搜尋結果
2023
Pooja, P. ,
Che, C. C. ,
Zeng, S. H. ,
Lee, Y. C. ,
Yen, T. J. &
Chin, A. ,
2023 , (Accepted/In press)
於: Advanced Materials Technologies. 研究成果: Article › 同行評審
Nanosheets
100%
Thin film transistors
84%
Field Effect
65%
Nitrogen
61%
Nanosheet
54%
2022
Yen, T. J. ,
Chin, A. ,
Chan, W. K. ,
Chen, H. Y. T. &
Gritsenko, V. ,
1 1月 2022 ,
於: Nanomaterials. 12 ,
2 , 261.
研究成果: Article › 同行評審
Hole mobility
100%
Nanosheets
91%
Thin film transistors
77%
Hole Mobility
71%
Effective Mass
56%
2021
Magnetic Flux
100%
Inductor
88%
Flip flop circuits
71%
Magnetic flux
68%
Negative Resistance
52%
voltage controlled oscillators
100%
inductors
82%
Variable frequency oscillators
77%
CMOS
62%
Tuning
54%
Gismatulin, A. A. ,
Kamaev, G. N. ,
Kruchinin, V. N. ,
Gritsenko, V. A. ,
Orlov, O. M. &
Chin, A. ,
28 1月 2021 ,
於: Scientific reports. 11 ,
1 ,
10 p. , 2417.
研究成果: Article › 同行評審
silicon nitride
100%
Phonons
29%
Silicon
18%
Technology
9%
Equipment and Supplies
8%
Yen, T. J. ,
Chin, A. &
Gritsenko, V. ,
1月 2021 ,
於: Nanomaterials. 11 ,
1 ,
p. 1-11 11 p. , 92.
研究成果: Article › 同行評審
Thin film transistors
100%
Field Effect
77%
Compound Mobility
59%
Three dimensional integrated circuits
54%
Transistors
33%
MOSFET devices
100%
Resonators
80%
switches
70%
transistors
68%
resonators
64%
Arsenic
100%
Ion implantation
91%
Ion Implantation
82%
Resistance
42%
Data storage equipment
41%
Islamov, D. R. ,
Gritsenko, V. A. ,
Perevalov, T. V. ,
Aliev, V. S. ,
Nadolinny, V. A. &
Chin, A. ,
3月 2021 ,
於: Materialia. 15 , 100980.
研究成果: Article › 同行評審
Oxygen vacancies
100%
Luminescence
95%
Charge transfer
83%
Zirconia
76%
Paramagnetic resonance
58%
2020
Gismatulin, A. A. ,
Voronkovskii, V. A. ,
Kamaev, G. N. ,
Novikov, Y. N. ,
Kruchinin, V. N. ,
Krivyakin, G. K. ,
Gritsenko, V. A. ,
Prosvirin, I. P. &
Chin, A. ,
11 12月 2020 ,
於: Nanotechnology. 31 ,
50 ,
10 p. , 505704.
研究成果: Article › 同行評審
Electronic structure
100%
Memristors
86%
Charge transfer
86%
Electronic State
49%
Charge Transfer
46%
Equipment and Supplies
100%
Semiconductors
33%
Oxides
28%
Metals
20%
Technology
15%
Yen, T. J. ,
Chin, A. &
Gritsenko, V. ,
11月 2020 ,
於: Nanomaterials. 10 ,
11 ,
p. 1-8 8 p. , 2145.
研究成果: Article › 同行評審
Thin film transistors
100%
Compound Mobility
59%
Monolithic integrated circuits
59%
Field Effect
46%
Display devices
29%
Wu, C-H. ,
Kuo, S-N. ,
Chang, K-M. ,
Chen, Y-M. ,
Zhang, Y-X. ,
Xu, N. ,
Liu, W-Y. &
Chin, A. ,
7月 2020 ,
於: Journal of Nanoscience and Nanotechnology. 20 ,
7 ,
p. 4244-4247 4 p. 研究成果: Article › 同行評審
Plasma enhanced chemical vapor deposition
100%
Plasma Enhanced Chemical Vapour Deposition
84%
random access memory
81%
Atmospheric pressure
78%
Annealing
69%
Insulated gate bipolar transistors (IGBT)
100%
Voltage
66%
Foundry
64%
Overvoltage
60%
Equipment and Supplies
55%
Wu, C-H. ,
Kuo, S-N. ,
Chang, K-M. ,
Chen, Y-M. ,
Zhang, Y-X. ,
Xu, N. ,
Liu, W-Y. &
Chin, A. ,
7月 2020 ,
於: Journal of Nanoscience and Nanotechnology. 20 ,
7 ,
p. 4057-4060 4 p. 研究成果: Article › 同行評審
Gallium
100%
Plasma enhanced chemical vapor deposition
99%
Zinc oxide
93%
Indium
91%
gallium oxides
90%
Chen, Y-M. ,
Wu, C-H. ,
Chang, K-M. ,
Zhang, Y-X. ,
Xu, N. ,
Yu, T-Y. &
Chin, A. ,
7月 2020 ,
於: Journal of Nanoscience and Nanotechnology. 20 ,
7 ,
p. 4110-4113 4 p. 研究成果: Article › 同行評審
Gallium
100%
Plasma enhanced chemical vapor deposition
99%
Zinc oxide
93%
Indium
91%
gallium oxides
90%
2019
Yen, T. J. ,
Gismatulin, A. ,
Volodin, V. ,
Gritsenko, V. &
Chin, A. ,
1 12月 2019 ,
於: Scientific reports. 9 ,
1 , 6144.
研究成果: Article › 同行評審
Metals
100%
Photoelectron Spectroscopy
28%
Oxides
23%
Psychology Retention
21%
Memory
14%
Resistors
100%
Data storage equipment
62%
Transistors
22%
Voltage
18%
Resistance
16%
Gritsenko, V. A. ,
Kruchinin, V. N. ,
Prosvirin, I. P. ,
Novikov, Y. N. ,
Chin, A. &
Volodin, V. A. ,
1 11月 2019 ,
於: Journal of Experimental and Theoretical Physics. 129 ,
5 ,
p. 924-934 11 p. 研究成果: Article › 同行評審
atomic structure
100%
electronic structure
74%
flow velocity
39%
electronic spectra
28%
ammonia
25%
Gismatulin, A. A. ,
Gritsenko, V. A. ,
Yen, T-J. &
Chin, A. ,
16 12月 2019 ,
於: Applied Physics Letters. 115 ,
25 ,
5 p. , 253502.
研究成果: Article › 同行評審
silicon nitrides
100%
traps
76%
ionization
36%
low resistance
29%
high resistance
28%
Gismatulin, A. A. ,
Kruchinin, V. N. ,
Gritsenko, V. A. ,
Prosvirin, I. P. ,
Yen, T. J. &
Chin, A. ,
21 1月 2019 ,
於: Applied Physics Letters. 114 ,
3 , 033503.
研究成果: Article › 同行評審
random access memory
100%
traps
32%
ionization
20%
silicon oxides
15%
flash
13%
random access memory
100%
current distribution
94%
Grain Boundary
89%
Retention Time
79%
Oxygen vacancies
66%
Shih, C. W. ,
Yen, T. J. ,
Chin, A. ,
Lu, C. F. &
Su, W. F. ,
1 6月 2019 ,
於: IEEE Electron Device Letters. 40 ,
6 ,
p. 909-912 4 p. , 8700493.
研究成果: Article › 同行評審
Tin oxides
100%
Tin Oxide
77%
Irradiation
74%
Ultraviolet Irradiation
65%
Transistors
61%
Gritsenko, V. A. ,
Gismatulin, A. A. ,
Baraban, A. P. &
Chin, A. ,
3 4月 2019 ,
於: Materials Research Express. 6 ,
7 , 076401.
研究成果: Article › 同行評審
Leakage Current
100%
Leakage currents
81%
Ionization
60%
Hole Transport
45%
Phonon
42%
Volodin, V. A. ,
Kamaev, G. N. ,
Gritsenko, V. A. ,
Gismatulin, A. A. ,
Chin, A. &
Vergnat, M. ,
10 6月 2019 ,
於: Applied Physics Letters. 114 ,
23 , 233104.
研究成果: Article › 同行評審
indium oxides
100%
tin oxides
97%
vacuum deposition
63%
high vacuum
55%
Raman spectroscopy
43%
Ionization
100%
Nonstoichiometric Compound
85%
Charge transfer
59%
Charge Transfer
53%
Silicon
18%
Silicon oxides
100%
Silicon Oxide
85%
Percolation
82%
Electrons
69%
Photoelectron spectroscopy
39%
2018
silicon nitrides
100%
amorphous silicon
94%
Raman spectra
79%
traps
76%
oscillations
64%
Shih, C. W. ,
Chin, A. ,
Lu, C. F. &
Su, W. F. ,
1 12月 2018 ,
於: Scientific reports. 8 ,
1 , 17066.
研究成果: Article › 同行評審
Tin
100%
Oxides
85%
Metals
61%
Temperature
51%
Oxygen
50%
silicon oxides
100%
simulation
36%
conductivity
25%
absorption spectroscopy
17%
oxide films
17%
Lu, C. F. ,
Shih, C. W. ,
Chen, C. A. ,
Chin, A. &
Su, W. F. ,
4 10月 2018 ,
於: Advanced Functional Materials. 28 ,
40 , 1803145.
研究成果: Article › 同行評審
Polymer films
100%
Ammonia
80%
ammonia
76%
Tuning
58%
tuning
56%
2017
Equipment and Supplies
100%
Hafnium oxides
100%
hafnium oxides
77%
Charge transfer
72%
Oxide films
70%
Management information systems
70%
Kruchinin, V. N. ,
Perevalov, T. V. ,
Atuchin, V. V. ,
Gritsenko, V. A. ,
Komonov, A. I. ,
Korolkov, I. V. ,
Pokrovsky, L. D. ,
Shih, C. W. &
Chin, A. ,
1 10月 2017 ,
於: Journal of Electronic Materials. 46 ,
10 ,
p. 6089-6095 7 p. 研究成果: Article › 同行評審
Spectroscopic ellipsometry
100%
Titanium dioxide
71%
Sputtering
70%
Optical properties
68%
Electron beams
65%
Yuan, H. W. ,
Shen, H. ,
Li, J. J. ,
Shao, J. ,
Huang, D. ,
Chen, Y. F. ,
Wang, P. F. ,
Ding, S. J. ,
Chin, A. &
Li, M. F. ,
1 5月 2017 ,
於: IEEE Electron Device Letters. 38 ,
5 ,
p. 677-680 4 p. , 7873283.
研究成果: Article › 同行評審
Gate dielectrics
100%
Aluminum oxide
67%
Dielectric Material
61%
Voltage
50%
Recovery
47%
Zinc Oxide
100%
Photoelectron Spectroscopy
53%
Equipment and Supplies
43%
hydroxide ion
41%
Temperature
25%
2016
Yi, S. H. ,
Ruan, D. B. ,
Di, S. ,
Liu, X. ,
Wu, Y. H. &
Chin, A. ,
1 9月 2016 ,
於: IEEE Journal of the Electron Devices Society. 4 ,
5 ,
p. 246-252 7 p. , 7527612.
研究成果: Article › 同行評審
aluminum gallium nitride
100%
Interface Trap
76%
Band Offset
73%
Trap Density Measurement
70%
Breakdown Voltage
68%
Yuan, H. W. ,
Shen, H. ,
Li, J. J. ,
Shao, J. ,
Huang, D. ,
Chen, Y. F. ,
Wang, P. F. ,
Ding, S. J. ,
Liu, W. J. ,
Chin, A. &
Li, M. F. ,
1 4月 2016 ,
於: IEEE Electron Device Letters. 37 ,
4 ,
p. 516-518 3 p. , 7421989.
研究成果: Article › 同行評審
Schottky Contact
100%
Trap Density Measurement
93%
Surface Potential
67%
Aluminum oxide
59%
Multilayer
54%
Wide band gap semiconductors
100%
MOSFET devices
68%
Field Effect
58%
Graphene transistors
54%
Phonon scattering
53%
Gritsenko, V. A. ,
Islamov, D. R. ,
Perevalov, T. V. ,
Aliev, V. S. ,
Yelisseyev, A. P. ,
Lomonova, E. E. ,
Pustovarov, V. A. &
Chin, A. ,
15 9月 2016 ,
於: Journal of Physical Chemistry C. 120 ,
36 ,
p. 19980-19986 7 p. 研究成果: Article › 同行評審
Oxygen vacancies
100%
Charge carriers
98%
Luminescence
95%
Charge transfer
66%
Charge Carrier
62%
metal oxides
100%
transistors
82%
orbitals
73%
thin films
53%
integrated circuits
24%
2015
Islamov, D. R. ,
Perevalov, T. V. ,
Gritsenko, V. A. ,
Cheng, C. H. &
Chin, A. ,
9 3月 2015 ,
於: Applied Physics Letters. 106 ,
10 , 102906.
研究成果: Article › 同行評審
traps
100%
charge transfer
38%
phonons
30%
oxygen
26%
energy
26%
Kruchinin, V. N. ,
Aliev, V. S. ,
Perevalov, T. V. ,
Islamov, D. R. ,
Gritsenko, V. A. ,
Prosvirin, I. P. ,
Cheng, C. H. &
Chin, A. ,
1 11月 2015 ,
於: Microelectronic Engineering. 147 ,
p. 165-167 3 p. 研究成果: Article › 同行評審
Spectroscopic ellipsometry
100%
Hafnium
87%
RRAM
77%
Chemical compounds
77%
Charge transfer
70%
2014
Islamov, D. R. ,
Gritsenko, V. A. ,
Cheng, C. H. &
Chin, A. ,
19 5月 2014 ,
於: Optoelectronics, Instrumentation and Data Processing. 50 ,
3 ,
p. 310-314 5 p. 研究成果: Article › 同行評審
Carrier transport
100%
Charge carriers
98%
charge carriers
56%
Ionization
50%
Data storage equipment
39%
Gate dielectrics
100%
Ferroelectric materials
92%
Leakage currents
75%
Capacitor
72%
Dielectric Material
61%
Gate dielectrics
100%
Ferroelectric materials
92%
Leakage Current
92%
Leakage currents
75%
Dielectric Material
61%
Islamov, D. R. ,
Gritsenko, V. A. ,
Cheng, C. H. &
Chin, A. ,
1 12月 2014 ,
於: Applied Physics Letters. 105 ,
22 , 222901.
研究成果: Article › 同行評審
traps
100%
oxygen
53%
phonons
30%
electric potential
24%
electrons
18%
Islamov, D. R. ,
Gritsenko, V. A. ,
Cheng, C. H. &
Chin, A. ,
29 12月 2014 ,
於: Applied Physics Letters. 105 ,
26 , 262903.
研究成果: Article › 同行評審
hafnium
100%
conductivity
53%
oxides
50%
low resistance
30%
electric potential
29%
Titanium oxides
100%
random access memory
78%
titanium oxides
70%
Data storage equipment
41%
cycles
30%
2013
Oxides
100%
field effect transistors
91%
oxides
72%
Oxide
62%
Enthalpy
59%