前瞻半導體研究所

12624 引文
52 h-指數
425 Article
207 Conference contribution
12 Editorial
6 Comment/debate
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12結果

篩選

2024

Guest Editorial [Guest Editorial]
Chang, C. R. & Lai, C. S., 1 6月 2024, 於: IEEE Nanotechnology Magazine. 18, 3, p. 3 1 p.
研究成果: Editorial

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2023

Guest Editorial
Chang, C. R. & Lai, C. S., 1 12月 2023, 於: IEEE Nanotechnology Magazine. 17, 6, p. 5 1 p.
研究成果: Editorial

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Guest Editorial: Special Issue on Recent Progresses of Taiwan Quantum Technologies
Lai, C. S., Chiu, K. L. & Chen, C. Y., 1 12月 2023, 於: SPIN. 13, 4, 2302002.
研究成果: Editorial
2022

Nanowatt Integrated Circuits and Systems
Yeo, K. S. & Lai, C. S., 1 6月 2022, 於: IEEE Nanotechnology Magazine. 16, 3, p. 4 1 p.
研究成果: Editorial

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Quantum Computing Technology [Guest Editorial]
Chang, C. R. & Lai, C. S., 1 8月 2022, 於: IEEE Nanotechnology Magazine. 16, 4, p. 3 1 p.
研究成果: Editorial

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2021

Nanobiomedical Technology [Guest Editorial]
Kao, S. K. & Lai, C. S., 8月 2021, 於: IEEE Nanotechnology Magazine. 15, 4, p. 7 1 p., 9494157.
研究成果: Editorial

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Quantum Computing Looking Forward [Highlights]
Lai, C. S. & Kao, S. K., 6月 2021, 於: IEEE Nanotechnology Magazine. 15, 3, p. 3-6 4 p., 9438055.
研究成果: Editorial

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2020

Guest editorial: Special issue on 2019 very-large-scale-integration design and computer-aided design
Chung, C. C. & Tsai, T. H., 6月 2020, 於: International Journal of Electrical Engineering. 27, 3, p. 1-2 2 p.
研究成果: Editorial
2018

Guest Editorial: Special Issue on 2-D Materials for Electronic, Optoelectronic, and Sensor Devices
Bhat, N., Das, S., Esseni, D., Liang, G., Moshkalev, S. A., Muneta, I., Schwierz, F., Teherani, J. T., De Vittorio, D. & Yoon, Y., 10月 2018, 於: IEEE Transactions on Electron Devices. 65, 10, p. 4034-4039 6 p., 8469130.
研究成果: Editorial

1 引文斯高帕斯（Scopus）
2015

Editorial
Kok, C. W., Tam, W. S., Kao, C. H. & Lai, C. S., 1 8月 2015, 於: Vacuum. 118, p. 1 1 p.
研究成果: Editorial
2012

Editorial
Lai, C. S., Liou, J. J. & Wang, J. C., 11月 2012, 於: Solid-State Electronics. 77, p. 1 1 p.
研究成果: Editorial
2010

Editorial
Liou, J. J. & Lai, C. S., 5月 2010, 於: Microelectronics Reliability. 50, 5, p. 583 1 p.
研究成果: Editorial

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