搜尋結果
2022
Wang, Y. L. ,
Chang, L. C. ,
Liu, F. ,
Ho, Y. T. ,
Wang, T. B. ,
Yeh, T. C. J. &
Tsai, J. P. ,
2022 , (Accepted/In press)
於: Groundwater. 研究成果: Letter › 同行評審
2018
Chang, W. Y. ,
Chung, H. T. ,
Chen, Y. C. &
Leu, J-P. ,
1 11月 2018 ,
於: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics. 36 ,
6 , 060601.
研究成果: Letter › 同行評審
Carbon nitride
100%
silicon films
74%
Oxalonitrile
74%
Annealing
69%
Silicon
54%
2017
Lin, Y. K. ,
Noda, S. ,
Lo, H. C. ,
Liu, S. C. ,
Wu, C. H. ,
Wong, Y. Y. ,
Luc, Q. H. ,
Chang, P. C. ,
Hsu, H-T. ,
Samukawa, S. &
Chang, E. Y. ,
1 1月 2017 ,
於: IEEE Electron Device Letters. 38 ,
1 ,
1 p. , 7802679.
研究成果: Letter › 同行評審
Yuan, J. ,
Huang, Y. ,
Chen, W. &
Pan, E. ,
3月 2017 ,
於: Theoretical and Applied Mechanics Letters. 7 ,
2 ,
p. 76-80 5 p. 研究成果: Letter › 同行評審
Dislocation Loop
100%
Dislocations (crystals)
86%
Piezoelectric
70%
Dislocation
67%
Crystal
57%
2015
Hsu, C. H. ,
Chang, E. Y. ,
Chang, H. J. ,
Maa, J. S. &
Pande, K. ,
1 12月 2015 ,
於: Solid-State Electronics. 114 ,
p. 174-177 4 p. 研究成果: Letter › 同行評審
Solar cells
100%
Solar Cell
81%
Copper
76%
solar cells
69%
copper
67%
2009
Sol-gels
100%
Seed
78%
Liquid Film
36%
Glass Substrate
25%
Grain Size
23%
2005
Extended Kalman Filter
100%
Parameter Identification
85%
Elastic Plate
82%
Boundary element method
75%
Boundary Elements
75%
2004
Lien, Y. C. ,
Chang, E. Y. ,
Chang, H. C. ,
Chu, L. H. ,
Huang, G. W. ,
Lee, H. M. ,
Lee, C. S. ,
Chen, S. H. ,
Shen, P. T. &
Chang, C. Y. ,
1 6月 2004 ,
於: IEEE Electron Device Letters. 25 ,
6 ,
p. 348-350 3 p. 研究成果: Letter › 同行評審
Electron Mobility
100%
High electron mobility transistors
96%
Fluorescence Maxima
27%
Cutoff frequency
24%
Noise figure
23%
Chen, C-H. ,
Aizawa, T. ,
Iyi, N. ,
Sato, A. &
Otani, S. ,
10 3月 2004 ,
於: Journal of Alloys and Compounds. 366 ,
1-2 研究成果: Letter › 同行評審
Boron
100%
Thermal Expansion
93%
Thermal expansion
89%
Boron Atom
76%
Octahedral Crystal
41%
2003
Silicides
100%
Amorphous silicon
99%
Electroless plating
98%
plating
80%
Crystallization
79%
Yang, T. H. ,
Luo, G. ,
Chang, E. Y. ,
Yang, T. Y. ,
Tseng, H. C. &
Chang, C. Y. ,
1 9月 2003 ,
於: IEEE Electron Device Letters. 24 ,
9 ,
p. 544-546 3 p. 研究成果: Letter › 同行評審
Silicides
100%
Nickel
68%
Leakage Current
24%
Sheet Resistance
22%
Annealing
14%
Single crystals
100%
Hardness
68%
Single Crystalline Solid
61%
Temperature
34%
Time
31%