X-Ray absorption studies of boron-carbon-nitrogen (Bx CyNz) ternary alloys

S. C. Ray; H. M. Tsai; J. W. Chiou; J. C. Jan; Krishna Kumar; W. F. Pong; F. Z. Chien; M. H. Tsai; S. Chattopadhyay; L. C. Chen; S. C. Chien; M. T. Lee; S. T. Lin; K. H. Chen

doi:10.1016/j.diamond.2003.11.052

X-Ray absorption studies of boron-carbon-nitrogen (B_x C_yN_z) ternary alloys

S. C. Ray, H. M. Tsai, J. W. Chiou, J. C. Jan, Krishna Kumar, W. F. Pong^*, F. Z. Chien, M. H. Tsai, S. Chattopadhyay, L. C. Chen, S. C. Chien, M. T. Lee, S. T. Lin, K. H. Chen

^*Corresponding author for this work

Institute of Biophotonics

Research output: Contribution to journal › Article › peer-review

21 Scopus citations

Abstract

X-Ray diffraction (XRD) and B, N and C K-edges X-ray absorption near-edge structure (XANES) measurements have been performed to study the B_xC_yN_z ternary compounds. XRD reveals that the films contain carbon nitride, boron carbide, and boron nitride compounds. The combination of B, N and C K-edges XANES results reveal the presence of B-N, B-C, N-C, and C-N local bonding structures in B_x C_yN_z, indicating that boron-carbon-nitride thin films have a ternary phase, rather than a mixture of segregated binary phases.

Original language	English
Pages (from-to)	1553-1557
Number of pages	5
Journal	Diamond and Related Materials
Volume	13
Issue number	4-8
DOIs	https://doi.org/10.1016/j.diamond.2003.11.052
State	Published - Apr 2004

Keywords

Boron-carbon-nitride
Electronic properties
Microstructure
X-Ray absorption near-edge structure (XANES)

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10.1016/j.diamond.2003.11.052

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@article{90a6f04ff88a432b9a231f6b2d8b8613,

title = "X-Ray absorption studies of boron-carbon-nitrogen (Bx CyNz) ternary alloys",

abstract = "X-Ray diffraction (XRD) and B, N and C K-edges X-ray absorption near-edge structure (XANES) measurements have been performed to study the BxCyNz ternary compounds. XRD reveals that the films contain carbon nitride, boron carbide, and boron nitride compounds. The combination of B, N and C K-edges XANES results reveal the presence of B-N, B-C, N-C, and C-N local bonding structures in Bx CyNz, indicating that boron-carbon-nitride thin films have a ternary phase, rather than a mixture of segregated binary phases.",

keywords = "Boron-carbon-nitride, Electronic properties, Microstructure, X-Ray absorption near-edge structure (XANES)",

author = "Ray, {S. C.} and Tsai, {H. M.} and Chiou, {J. W.} and Jan, {J. C.} and Krishna Kumar and Pong, {W. F.} and Chien, {F. Z.} and Tsai, {M. H.} and S. Chattopadhyay and Chen, {L. C.} and Chien, {S. C.} and Lee, {M. T.} and Lin, {S. T.} and Chen, {K. H.}",

note = "Funding Information: The author (W.F. Pong) would like to thank the National Science Council (NSC) of the Republic of China, Taiwan for financially supporting this research under Contract No. NSC 92-2112-M-032-025.",

year = "2004",

month = apr,

doi = "10.1016/j.diamond.2003.11.052",

language = "English",

volume = "13",

pages = "1553--1557",

journal = "Diamond and Related Materials",

issn = "0925-9635",

publisher = "Elsevier B.V.",

number = "4-8",

}

TY - JOUR

T1 - X-Ray absorption studies of boron-carbon-nitrogen (Bx CyNz) ternary alloys

AU - Ray, S. C.

AU - Tsai, H. M.

AU - Chiou, J. W.

AU - Jan, J. C.

AU - Kumar, Krishna

AU - Pong, W. F.

AU - Chien, F. Z.

AU - Tsai, M. H.

AU - Chattopadhyay, S.

AU - Chen, L. C.

AU - Chien, S. C.

AU - Lee, M. T.

AU - Lin, S. T.

AU - Chen, K. H.

N1 - Funding Information: The author (W.F. Pong) would like to thank the National Science Council (NSC) of the Republic of China, Taiwan for financially supporting this research under Contract No. NSC 92-2112-M-032-025.

PY - 2004/4

Y1 - 2004/4

N2 - X-Ray diffraction (XRD) and B, N and C K-edges X-ray absorption near-edge structure (XANES) measurements have been performed to study the BxCyNz ternary compounds. XRD reveals that the films contain carbon nitride, boron carbide, and boron nitride compounds. The combination of B, N and C K-edges XANES results reveal the presence of B-N, B-C, N-C, and C-N local bonding structures in Bx CyNz, indicating that boron-carbon-nitride thin films have a ternary phase, rather than a mixture of segregated binary phases.

AB - X-Ray diffraction (XRD) and B, N and C K-edges X-ray absorption near-edge structure (XANES) measurements have been performed to study the BxCyNz ternary compounds. XRD reveals that the films contain carbon nitride, boron carbide, and boron nitride compounds. The combination of B, N and C K-edges XANES results reveal the presence of B-N, B-C, N-C, and C-N local bonding structures in Bx CyNz, indicating that boron-carbon-nitride thin films have a ternary phase, rather than a mixture of segregated binary phases.

KW - Boron-carbon-nitride

KW - Electronic properties

KW - Microstructure

KW - X-Ray absorption near-edge structure (XANES)

UR - http://www.scopus.com/inward/record.url?scp=2442555928&partnerID=8YFLogxK

U2 - 10.1016/j.diamond.2003.11.052

DO - 10.1016/j.diamond.2003.11.052

M3 - Article

AN - SCOPUS:2442555928

SN - 0925-9635

VL - 13

SP - 1553

EP - 1557

JO - Diamond and Related Materials

JF - Diamond and Related Materials

IS - 4-8

ER -

X-Ray absorption studies of boron-carbon-nitrogen (B_x C_yN_z) ternary alloys

Abstract

Keywords

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