每年專案
個人檔案
研究專長
半導體物理與元件、積體電路製程、電性量測分析
經歷
1992/10~1997/07 工研院電子所身次奈米技術組正工程師
1999/08~迄今 國立交通大學電子工程學系/電子研究所教授
2007/08~2012/07 國立交通大學奈米中心主任
教育/學術資格
PhD, 電機工程, 國立陽明交通大學
外部位置
指紋
查看啟用 Bing-Yue Tsui 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
- 1 類似的個人檔案
過去五年中的合作和熱門研究領域
國家/地區層面的近期外部共同作業。按一下圓點深入探索詳細資料,或
專案
- 31 已完成
-
-
-
碳化矽單晶片功率系統平台-總計畫暨子計畫一:碳化矽互補式金氧半場效應電晶體元件與積體電路製程技術(2/2)
Tsui, B.-Y. (PI)
1/05/21 → 30/04/23
研究計畫: Other Government Ministry Institute
-
碳化矽單晶片功率系統平台-總計畫暨子計畫一:碳化矽互補式金氧半場效應電晶體元件與積體電路製程技術(1/2)
Tsui, B.-Y. (PI)
1/05/20 → 31/07/21
研究計畫: Other Government Ministry Institute
-
碳化矽單晶片功率系統平台-總計畫暨子計畫一:碳化矽互補式金氧半場效應電晶體元件與積體電路製程技術(2/2)
Tsui, B.-Y. (PI)
1/05/19 → 30/04/20
研究計畫: Other Government Ministry Institute
-
A 4H-SiC Trench MOS Capacitor Structure for Sidewall Oxide Characteristics Measurement
Huang, H. L., Hsuesh, L. T., Tu, Y. C. & Tsui, B. Y., 2024, 2024 IEEE 36th International Conference on Microelectronic Test Structures, ICMTS 2024 - Proceedings. Institute of Electrical and Electronics Engineers Inc., (IEEE International Conference on Microelectronic Test Structures).研究成果: Conference contribution › 同行評審
-
Improving Radiation Hardness of 4H-SiC Power Devices by Local-Oxidation of Silicon Carbide (LOCOSiC) Isolation
Tsui, B. Y., Wang, C. H., Lai, S. H., Shih, C. P., Chen, Q. H. & Chao, D. S., 1 2月 2024, 於: Ieee Electron Device Letters. 45, 2, p. 228-231 4 p.研究成果: Article › 同行評審
1 引文 斯高帕斯(Scopus) -
Triple Self-Aligned Split-Gate Architecture for High-Speed Applications of 4H-SiC VDMOSFETs
Hung, C. L., Tsui, B. Y., Hsiao, Y. K. & Kuo, H. C., 2024, 2024 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2024 - Proceedings. Institute of Electrical and Electronics Engineers Inc., (2024 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2024 - Proceedings).研究成果: Conference contribution › 同行評審
-
A multi-contact six-Terminal cross-bridge Kelvin resistor (CBKR) structure for evaluation of interface uniformity of the Ti-Al alloy/p-Type 4H-SiC contact
Chen, Y. L., Lai, S. H., Lin, J. H. & Tsui, B. Y., 2023, 2023 35th International Conference on Microelectronic Test Structure, ICMTS 2023. Institute of Electrical and Electronics Engineers Inc., (IEEE International Conference on Microelectronic Test Structures; 卷 2023-March).研究成果: Conference contribution › 同行評審
1 引文 斯高帕斯(Scopus) -
A Study on the Impact of Gamma Rays Irradiation on 4H-SiC CMOSFETs
Chen, Q. H., Tsui, B. Y. & Chao, D. S., 2023, WiPDA Asia 2023 - IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia. Institute of Electrical and Electronics Engineers Inc., (WiPDA Asia 2023 - IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia).研究成果: Conference contribution › 同行評審
1 引文 斯高帕斯(Scopus)