X-ray topography of hydride domains

S. R. Stock; R. Chasnov; H. D. Chen; H. K. Birnbaum

doi:10.1016/0167-577X(83)90063-0

X-ray topography of hydride domains

S. R. Stock^*, R. Chasnov, H. D. Chen, H. K. Birnbaum

^*Corresponding author for this work

International College of Semiconductor Technology

Research output: Contribution to journal › Article › peer-review

Abstract

X-ray topographic techniques were applied to the study of twin related domains in niobium hydride and deuteride crystals. It was shown that contrast between the domains, which results from small differences in orientation, allows the method to be used in the study of the domain behavior. The method is compared to the alternate technique of optical metallography.

Original language	English
Pages (from-to)	173-175
Number of pages	3
Journal	Materials Letters
Volume	2
Issue number	2
DOIs	https://doi.org/10.1016/0167-577X(83)90063-0
State	Published - 1 Jan 1983

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title = "X-ray topography of hydride domains",

abstract = "X-ray topographic techniques were applied to the study of twin related domains in niobium hydride and deuteride crystals. It was shown that contrast between the domains, which results from small differences in orientation, allows the method to be used in the study of the domain behavior. The method is compared to the alternate technique of optical metallography.",

author = "Stock, {S. R.} and R. Chasnov and Chen, {H. D.} and Birnbaum, {H. K.}",

year = "1983",

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journal = "Materials Letters",

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AU - Stock, S. R.

AU - Chasnov, R.

AU - Chen, H. D.

AU - Birnbaum, H. K.

PY - 1983/1/1

Y1 - 1983/1/1

N2 - X-ray topographic techniques were applied to the study of twin related domains in niobium hydride and deuteride crystals. It was shown that contrast between the domains, which results from small differences in orientation, allows the method to be used in the study of the domain behavior. The method is compared to the alternate technique of optical metallography.

AB - X-ray topographic techniques were applied to the study of twin related domains in niobium hydride and deuteride crystals. It was shown that contrast between the domains, which results from small differences in orientation, allows the method to be used in the study of the domain behavior. The method is compared to the alternate technique of optical metallography.

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U2 - 10.1016/0167-577X(83)90063-0

DO - 10.1016/0167-577X(83)90063-0

M3 - Article

AN - SCOPUS:0020833234

SN - 0167-577X

VL - 2

SP - 173

EP - 175

JO - Materials Letters

JF - Materials Letters

IS - 2

ER -

X-ray topography of hydride domains

Abstract

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