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國立陽明交通大學研發優勢分析平台 首頁
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智慧半導體奈米系統技術研究中心
國立陽明交通大學
高教深耕計畫辦公室
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查看啟用 智慧半導體奈米系統技術研究中心 的研究主題。這些主題標籤來自此機構會員的作品。共同形成了獨特的指紋。
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重量
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Engineering & Materials Science
Ferroelectric materials
100%
High electron mobility transistors
81%
Field effect transistors
66%
FinFET
51%
Capacitance
49%
Heterojunctions
48%
Metals
47%
Annealing
44%
Nanowires
41%
Temperature
39%
High-entropy alloys
36%
Copper
35%
Substrates
34%
Oxides
33%
Data storage equipment
31%
Semiconductor materials
27%
Transistors
27%
Electric potential
25%
Passivation
24%
Transmission electron microscopy
22%
Silicon
21%
Capacitors
18%
Threshold voltage
18%
Chemical vapor deposition
17%
Polarization
17%
Microstructure
17%
Electromigration
17%
Electrons
16%
Electric properties
16%
Fabrication
15%
Indium
15%
Doping (additives)
15%
Soldering alloys
15%
Monolayers
15%
Management information systems
15%
Packaging
15%
Organic chemicals
14%
Charge trapping
14%
Interface states
14%
Phase transitions
14%
Atoms
14%
Metallorganic chemical vapor deposition
13%
Mechanical properties
13%
Gallium nitride
13%
Tunnel junctions
13%
Nanosheets
13%
Grain growth
13%
Demonstrations
13%
Hot Temperature
13%
Crystalline materials
13%
Epitaxial growth
12%
Thermodynamic stability
12%
Crystals
12%
Durability
12%
Electrodes
12%
Electroplating
12%
Thin films
12%
Degradation
12%
Electric breakdown
11%
Sapphire
11%
Gate dielectrics
11%
Plasmas
11%
Millimeter waves
11%
Networks (circuits)
11%
X ray photoelectron spectroscopy
10%
Growth temperature
10%
Nanorods
10%
Transconductance
10%
Hafnium
10%
X rays
10%
Tuning
10%
Metal foil
9%
Nanostructures
9%
Atomic layer deposition
9%
Fans
9%
Current density
9%
Electron microscopes
9%
Twinning
9%
Vacuum
9%
Oxidation
9%
Intermetallics
9%
Aluminum oxide
8%
Oxide semiconductors
8%
Switches
8%
Oxygen vacancies
8%
Irradiation
8%
Entropy
8%
Memristors
8%
Polyimides
8%
Drain current
8%
Contact resistance
8%
Leakage currents
7%
Three dimensional integrated circuits
7%
Electric fields
7%
Static random access storage
7%
Charge transfer
7%
Energy gap
7%
Particle accelerators
7%
Neutron diffraction
7%
Spintronics
7%
Chemical Compounds
Voltage
36%
Field Effect
34%
Annealing
30%
Alloy
29%
Nanowire
26%
Application
25%
Liquid Film
24%
Simulation
23%
Dielectric Material
22%
Electron Mobility
22%
Capacitor
19%
Microstructure
18%
Transconductance
18%
Polarization
18%
Chemical Passivation
17%
Resistance
17%
Solder
16%
Drain Current
16%
Oxide
15%
Strength
15%
Metal
15%
Surface
15%
Electron Particle
14%
Electrical Property
14%
Length
13%
Grain Growth
13%
Tunneling
12%
Compound Mobility
12%
Semiconductor
12%
Contact Resistance
12%
Strain
12%
Nonconductor
11%
Electrodeposition
11%
Time
11%
Grain Size
10%
Parasitic
10%
Thermal Stability
10%
Hafnium Atom
10%
Energy
9%
Intermetallic Compound
9%
Atomic Layer Epitaxy
9%
Filament
9%
Leakage Current
9%
Interface State
9%
Transmission Electron Microscopy
9%
Diffusion
8%
Electric Field
8%
Nanomaterial
8%
Breakdown Voltage
8%
Conductance
8%
Polyimide Macromolecule
7%
Entropy
7%
Current Density
7%
Monolayer
7%
Etching
7%
Thermal Cycling
7%
Vacuum
7%
Plasma
7%
Grain Boundary
7%
Epitaxial Growth
7%
Nanosheet
6%
Electronic Band Structure
6%
Point Group C∞V
6%
Face-Centered Cubic Crystal System
6%
Optoelectronics
6%
Yield Point
6%
X-Ray Photoelectron Spectroscopy
6%
Torque
6%
Schottky Barrier
6%
Behavior as Electrode
6%
Metal Oxide
6%
Rapid Thermal Annealing
6%
Oxidation Reaction
6%
Dioxygen
6%
Foil
6%
Flicker Noise
6%
Neutron Diffraction
6%
Pressure
6%
Hysteresis
6%
Antiferroelectricity
5%
Interface Trap
5%
Surface Roughness
5%
Nanorod
5%
Anisotropy
5%
Electron Spin
5%
Thermal Diffusion
5%
Electron Beam
5%
Doping Material
5%
Porosity
5%
Residual Stress
5%
Scanning Transmission Electron Microscopy
5%
Tensile Strength
5%
Buffer Solution
5%
Physics & Astronomy
high electron mobility transistors
28%
nanowires
17%
metalorganic chemical vapor deposition
15%
field effect transistors
14%
annealing
10%
entropy
10%
performance
10%
capacitance
9%
copper
9%
augmentation
7%
metals
7%
transmission electron microscopy
7%
oxides
7%
temperature
6%
oxidation
6%
electromigration
6%
electrical properties
6%
microstructure
5%
cycles
5%
metal oxide semiconductors
5%
traps
5%
capacitors
5%
characterization
5%
tunnel junctions
5%
voltage regulators
5%
voids
5%
defects
5%
mechanical properties
5%
x rays
5%
polarization
5%