每年專案
個人檔案
研究專長
半導體物理與元件、積體電路製程、電性量測分析
經歷
1992/10~1997/07 工研院電子所身次奈米技術組正工程師
1999/08~迄今 國立交通大學電子工程學系/電子研究所教授
2007/08~2012/07 國立交通大學奈米中心主任
教育/學術資格
PhD, 電機工程, 國立陽明交通大學
外部位置
指紋
查看啟用 Bing-Yue Tsui 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
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過去五年中的合作和熱門研究領域
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碳化矽單晶片功率系統平台-總計畫暨子計畫一：碳化矽互補式金氧半場效應電晶體元件與積體電路製程技術(2/2)
Tsui, B.-Y. (PI)
1/05/21 → 30/04/23
研究計畫: Other Government Ministry Institute
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碳化矽單晶片功率系統平台-總計畫暨子計畫一：碳化矽互補式金氧半場效應電晶體元件與積體電路製程技術(1/2)
Tsui, B.-Y. (PI)
1/05/20 → 31/07/21
研究計畫: Other Government Ministry Institute
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碳化矽單晶片功率系統平台-總計畫暨子計畫一：碳化矽互補式金氧半場效應電晶體元件與積體電路製程技術(2/2)
Tsui, B.-Y. (PI)
1/05/19 → 30/04/20
研究計畫: Other Government Ministry Institute
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A Study of Irradiation-Induced Threshold Voltage Instability in 4H-SiC NMOSFETs With Varying Channel Lengths
Chen, C. H., Chao, D. S. & Tsui, B. Y., 2026, 於: IEEE Electron Device Letters. 47, 2, p. 229-232 4 p.研究成果: Article › 同行評審
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A Study on Simplifying the Process of a Single Cycle for Multiple Epitaxy and Implantation Method to Fabricate SiC Super Junction
Chen, H. W., Cheng, C. Y., Lai, W. L., Wu, Y. C. S. & Tsui, B. Y., 2026, Materials Science Forum. Trans Tech Publications Ltd., p. 43-47 5 p. (Materials Science Forum; 卷 1191).研究成果 › 同行評審
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Channel Length Effects on Threshold Voltage Instability in Gamma Irradiated 4H-SiC PMOSFETs
Chen, C. H., Chang, C. S., Tsai, I. C., Chao, D. S. & Tsui, B. Y., 2026, Key Engineering Materials. Trans Tech Publications Ltd., p. 47-53 7 p. (Key Engineering Materials; 卷 1056).研究成果 › 同行評審
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High Performance Monolithic Integration of 20 V CMOS Gate Driver and 1.7 kV JBSFET on 4H-SiC
Ting, Y. C., Chen, Q. H., Wang, M. H., Hung, C. L., Hsiao, Y. K. & Tsui, B. Y., 2026, 2026 IEEE 38th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2026. Institute of Electrical and Electronics Engineers Inc., p. 433-436 4 p. (Proceedings of the International Symposium on Power Semiconductor Devices and ICs).研究成果 › 同行評審
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Investigation of Crystal-Face-Resolved Gate Switching Instability in 4H-SiC UMOSFETs Enabled by a Source-Separated Single-Cell Structure
Liao, W. J., Hong, C. L., Hsiao, Y. K. & Tsui, B. Y., 2026, 2026 38th IEEE International Conference on Microelectronic Test Structures, ICMTS 2026 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., (IEEE International Conference on Microelectronic Test Structures).研究成果: Conference contribution › 同行評審