
89%
Interface State
89%
Interface states
89%
Oxide
62%
MOS capacitors
100%
Atomic layer deposition
97%
atomic layer epitaxy
66%
Plasmas
58%
capacitors
55%
Thin film transistors
100%
Electrodes
60%
Rapid Thermal Annealing
58%
Conductor
39%
Behavior as Electrode
39%
Chen, C. W. ,
Chung, C. T. ,
Lin, J. C. ,
Luo, G. L. &
Chien, C-H. ,
1 2月 2013 ,
於: Applied Physics Express. 6 ,
2 , 024001.
研究成果: Article › 同行評審
Germanium
100%
Heterojunctions
97%
Current density
72%
Diodes
68%
germanium
66%
Yang, M. J. ,
Chien, C-H. ,
Lu, Y. H. ,
Luo, G. L. ,
Chiu, S. C. ,
Lou, C. C. &
Huang, T. Y. ,
1 10月 2007 ,
於: IEEE Electron Device Letters. 28 ,
10 ,
p. 902-904 3 p. 研究成果: Article › 同行評審
Hafnium
100%
Gate dielectrics
89%
Thin film transistors
80%
Silicates
72%
Polysilicon
72%
Chen, C. W. ,
Tzeng, J. Y. ,
Chung, C. T. ,
Chien, H. P. ,
Chien, C-H. &
Luo, G. L. ,
1 1月 2014 ,
於: IEEE Transactions on Electron Devices. 61 ,
8 ,
p. 2656-2661 6 p. , 6844018.
研究成果: Article › 同行評審
Germanium
100%
MOSFET devices
87%
Field Effect
74%
Interface State
28%
Interface states
28%
transistors
100%
electrodes
77%
thin films
64%
performance
55%
budgets
45%
Lin, Y. H. ,
Chien, C-H. ,
Lin, C. T. ,
Chang, C. Y. &
Lei, T. F. ,
1 3月 2005 ,
於: IEEE Electron Device Letters. 26 ,
3 ,
p. 154-156 3 p. 研究成果: Article › 同行評審
Nanocrystals
100%
Nanocrystal
54%
Data storage equipment
40%
Rapid thermal annealing
25%
Rapid Thermal Annealing
24%
Lin, C. P. ,
Tsui, B-Y. ,
Yang, M. J. ,
Huang, R. H. &
Chien, C-H. ,
1 5月 2006 ,
於: IEEE Electron Device Letters. 27 ,
5 ,
p. 360-363 4 p. 研究成果: Article › 同行評審
Gate dielectrics
100%
Thin film transistors
89%
Dielectric Material
61%
Silicon
55%
Dielectric films
41%
Lu, Y. H. ,
Chien, C-H. ,
Kuo, P. Y. ,
Yang, M. J. ,
Lin, H. Y. &
Chao, T-S. ,
24 1月 2011 ,
於: Electrochemical and Solid-State Letters. 14 ,
1 研究成果: Article › 同行評審
Thin film transistors
100%
Polysilicon
90%
Glass Substrate
77%
Laser Annealing
70%
Glass
62%
Hsu, C. C. ,
Tsai, Y. H. ,
Chen, C. W. ,
Li, J. H. ,
Lin, Y. H. ,
Lee, Y. J. ,
Luo, G. L. &
Chien, C-H. ,
1 1月 2016 ,
於: IEEE Electron Device Letters. 37 ,
1 ,
p. 8-11 4 p. , 7331593.
研究成果: Article › 同行評審
Schottky Contact
100%
Semiconductor quantum wells
96%
Germanium
82%
MOSFET devices
71%
Field Effect
61%
Nitridation
100%
Aluminum oxide
61%
Capacitor
44%
Annealing
31%
Leakage Current
28%
Luo, G. L. ,
Hsieh, Y. C. ,
Chang, E. Y. ,
Pilkuhn, M. H. ,
Chien, C-H. ,
Yang, T. H. ,
Cheng, C. C. &
Chang, C. Y. ,
9 5月 2007 ,
於: Journal of Applied Physics. 101 ,
8 , 084501.
研究成果: Article › 同行評審
field effect transistors
100%
high speed
95%
composite materials
77%
metals
65%
antiphase boundaries
30%
Hot electrons
100%
hot electrons
69%
Gate dielectrics
63%
Oxides
57%
trapping
51%
Kuo, Y. Y. ,
Li, T. H. ,
Yao, J. N. ,
Lin, C-Y. &
Chien, C-H. ,
1 9月 2012 ,
於: Electrochimica Acta. 78 ,
p. 236-243 8 p. 研究成果: Article › 同行評審
Hydrothermal Crystallization
100%
Nanotubes
89%
Crystallization
76%
Surface Modification
60%
Nanotube
56%
Lin, Y. H. ,
Chien, C-H. ,
Chou, T. H. ,
Chao, T-S. &
Lei, T. F. ,
1 4月 2007 ,
於: IEEE Electron Device Letters. 28 ,
4 ,
p. 267-269 3 p. 研究成果: Article › 同行評審
Dangling bonds
100%
Dangling Bond
72%
Flash memory
65%
Polysilicon
63%
Thin films
51%
Lee, M. C. ,
Lin, H. R. ,
Lee, W. L. ,
Chung, N. J. ,
Luo, G. L. &
Chien, C. H. ,
1 3月 2022 ,
於: IEEE Transactions on Electron Devices. 69 ,
3 ,
p. 1265-1270 6 p. 研究成果: Article › 同行評審
Germanium oxides
100%
Annealing
96%
Plasmas
89%
Substrates
68%
Plasma
60%
Chou, Y. C. ,
Tsai, C. W. ,
Yi, C. Y. ,
Chung, W. H. &
Chien, C-H. ,
2020 ,
於: IEEE Journal of the Electron Devices Society. 8 ,
p. 572-576 5 p. , 9091548.
研究成果: Article › 同行評審
Charge trapping
100%
Atomic Layer Epitaxy
73%
Crystals
63%
Cubic Space Group
52%
Atomic layer deposition
48%
Cheng, C. C. ,
Chien, C-H. ,
Luo, G. L. ,
Tseng, C. K. ,
Chiang, H. C. ,
Yang, C. H. &
Chang, C. Y. ,
29 1月 2008 ,
於: Journal of the Electrochemical Society. 155 ,
3 研究成果: Article › 同行評審
Electric properties
100%
Capacitor
96%
Arsenic
92%
Oxides
80%
Electrical Property
78%
Chuang, F. T. ,
Chen, P. Y. ,
Cheng, T. C. ,
Chien, C-H. &
Li, B. J. ,
26 9月 2007 ,
於: Nanotechnology. 18 ,
39 , 395702.
研究成果: Article › 同行評審
Field emission
100%
Carbon nanotubes
82%
Field Emission
78%
Multi Walled Nanotube
65%
Carbon
59%
Chen, C. C. ,
Lin, H-C. ,
Chang, C. Y. ,
Liang, M. S. ,
Chien, C-H. ,
Hsien, S. K. &
Huang, T. Y. ,
1 1月 2000 ,
於: IEEE Electron Device Letters. 21 ,
1 ,
p. 15-17 3 p. 研究成果: Article › 同行評審
Plasmas
100%
Oxides
93%
Leakage Current
71%
Oxide
58%
Leakage currents
58%
Huang, H. J. ,
Chen, K. M. ,
Huang, T. Y. ,
Chao, T-S. ,
Huang, G. W. ,
Chien, C-H. &
Chang, C. Y. ,
1 8月 2001 ,
於: IEEE Transactions on Electron Devices. 48 ,
8 ,
p. 1627-1632 6 p. , 936576.
研究成果: Article › 同行評審
Transconductance
100%
Leakage Current
85%
Contact Resistance
81%
Sheet Resistance
78%
Field Effect
64%
Chen, C. C. ,
Lin, H-C. ,
Chang, C. Y. ,
Huang, T. Y. ,
Chien, C-H. &
Liang, M. S. ,
1 6月 2000 ,
於: Electrochemical and Solid-State Letters. 3 ,
6 ,
p. 290-292 3 p. 研究成果: Article › 同行評審
Fluorine
100%
Oxide semiconductors
85%
Polysilicon
83%
integrity
76%
metal oxide semiconductors
74%
Chen, S. C. ,
Chen, Y. Y. ,
Chang, Y. T. ,
Lou, J. C. ,
Kin, K. T. &
Chien, C-H. ,
1 9月 2007 ,
於: Microelectronic Engineering. 84 ,
9-10 ,
p. 1898-1901 4 p. 研究成果: Article › 同行評審
Ozone
100%
ozone
86%
surface treatment
83%
Surface treatment
83%
Hafnium oxides
69%
Lu, W. T. ,
Chien, C-H. ,
Lan, W. T. ,
Lee, T. C. ,
Yang, M. J. ,
Shen, S. W. ,
Lehnen, P. &
Huang, T. Y. ,
9 11月 2005 ,
於: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 44 ,
11 ,
p. 7869-7875 7 p. 研究成果: Article › 同行評審
Plasma deposition
100%
Interface states
92%
MOSFET devices
70%
metal oxide semiconductors
61%
field effect transistors
47%
Thin film transistors
100%
Electric properties
83%
Plasmas
72%
Electrical Property
65%
Contact Resistance
49%
Lee, W. L. ,
Yu, C. Y. ,
Zhang, J. L. ,
Luo, G. L. &
Chien, C-H. ,
1 5月 2019 ,
於: IEEE Electron Device Letters. 40 ,
5 ,
p. 678-681 4 p. , 8667385.
研究成果: Article › 同行評審
Interface State
100%
Interface states
99%
Thermodynamic stability
67%
Annealing
64%
Vacuum
57%
Chou, Y. C. ,
Chung, W. H. ,
Tsai, C. W. ,
Yi, C. Y. &
Chien, C-H. ,
16 12月 2020 ,
於: IEEE Journal of the Electron Devices Society. 9 ,
p. 137-143 7 p. , 9296335.
研究成果: Article › 同行評審
Charge trapping
100%
Electronic Band Structure
64%
Computer Neural Networks
41%
Equipment and Supplies
38%
Pattern Recognition
37%
Tsai, Y. H. ,
Chou, C. H. ,
Shih, A. S. ,
Jau, Y. H. ,
Yeh, W. K. ,
Lin, Y. H. ,
Ko, F-H. &
Chien, C-H. ,
1 11月 2016 ,
於: IEEE Electron Device Letters. 37 ,
11 ,
p. 1379-1382 4 p. , 7577750.
研究成果: Article › 同行評審
Density of Interface States
100%
Interface states
82%
Germanium
72%
Thermodynamic stability
55%
Annealing
53%
Li, H. H. ,
Tsai, Y. H. ,
Lin, Y. H. &
Chien, C-H. ,
8月 2021 ,
於: Ieee Electron Device Letters. 42 ,
8 ,
p. 1109-1111 3 p. , 9448269.
研究成果: Article › 同行評審
Atomic layer deposition
100%
Atomic Layer Epitaxy
75%
Thermodynamic stability
67%
Density of Interface States
60%
Plasmas
60%
Chou, C-H. ,
Lu, Y. H. ,
Tsai, Y. H. ,
Shih, A. S. ,
Yeh, W. K. &
Chien, C. H. ,
19 1月 2018 ,
於: ECS Journal of Solid State Science and Technology. 7 ,
2 ,
p. N15-N19 5 p. 研究成果: Article › 同行評審
Yttrium
100%
X ray photoelectron spectroscopy
83%
Capacitor
70%
X-Ray Photoelectron Spectroscopy
48%
Density of Interface States
42%
Hsu, F. Y. ,
Leu, C. C. ,
Chien, C-H. &
Hu, C. T. ,
1 12月 2006 ,
於: Journal of Materials Research. 21 ,
12 ,
p. 3124-3133 10 p. 研究成果: Article › 同行評審
Ferroelectric thin films
100%
Bismuth
76%
Strontium
69%
bismuth
56%
strontium
53%
Yang, Y. C. ,
Tsai, Y. H. ,
Amrit, P. ,
Chen, T. Y. ,
Liu, H. T. ,
Tang, S. J. ,
Lin, C-L. &
Chien, C-H. ,
8月 2021 ,
於: Journal of Physics D: Applied Physics. 54 ,
34 ,
p. 1-7 7 p. , 345102.
研究成果: Article › 同行評審
Energy gap
100%
Doping (additives)
98%
Thermodynamic stability
90%
thermal stability
76%
Annealing
69%
Leu, C. C. ,
Chien, C-H. ,
Hsu, F. Y. ,
Lin, H. T. &
Hu, C. T. ,
13 9月 2004 ,
於: Journal of the Electrochemical Society. 151 ,
8 研究成果: Article › 同行評審
Buffer layers
100%
Tantalum
96%
Bismuth
94%
Ferroelectric materials
92%
Strontium
79%